Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/2003
12/09/2003US6661244 Nickel alloy probe card frame laminate
12/09/2003US6660541 Semiconductor device and a manufacturing method thereof
12/09/2003US6659847 Polishing surface of probe pin of probe card by moving cleaning wafer to contact surface of pin with first acceleration rate for plurality of times, smoothing surface by moving cleaning wafer with second, faster, acceleration rate
12/09/2003US6659812 Surface mount probe point socket and system
12/09/2003US6658736 Method of fabricating a heat exchanger, for regulating the temperature of multiple integrated circuit modules, having a face of a solid malleable metal coated with a release agent
12/09/2003US6658728 Method for fabricating a spring structure on a substrate
12/04/2003WO2003100446A2 High performance probe system for testing semiconductor wafers
12/04/2003WO2003100445A2 Probe for testing a device under test
12/04/2003WO2003100444A1 A thermoelectric device test structure
12/04/2003WO2003027686A3 Method and apparatus for temperature control of a device during testing
12/04/2003WO2002075330A3 Universal test interface between a device under test and a test head
12/04/2003WO2002037132A8 Methods and devices for dissolving hyperpolarised solid material for nmr analyses
12/04/2003US20030224650 Semiconductor socket and replacing method of its probe of semiconductor socket
12/04/2003US20030224641 Probes and methods for testing electrical circuits
12/04/2003US20030224635 Contactor block and apparatus for electrical connection
12/04/2003US20030224627 Probe card, probe card manufacturing method, and contact
12/04/2003US20030222671 Method and system for wafer level testing and burning-in semiconductor components
12/04/2003US20030222670 Semiconductor testing apparatus
12/04/2003US20030222667 Probe card assembly
12/04/2003US20030222666 Probe applied to semiconductor package test and method for testing semiconductor package
12/04/2003US20030222665 Voltage probe systems having improved bandwidth capability
12/03/2003CN2589987Y Magnetic adjusting type watch core support
12/03/2003CN2589986Y Probe device for testing
12/03/2003CN2589985Y Anti-slip measuring test pencil
12/03/2003CN2589984Y Measuring and recording dual-purpose meter pen
12/03/2003CN1460045A Vacuum chuck with integrated electrical testing points
12/03/2003CN1129990C Conductive contactor
12/03/2003CN1129797C Vertically operative type probe card assembly employing probe
12/02/2003US6657450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes
12/02/2003US6657448 Electrical connection apparatus
12/02/2003US6656750 Method for testing chips on flat solder bumps
12/02/2003US6655983 Electrical test probe provided with a signal transmitting wire having an enlarged portion for preventing the wire from coming out of the probe
12/02/2003US6655974 Semiconductor device-socket
12/02/2003US6655969 Contact elements
12/02/2003US6655023 Method and apparatus for burning-in semiconductor devices in wafer form
11/2003
11/27/2003WO2003098237A1 Digital multimeter with misoperation preventing function
11/27/2003WO2003005041A3 A test handling apparatus and method
11/27/2003US20030218474 Wafer testing apparatus
11/27/2003US20030218472 Apparatus for interfacing electronic packages and test equipment
11/27/2003US20030218464 Thermoelectric device test structure
11/27/2003US20030218252 Transfer plate; electrode overcoating dielectric; determination surface roughness
11/27/2003US20030218244 Miniaturized contact spring
11/27/2003US20030218167 Carrier module for mu-BGA type device
11/26/2003EP1365479A1 Anisotropic conductive connector, its manufacture method and probe member
11/26/2003EP1365250A1 Contact probe, method of manufacturing the contact probe, and device and method for inspection
11/26/2003EP1364221A1 Planarizing interposer
11/26/2003CN1459026A Re-locatable partial discharge transducer head
11/26/2003CN1129214C IC socket and IC tester
11/25/2003US6653928 Dry load test apparatus
11/25/2003US6653854 Test pin unit
11/25/2003US6653825 Meter lead holder device
11/25/2003US6652326 Contact apparatus particularly useful with test equipment
11/25/2003US6651817 Test tray insert of test handler
11/25/2003US6651325 Method for forming cantilever beam probe card and probe card formed
11/20/2003WO2003096037A1 Device and method for testing printed circuit boards, and testing probe for said device and method
11/20/2003WO2003096035A1 Probe card for testing integrated circuits
11/20/2003WO2003056577A3 Roller contact with conductive brushes
11/20/2003US20030214315 Piston for module test
11/20/2003US20030214314 Micro probe
11/20/2003US20030214309 RF power sensor for measuring an RF signal power using capacitance
11/20/2003US20030214045 Miniaturized contact spring
11/20/2003US20030213909 Method of inspecting pattern and inspecting instrument
11/19/2003EP1363323A2 Apparatus and method for determining electrical properties of a semiconductor wafer
11/19/2003EP1362391A1 Terminal connector
11/19/2003EP1362005A2 Method for forming microelectronic spring structures on a substrate
11/19/2003CN1457282A Method of retrofitting probe station
11/18/2003US6650134 Adapter assembly for connecting test equipment to a wireless test fixture
11/18/2003US6650133 Method and apparatus for buckling beam testing
11/18/2003US6650131 Electrical test probe wedge tip
11/18/2003US6648654 Electrical connector
11/13/2003WO2003093840A1 Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board
11/13/2003WO2003093839A1 Device for testing printed circuit boards
11/13/2003US20030210067 Test signal distribution system for IC tester
11/13/2003US20030210066 Apparatus and method for determining electrical properties of a semiconductor wafer
11/13/2003US20030210065 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip
11/13/2003US20030210064 Testing apparatus for BGA IC
11/13/2003US20030210063 Contact probe with guide unit and fabrication method thereof
11/13/2003US20030210033 System for evaluating probing networks
11/12/2003EP1361451A1 Contacting piece for the inspection of microlectronic devices and inspection device using this contact piece
11/12/2003EP1116423B1 Vertically actuated bga socket
11/12/2003EP0929819B1 Membrane probing system with local contact scrub
11/12/2003CN2586163Y Shearing appts. for power plug cord
11/12/2003CN1455936A Shunt resistance and method of adjusting shunt resistance
11/12/2003CN1455868A Resistor suitable to measure of high-frequency AC. electricity
11/12/2003CN1455261A Radio-frequency power sensor using capacitance to measure radio frequency signal power
11/12/2003CN1455259A Method for producing probe, mask used therefor and probe therefrom
11/12/2003CN1127781C Sharpened oriented contact tip structure
11/12/2003CN1127734C Electronic instrument with electromagnetic interference shield and method of manufacturing thereof
11/11/2003US6646458 Apparatus for forming coaxial silicon interconnects
11/11/2003US6646457 Test needle for pattern adapter of circuit board tester
11/11/2003US6646455 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter
11/11/2003US6646431 Test head manipulator
11/11/2003US6646430 Current measuring shunt with circuitry mounted thereon
11/11/2003US6646286 Semiconductor substrate-based BGA interconnection
11/11/2003US6644982 Method and apparatus for the transport and tracking of an electronic component
11/11/2003US6644981 Socket for electrical parts having horizontal guide portion
11/11/2003US6643922 Device testing contactor, method of producing the same, and device testing carrier
11/06/2003WO2003091739A1 Electronic component characteristic measuring device
11/06/2003WO2003023427A3 Method of assembling and testing an electronics module
11/06/2003WO2003007002A3 Interface apparatus for integrated circuit testing
1 ... 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 ... 273