| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 01/22/2004 | US20040012403 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 01/22/2004 | US20040012402 Integrated circuit test probe |
| 01/22/2004 | US20040012383 Electric resistance measuring connector and measuring device and measuring method for circuit board electric resistance |
| 01/21/2004 | EP1382973A1 Method and test adapter for testing an appliance having a smart card reader |
| 01/21/2004 | CN2600824Y Testing device connector |
| 01/20/2004 | US6680617 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
| 01/20/2004 | US6680536 Probe unit having resilient metal leads |
| 01/20/2004 | US6679723 Electric power watthour meter with cover handles |
| 01/15/2004 | WO2004005948A1 Electronic component contact device |
| 01/15/2004 | WO2004005944A1 Contact, socket, socket board, and electronic component test apparatus |
| 01/15/2004 | WO2003067271A3 Apparatus and method for dynamic diagnostic testing of integrated circuits |
| 01/15/2004 | US20040008048 Micro compliant interconnect apparatus for integrated circuit devices |
| 01/15/2004 | US20040008047 Passive, grease-free cooled device fixtures |
| 01/15/2004 | US20040008046 Cartridge system for a probing head for an electrical test probe |
| 01/15/2004 | US20040008045 Mosaic decal probe |
| 01/15/2004 | US20040008044 Contact structure with flexible cable and probe contact assembly using same |
| 01/15/2004 | US20040008043 Current probe device having an integrated amplifier |
| 01/15/2004 | DE10225028B3 Kugelgelenk-Führungsstifte mit Einrastung-Modularer, haubenloser, höhenselbsteinstellender, von oben genau kontaktierbarer Vakuum-Prüfadapter Ball joint guide pins with latching-Modular, dome-less, self-adjusting height, just contactable from above vacuum test fixtures |
| 01/14/2004 | EP1380068A2 Ultrafast sampler with coaxial transition |
| 01/14/2004 | CN1467832A Recovery processing method of an electrode |
| 01/14/2004 | CN1467806A Contactor block and apparatus for electrical connection |
| 01/14/2004 | CN1134667C Microelectronic spring contact element |
| 01/13/2004 | US6677850 Layered current sensor |
| 01/13/2004 | US6677776 Method and system having switching network for testing semiconductor components on a substrate |
| 01/13/2004 | US6677773 Testing device for printed circuit boards |
| 01/13/2004 | US6677771 Probe contact system having planarity adjustment mechanism |
| 01/13/2004 | US6677770 Programmable test socket |
| 01/13/2004 | US6677769 Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system |
| 01/13/2004 | US6677760 Method of and apparatus for analyzing failure |
| 01/13/2004 | US6677742 Utility meter having a security sealing arrangement |
| 01/13/2004 | US6677552 System and method for laser micro-machining |
| 01/13/2004 | US6677245 Contact structure production method |
| 01/13/2004 | US6676438 Contact structure and production method thereof and probe contact assembly using same |
| 01/13/2004 | US6676418 Socket for electrical parts |
| 01/13/2004 | US6675473 Method of positioning a conductive element in a laminated electrical device |
| 01/08/2004 | WO2004003581A1 A system for burn-in testing of electronic devices |
| 01/08/2004 | WO2004003575A2 Test device for integrated circuit components |
| 01/08/2004 | US20040005792 Multicontact electric connector |
| 01/08/2004 | US20040005791 Connector |
| 01/08/2004 | US20040004491 Probe for testing a device under test |
| 01/08/2004 | US20040004490 IC component test socket assembly having error protection device |
| 01/08/2004 | US20040004489 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof |
| 01/08/2004 | US20040004228 Methods of fabricating semiconductor substrate-based BGA interconnection |
| 01/08/2004 | US20040004216 Test assembly including a test die for testing a semiconductor product die |
| 01/07/2004 | CN2597998Y Testing stand |
| 01/07/2004 | CN1466687A Interface module for high performance detector |
| 01/07/2004 | CN1466686A High-frequency probe-tip |
| 01/07/2004 | CN1466182A Apparatus and method for cleaning probe card contacts |
| 01/06/2004 | US6674627 Needle-card adjusting device for planarizing needle sets on a needle card |
| 01/06/2004 | US6674298 Testing head having cantilever probes |
| 01/06/2004 | US6674297 Micro compliant interconnect apparatus for integrated circuit devices |
| 01/06/2004 | US6674175 Ball grid array chip packages having improved testing and stacking characteristics |
| 01/06/2004 | US6672877 Contactor block and apparatus for electrical connection |
| 01/06/2004 | US6672876 Probe card with pyramid shaped thin film contacts |
| 01/06/2004 | US6672875 Spring interconnect structures |
| 01/02/2004 | EP1376141A1 Method for producing a captive wired test fixture and fixture therefor |
| 01/02/2004 | EP1376140A2 Probe card contact block and apparatus for electrical connection |
| 01/02/2004 | EP1159624B1 High bandwidth passive integrated circuit tester probe card assembly |
| 01/01/2004 | US20040000920 Shielded probe apparatus for probing semiconductor wafer |
| 01/01/2004 | US20040000915 Battery clamp connection detection method and apparatus |
| 12/31/2003 | WO2004001807A2 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/31/2003 | WO2004001429A1 Multi-socket board for open/short tester |
| 12/31/2003 | WO2004001428A1 Test method for yielding a known good die |
| 12/31/2003 | WO2002063682A3 Lithographic type microelectronic spring structures with improved contours |
| 12/30/2003 | US6670819 Methods of engaging electrically conductive pads on a semiconductor substrate |
| 12/30/2003 | US6670634 Silicon carbide interconnect for semiconductor components |
| 12/30/2003 | US6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same |
| 12/30/2003 | US6668448 Method of aligning features in a multi-layer electrical connective device |
| 12/25/2003 | US20030237061 Test method for yielding a known good die |
| 12/25/2003 | US20030234660 Direct landing technology for wafer probe |
| 12/25/2003 | US20030234657 Method for producing a probe, mask for producing the probe, and probe |
| 12/25/2003 | US20030234656 Wireless test fixture adapter for printed circuit assembly tester |
| 12/25/2003 | US20030234644 Force measurement on test and system level test environment under a printed circuit board |
| 12/25/2003 | US20030234640 Method for producing a captive wired test fixture and fixture therefor |
| 12/24/2003 | WO2003107488A1 Connector, electronic component fixing device, and tester |
| 12/23/2003 | US6667631 High temperature probe card |
| 12/23/2003 | US6667629 Electrical test probes and methods of making the same |
| 12/23/2003 | US6667627 Probe for inspecting semiconductor device and method of manufacturing the same |
| 12/23/2003 | US6667626 Probe card, and testing apparatus having the same |
| 12/23/2003 | US6667624 Battery clamp connection detection method and apparatus |
| 12/23/2003 | US6666691 Socket for removably mounting electronic packages |
| 12/18/2003 | WO2003105288A1 Contact for spiral contactor and spiral contactor |
| 12/18/2003 | WO2003081725A3 A miniaturized contact spring |
| 12/18/2003 | US20030231027 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet |
| 12/18/2003 | DE20316268U1 Improved construction of an electrical test probe based upon a hard pin to which the cable is connected that fits in a softer outer sleeve |
| 12/18/2003 | DE20315894U1 High current carrying spring contact pin has good contact between pin and housing sleeve maintained by a radial contact spring element |
| 12/17/2003 | EP1371095A2 Wafer level interposer |
| 12/11/2003 | WO2003103351A1 Fixing means |
| 12/11/2003 | WO2003102612A2 Fixing means for components and cards |
| 12/11/2003 | WO2003102604A1 Device and method of testing an electronic component |
| 12/11/2003 | WO2003102603A2 Modular vacuum test adapter |
| 12/11/2003 | WO2003055031A3 System for the remote data acquisition and control of electric energy meters |
| 12/11/2003 | US20030227292 Non-invasive electrical measurement of semiconductor wafers |
| 12/11/2003 | US20030226578 Removal residues from electrical contactors; silicon substrate with groove surfaces; pressurized contactors |
| 12/11/2003 | DE20312919U1 In Schalttafeln, -schränken o.dgl. In control panels, cabinets, or the like. einbaubares Gehäuse für ein Meßgerät incorporatable housing for a meter |
| 12/10/2003 | EP1368666A2 Method and apparatus for retaining a spring probe |
| 12/10/2003 | EP1368665A2 High bandwidth probe assembly |
| 12/10/2003 | CN2591627Y Clip type multimeter measuring probe |
| 12/10/2003 | CN1461412A Module of testing device for testing printed circuit boards |
| 12/09/2003 | US6661245 Method to eliminate wiring of electrical fixtures using spring probes |