| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/25/2004 | EP1088238B1 Adapter base for receiving electronic test objects |
| 02/25/2004 | CN1478203A Mechanism for clamping device interface board to peripheral |
| 02/24/2004 | US6696850 Contact probe with off-centered back-drilled aperture |
| 02/24/2004 | US6696849 Fabrication method of semiconductor integrated circuit device and its testing apparatus |
| 02/24/2004 | US6696848 Load board socket adapter and interface method |
| 02/24/2004 | US6696847 Photo assisted electrical linewidth measurement method and apparatus |
| 02/19/2004 | WO2004015766A1 Method of fabricating a heat exchanger for regulating the temperature of multiple integrated circuit modules |
| 02/19/2004 | WO2004015762A1 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 02/19/2004 | WO2004015761A1 Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 02/19/2004 | WO2004015760A1 Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 02/19/2004 | WO2004015434A1 Placing table drive device and probe method |
| 02/19/2004 | WO2004015432A1 Fiducial alignment marks on microelectronic spring contacts |
| 02/19/2004 | WO2003054564A3 Probe card covering system and method |
| 02/19/2004 | WO2003042627A3 Field effect transistor sensor for a screen probe microscope |
| 02/19/2004 | US20040034839 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 02/19/2004 | US20040033707 Leadless socket for decapped semiconductor device |
| 02/19/2004 | US20040032275 Spray cooling and transparent cooling plate thermal management system |
| 02/19/2004 | US20040032274 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
| 02/19/2004 | US20040032272 Contactor having contact electrodes formed by laser processing |
| 02/19/2004 | US20040032271 Anisotropic probing contactor |
| 02/19/2004 | US20040032248 Side supports with adjustable center of gravity |
| 02/19/2004 | US20040032247 Modified construct of testing fixture to improve hermetic seal |
| 02/19/2004 | US20040032020 Protective structures for bond wires |
| 02/19/2004 | DE20318266U1 Car battery current measurement unit has resistance connected to electronics by spring contacts |
| 02/19/2004 | DE10135169B4 Widerstandsanordnung und Strommesser Resistor assembly and ammeter |
| 02/18/2004 | CN2604012Y Crimping terminal |
| 02/18/2004 | CN1476068A Contactor having contact electrode formed by laser |
| 02/17/2004 | US6693363 Ball grid array chip packages having improved testing and stacking characteristics |
| 02/12/2004 | WO2003102603A3 Modular vacuum test adapter |
| 02/12/2004 | WO2003052436A3 Flexible interface for a test head |
| 02/12/2004 | US20040029427 Socket for electrical parts and method for using the same |
| 02/12/2004 | US20040029425 Temporary, conformable contacts for microelectronic components |
| 02/12/2004 | US20040028893 Miniaturized integrated circuits; high speed |
| 02/12/2004 | US20040027151 Method and apparatus for wafer scale testing |
| 02/12/2004 | US20040027148 Method and apparatus for configurable hardware augmented program generation |
| 02/12/2004 | US20040027147 Holding device for electronic part test, and device and method for electronic part test |
| 02/12/2004 | US20040027146 Sensor probe for use in board inspection and manufacturing method thereof |
| 02/12/2004 | US20040027145 Low-current pogo probe card |
| 02/12/2004 | US20040027144 Probe station having multiple enclosures |
| 02/12/2004 | US20040027143 Apparatus and method for inspecting electronic circuits |
| 02/12/2004 | US20040027142 Apparatus and method for inspecting electronic circuits |
| 02/12/2004 | US20040027040 Housing for receiving a measuring device |
| 02/11/2004 | CN1474945A Electronic test head positioner |
| 02/11/2004 | CN1138152C Combined testing system and testing method using same |
| 02/10/2004 | US6690186 Methods and structures for electronic probing arrays |
| 02/10/2004 | US6690184 Air socket for testing integrated circuits |
| 02/10/2004 | US6688906 Probes and methods for testing electrical circuits |
| 02/10/2004 | US6687989 Forming plurality of interconnect contacts on the substrate separate from the raised support configured to electrically engage; testing semiconductors |
| 02/10/2004 | US6687978 Method of forming tester substrates |
| 02/05/2004 | WO2004011953A1 Spiral chuck |
| 02/05/2004 | WO2004011952A1 Electronic device test system |
| 02/05/2004 | WO2003071652A3 Battery monitoring method and apparatus |
| 02/05/2004 | US20040023556 Electrically shielded connector |
| 02/05/2004 | US20040022042 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/05/2004 | US20040022039 Reduced inductance contactor |
| 02/05/2004 | US20040021480 Method and system having switching network for testing semiconductor components on a substrate |
| 02/05/2004 | US20040021477 Method for ball grid array chip packages having improved testing and stacking characteristics |
| 02/05/2004 | US20040021476 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 02/05/2004 | US20040021454 Capacitively coupled RF voltage probe |
| 02/04/2004 | EP1387174A1 Contact probe |
| 02/04/2004 | CN2602380Y Testing arrangement having eight probes for solar battery gate electrode |
| 02/04/2004 | CN1473378A Electric resistance measuring connector and measuring device and measuring method for circuit board electric resistance |
| 02/04/2004 | CN1472540A Production of testing clamping device with connection wires and clamping device |
| 02/04/2004 | CN1137384C Test head for microstructures with interface |
| 02/03/2004 | US6686758 Engagement probe and apparatuses configured to engage a conductive pad |
| 02/03/2004 | US6686754 Integrated circuit tester with high bandwidth probe assembly |
| 02/03/2004 | US6686732 Low-cost tester interface module |
| 02/03/2004 | US6685817 Controlling thickness of plating over a width of a substrate |
| 01/29/2004 | WO2004010491A1 Probe device, probe card channel information creation program, and probe card channel information creation device |
| 01/29/2004 | WO2004010156A1 Method and test adapter for testing an appliance having a smart card reader |
| 01/29/2004 | WO2004010152A1 Method of making microelectronic spring contact array |
| 01/29/2004 | WO2003100445A3 Probe for testing a device under test |
| 01/29/2004 | US20040019452 Methods for compensating for a test temperature deviation |
| 01/29/2004 | US20040018752 Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 01/29/2004 | US20040017216 Multi-socket board for open/short tester |
| 01/29/2004 | US20040017214 Low-current pogo probe card |
| 01/29/2004 | US20040017185 Device for compensating for a test temperature deviation in a semiconductor device handler |
| 01/29/2004 | US20040017184 Simultaneous display of data gathered using multiple data gathering mechanisms |
| 01/29/2004 | US20040016997 Socket for semiconductor package |
| 01/29/2004 | US20040016993 Test tray with carrier modules for a semiconductor device handler |
| 01/29/2004 | US20040016119 Method of making microelectronic spring contact array |
| 01/29/2004 | DE19750928B4 Hochfrequenzdichtes Kastengehäuse für elektronische Geräte und Verfahren zu dessen Herstellung High-frequency-impervious housing box for electronic devices and method for its production |
| 01/29/2004 | DE10318181A1 Verfahren und Vorrichtung zur konfigurierbaren Hardwareverstärkten-Programmerzeugung Method and apparatus for configurable hardware enhanced program generation |
| 01/29/2004 | DE10229541A1 Testvorrichtung für Bauteile integrierter Schaltungen Test device for components of integrated circuits |
| 01/29/2004 | DE10229117A1 Nullsteckkraft-Fassung zur Befestigung und Kontaktierung von Schaltbaugruppen auf einem Substrat Zero insertion force socket for mounting and contacting of switching modules on a substrate |
| 01/29/2004 | DE10227613A1 Steckverbinder und zu diesem komplementärer Prüfsteckverbinder Connectors and this complementary Test Connectors |
| 01/29/2004 | DE10200621A1 Kontaktsockel mit lösbaren Kontakten zur elektrischen Kontaktierung eines insbesondere vielpoligen elektronischen Bauelements sowie Modulträger Contact socket with removable contacts for electrical contacting of a particular multi-pole electronic component and module support |
| 01/28/2004 | EP1385011A1 Integrated circuit test probe |
| 01/28/2004 | EP1204872B1 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 01/28/2004 | CN2601405Y Retrieving positioning structure of watt-hour meter testing rod |
| 01/28/2004 | CN1471156A Socket for semiconductor package |
| 01/28/2004 | CN1471151A Test tray with carrier assembly for semiconductor device processing machine |
| 01/28/2004 | CN1471150A Apparatus for compensatnig deviation of test temperature is semiconductor device processing machine |
| 01/28/2004 | CN1470966A Method for compensating deviation of test temperature |
| 01/28/2004 | CN1470882A Checking tool for printed circuit-board |
| 01/27/2004 | US6683466 Piston for module test |
| 01/22/2004 | WO2004008492A2 Mosaic decal probe |
| 01/22/2004 | WO2004008163A2 Assembly for connecting a test device to an object to be tested |
| 01/22/2004 | US20040013396 Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components |
| 01/22/2004 | US20040012405 Probe card with full wafer contact configuration |