Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/2003
11/06/2003WO2002004968A3 Universal burn-in socket for testing integrated circuit chip
11/06/2003US20030206680 Devices having compliant wafer-level input/output interconnections and packages using pillars and methods of fabrication thereof
11/06/2003US20030206034 Method of temporarily securing a die to a burn-in carrier
11/06/2003US20030206033 Method and apparatus for testing electronic devices
11/06/2003US20030206031 System and method for evaluating the planarity and parallelism of an array of probe tips
11/06/2003US20030206030 Universal wafer carrier for wafer level die burn-in
11/06/2003US20030206029 Method of forming an electrical contact
11/06/2003US20030206028 Method of forming an electrical contact
11/06/2003US20030205997 Wafer probe station having environment control enclosure
11/06/2003US20030204950 Method of installing a plug and play device driver
11/06/2003US20030204948 Electrical gripping testing and installation device
11/05/2003EP1359425A2 A measurement test instrument and associated voltage management system for accessory device
11/05/2003EP1224476B1 Test probe for a device for testing printed circuit boards
11/05/2003EP1092160B1 Residual current detection device
11/05/2003CN1454321A Automated protection of IC devices from EOS (electro over stress) damage due to an undesired DC transient
11/04/2003US6643830 Fault portion locating method for semiconductor integrated circuit device
11/04/2003US6642732 Probe station thermal chuck with shielding for capacitive current
11/04/2003US6642731 Probe structure and manufacturing method thereof
11/04/2003US6642730 Test carrier with molded interconnect for testing semiconductor components
11/04/2003US6642729 Probe card for tester head
11/04/2003US6642728 Holder of electroconductive contactor, and method for producing the same
11/04/2003US6642727 Chip carrier device and method for the production of a chip carrier device with an electrical test
11/04/2003US6642708 Marker system for test fixture
11/04/2003US6642704 Device for sensing electrical current and housing therefor
11/04/2003US6642625 Sockets for “springed” semiconductor devices
11/04/2003US6641430 Contact structure and production method thereof and probe contact assembly using same
11/04/2003US6640432 Method of fabricating shaped springs
11/04/2003US6640415 Segmented contactor
10/2003
10/30/2003WO2003027694A3 Method and apparatus for in-circuit testing of sockets
10/30/2003WO2002068321A3 Forming tool for forming a contoured microelectronic spring mold
10/30/2003US20030204826 Inspection method and inspection system using charged particle beam
10/30/2003US20030204342 Measurement test instrument and associated voltage management system for accessory device
10/30/2003US20030203683 Probe card
10/30/2003US20030203521 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
10/30/2003US20030201785 Method of forming an electrical contact
10/30/2003US20030201780 Parallel arc fault diagnostic for aircraft wiring
10/30/2003US20030201764 Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing
10/30/2003US20030201763 Battery gauge
10/29/2003EP1357385A1 Contact probe, mask and fabrication method thereof
10/29/2003EP1356307A1 Nickel alloy probe card frame laminate
10/29/2003CN1452231A Testing board for testing semiconductor
10/28/2003US6639416 Method and apparatus for testing semiconductor dice
10/28/2003US6639415 Probe station having multiple enclosures
10/28/2003US6638080 Integrated ball grid array-pin grid array-flex laminate test assembly
10/28/2003US6637564 Current detector with two mounting positions
10/23/2003WO2003088425A1 Shielded cable terminal with contact pins mounted to printed circuit board
10/23/2003WO2003088349A1 Signal detection contactor and signal correcting system
10/23/2003WO2003087854A1 Conductive contact
10/23/2003WO2003087853A1 Holder for conductive contact
10/23/2003WO2003087852A1 Holder for conductive contact
10/23/2003WO2002099930B1 Socket connector and contact for use in a socket connector
10/23/2003US20030199208 Surface mount probe point socket and system
10/23/2003US20030199158 Method of forming an electrical contact
10/23/2003US20030197655 Parallel displacement/inclination measuring apparatus and antenna system
10/23/2003US20030197524 Test board for testing semiconductor device
10/23/2003US20030197521 Interface adapter for automatic test systems
10/23/2003US20030197517 Systems and methods for providing a resistor-pin assembly
10/23/2003US20030197514 System and method for testing a printed circuit board by employing a ceramic substrate with micro-probes formed on the ceramic substrate
10/23/2003US20030197501 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
10/23/2003US20030197269 Test fixture for semiconductor packages
10/22/2003EP1355162A1 RF power sensor for measuring an RF signal power using capacitance
10/22/2003EP0792517B1 Electrical contact structures from flexible wire
10/22/2003CN2582004Y High-temp superconductor strip crimping critical current measurer
10/22/2003CN2582000Y Measuring appliance for circuit board
10/22/2003CN1451190A Ic test socket
10/22/2003CN1451179A Shaped springs and methds of fabricating and using shaped springs
10/22/2003CN1451097A Testing device for printed boards
10/22/2003CN1450356A Detection head for checking display control panel
10/21/2003US6636063 Probe card with contact apparatus and method of manufacture
10/21/2003US6636062 Temperature control device for an electronic component
10/21/2003US6636061 Method and apparatus for configurable hardware augmented program generation
10/21/2003US6636060 Insert for electric devices testing apparatus
10/21/2003US6636059 Wafer probe station having environment control enclosure
10/21/2003US6636058 Adapter for a multi-channel, low input capacitance signal probe
10/21/2003US6636057 Electric part testing apparatus with movable adapter
10/21/2003US6636054 Low capacitance probe contact
10/21/2003US6636050 Four-terminal measuring device that uses nanotube terminals
10/21/2003US6635516 Substrate dropping prevention mechanism and substrate inspection device provided therewith
10/21/2003US6635511 Integrated ball grid array-pin grid array-flex circuit interposing probe assembly
10/21/2003US6634245 Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism
10/21/2003US6634100 Interposer and methods for fabricating same
10/16/2003WO2002084786A3 Ultrafast sampler with coaxial transition
10/16/2003US20030195713 Systems and methods for wideband active probing of devices and circuits in operation
10/16/2003US20030194898 Socket for electrical parts
10/16/2003US20030193344 Test assembly for integrated circuit package
10/16/2003US20030193342 Wafer-level contactor
10/16/2003US20030193341 Systems and methods for wideband differential probing of variably spaced probe points
10/16/2003US20030193325 Radio frequency oscillation detector
10/16/2003US20030193323 Systems and methods for wideband single-end probing of variably spaced probe points
10/16/2003US20030192476 Sputtered spring films with low stress anisotropy
10/16/2003US20030192183 Method for constructing a membrane probe using a depression
10/16/2003US20030192181 Method of making an electronic contact
10/16/2003US20030192176 Re-assembly process for MEMS structures
10/16/2003US20030192172 Spring element for use in an apparatus for attaching to a semiconductor and a method of making
10/15/2003EP1353443A2 Spring contact
10/15/2003EP1353366A2 Non-invasive electrical measurement of semiconductor wafers
10/15/2003EP1353340A1 Shunt resistance and method of adjusting the shunt resistance
10/15/2003EP1353188A2 High resolution analytical probe station
10/15/2003EP1352253A2 High-frequency probe-tip
10/15/2003CN2580451Y Current patrol detector
1 ... 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 ... 273