| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 03/25/2004 | US20040058470 Methods of forming a contact array in situ on a substrate and resulting substrate assemblies |
| 03/25/2004 | US20040056689 Method and structure for integrated circuit interference isolation enhancement |
| 03/25/2004 | US20040056676 Probe title for probing semiconductor wafer |
| 03/25/2004 | US20040056674 Multi-point probe |
| 03/25/2004 | US20040056673 Test method for semiconductor components using conductive polymer contact system |
| 03/25/2004 | US20040056672 High resolution analytical probe station |
| 03/25/2004 | DE10337033A1 Anschlussleitungsloser Sockel für ein aufgedecktes Halbleiterbauelement Connection cable-free base for a face-up semiconductor component |
| 03/25/2004 | DE10320132A1 Verbinderkabel und Verfahren zum Sondieren von vakuumabdichtbaren elektronischen Knoten einer elektrischen Testvorrichtung Connector cable and method for probing vakuumabdichtbaren electronic nodes of an electrical tester |
| 03/24/2004 | EP1400811A1 Support body assembly for conductive contactor |
| 03/24/2004 | EP1399746A1 Image sensor utilizing a low fpn high gain capacitive transimpedance amplifier |
| 03/24/2004 | CN2607579Y Trolley elecric meter for indicating eye-catching |
| 03/24/2004 | CN1484768A Method and devices for dissolving hyperpolarised solid material for nmr analyses |
| 03/24/2004 | CN1484033A Detection card and preparation, method thereof |
| 03/24/2004 | CN1143334C Active earth fault turn-off electric detector |
| 03/24/2004 | CN1143136C Test head for microstructures with interface |
| 03/23/2004 | US6711057 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 03/23/2004 | US6710798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card |
| 03/23/2004 | US6710615 Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus |
| 03/23/2004 | US6710612 CSP BGA test socket with insert and method |
| 03/23/2004 | US6710610 Socket for testing of semiconductor device, and semiconductor device and method of manufacturing the semiconductor device |
| 03/23/2004 | US6710609 Mosaic decal probe |
| 03/23/2004 | US6710608 Contact probe and probe device |
| 03/23/2004 | US6710369 Liquid metal socket system and method |
| 03/23/2004 | US6710256 Apparatus for connecting high-frequency circuit boards provided with connecting electrodes formed on bar-shaped member |
| 03/23/2004 | US6709279 Contact pin module and testing device provided with the same |
| 03/23/2004 | US6708403 Angled flying lead wire bonding process |
| 03/23/2004 | US6708399 Method for fabricating a test interconnect for bumped semiconductor components |
| 03/18/2004 | WO2004023548A1 Probing method and probe |
| 03/18/2004 | WO2004023547A1 Probing method, probe, and mechanism for reducing/plasma etching electrode |
| 03/18/2004 | WO2003065055A3 Magnetic field detection system for an electricity meter |
| 03/18/2004 | US20040054491 Apparatus and method for testing socket |
| 03/18/2004 | US20040051546 Temperature compensated vertical pin probing device |
| 03/18/2004 | US20040051544 Die carrier |
| 03/18/2004 | US20040051541 Contact structure with flexible cable and probe contact assembly using same |
| 03/18/2004 | US20040051536 Coaxial radio frequency adapter and method |
| 03/18/2004 | US20040051519 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment |
| 03/18/2004 | US20040050656 Belt conveyer with power conduction for electrical test |
| 03/17/2004 | EP1218757B1 Method for making a probe card with multiple contact tips for testing integrated circuits with microsphere contacts |
| 03/17/2004 | CN1142445C Battery tester |
| 03/16/2004 | US6707311 Contact structure with flexible cable and probe contact assembly using same |
| 03/16/2004 | US6707310 Needle load measuring method, needle load setting method and needle load detecting mechanism |
| 03/16/2004 | US6707309 Semiconductor device-socket |
| 03/16/2004 | US6705876 Electrical interconnect assemblies and methods |
| 03/11/2004 | WO2004021019A1 High density probe device |
| 03/11/2004 | WO2004021018A1 Anisotropic, conductive sheet and impedance measuring probe |
| 03/11/2004 | WO2003040734A3 Method and system for compensating thermally induced motion of probe cards |
| 03/11/2004 | US20040048502 Socket for electrical parts |
| 03/11/2004 | US20040047116 Modular housing for use with test equipment |
| 03/11/2004 | US20040046583 Modular socket of integrated circuit |
| 03/11/2004 | US20040046582 Contacting component, method of producing the same, and test tool having the contacting component |
| 03/11/2004 | US20040046581 Socket for testing a semiconductor device and a connecting sheet used for the same |
| 03/11/2004 | US20040046580 Probe card, and testing apparatus having the same |
| 03/11/2004 | US20040046579 High performance probe system |
| 03/11/2004 | US20040046568 Re-locatable partial discharge transducer head |
| 03/11/2004 | DE10240489A1 Tweezers for handling miniature surface mounted electronic devices have instrumentation to indicate gripping condition |
| 03/10/2004 | EP1396050A2 Apparatus and methods to pre-stress anisotropic conductive elastomer meterials |
| 03/10/2004 | EP1395842A2 Electrical component measuring instrument |
| 03/10/2004 | EP1216419B1 Measuring probe for measuring high frequencies |
| 03/09/2004 | US6704670 Systems and methods for wideband active probing of devices and circuits in operation |
| 03/09/2004 | US6703855 Structure of a probe |
| 03/09/2004 | US6703853 Test contact mechanism |
| 03/09/2004 | US6703852 Low-temperature semiconductor device testing apparatus with purge box |
| 03/09/2004 | US6703851 Test socket interposer |
| 03/09/2004 | US6703640 Spring element for use in an apparatus for attaching to a semiconductor and a method of attaching |
| 03/09/2004 | US6702609 IC socket contact medium having uniform contact force |
| 03/09/2004 | US6702589 Leadless socket for decapped semiconductor device |
| 03/04/2004 | WO2004018666A1 Expression vectors encoding epitopes of target-associated antigens |
| 03/04/2004 | US20040043653 High density probe device |
| 03/04/2004 | US20040041581 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 03/04/2004 | US20040041556 Planarity diagnostic system, E.G., for microelectronic component test systems |
| 03/04/2004 | US20040041168 Test insert with electrostatic discharge structures and associated methods |
| 03/04/2004 | CA2494806A1 Expression vectors encoding epitopes of target-associated antigens |
| 03/03/2004 | EP1393154A2 Measuring device with dialog control occurring via dialog windows and corresponding method |
| 03/03/2004 | EP1099247B1 Method for transferring solder to a device and/or testing the device |
| 03/03/2004 | CN1480016A Housing for receiving measuring device |
| 03/03/2004 | CN1479873A Socket for electronic component test and electronic component test apparatus using the socket |
| 03/03/2004 | CN1140806C Voltage measurement instrument having transient overvoltage input protection |
| 03/03/2004 | CN1140805C Automatic tester for plug |
| 03/02/2004 | US6700397 Triaxial probe assembly |
| 03/02/2004 | US6700396 Integrated micromachine relay for automated test equipment applications |
| 03/02/2004 | US6700122 Wafer inspection system and wafer inspection process using charged particle beam |
| 02/26/2004 | WO2004017695A1 Shock absorber means for components and cards |
| 02/26/2004 | WO2004017081A1 Electronic circuit testing method and apparatus |
| 02/26/2004 | US20040038575 Zero insertion force mount for fixing and making contact with circuit subassemblies on a substrate |
| 02/26/2004 | US20040038560 Methods of fabricating and using shaped springs |
| 02/26/2004 | US20040038511 Methods of fabricating silicide pattern structures |
| 02/26/2004 | US20040036493 High performance probe system |
| 02/26/2004 | US20040036492 Method for controlling the temperature of an electronic component under test |
| 02/26/2004 | US20040036491 Probe card |
| 02/26/2004 | US20040036490 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 02/26/2004 | US20040036465 Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device |
| 02/26/2004 | US20040035841 Method and process of contact to a heat softened solder ball array |
| 02/26/2004 | US20040035706 Method for manufacturing probes of a probe card |
| 02/26/2004 | US20040034996 Fabricating fence configured for placement on surface of interposer, including receptacle configured to receive semiconductor device to align conductive elements protruding therefrom with corresponding contact pads, consolidating |
| 02/26/2004 | DE4012839B4 Verfahren und Prüfvorrichtung zum Prüfen von elektrischen oder elektronischen Prüflingen The method and test device for testing of electrical or electronic test specimens |
| 02/26/2004 | DE10101632B4 Oszilloskoptastkopf mit faseroptischem Sensor zur potentialfreien Erfassung elektrischer Größen Oscilloscope probe with fiber optic sensor for detection of electric potential sizes |
| 02/26/2004 | CA2490045A1 Shock absorber means for components and cards |
| 02/25/2004 | EP1391738A2 Probe card |
| 02/25/2004 | EP1391265A1 Contactor cleaning sheet, and contactor cleaning method |
| 02/25/2004 | EP1390766A1 14/42-volt automotive circuit tester |