| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 04/21/2004 | EP1411359A1 Probe card for semiconductor wafers and system for testing wafers |
| 04/21/2004 | EP1266234B1 Testing device for printed boards |
| 04/21/2004 | CN1490628A Superconductor high-temperature strip critical current measurnig method and apparatus |
| 04/21/2004 | CN1490625A Method and device for testing monoboard with straight male interconnecting part |
| 04/21/2004 | CN1146730C Contact-making apparatus affording ease of servicing |
| 04/20/2004 | US6725170 Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth |
| 04/20/2004 | US6724213 Test board for testing semiconductor device |
| 04/20/2004 | US6724208 Probe pin for testing electrical characteristics of apparatus, probe card using probe pins |
| 04/20/2004 | US6724207 Structure composite-type test fixture |
| 04/20/2004 | US6724206 Device carrier and autohandler |
| 04/20/2004 | US6724205 Probe for combined signals |
| 04/20/2004 | US6724204 Probe structure for testing semiconductor devices and method for fabricating the same |
| 04/20/2004 | US6724203 Full wafer test configuration using memory metals |
| 04/20/2004 | US6722032 Method of forming a structure for electronic devices contact locations |
| 04/15/2004 | WO2004031783A1 Contact probe with off-centered back-drilled aperture |
| 04/15/2004 | WO2004031782A1 Test head positioning apparatus |
| 04/15/2004 | WO2003102612A3 Fixing means for components and cards |
| 04/15/2004 | US20040072456 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods |
| 04/15/2004 | US20040072452 Microelectronic contact structures, and methods of making same |
| 04/15/2004 | US20040070961 Contactor apparatus for semiconductor devices and a test method of semiconductor devices |
| 04/15/2004 | US20040070925 Method for making a block for testing components |
| 04/15/2004 | US20040070417 Cantilever type probe card and method for production thereof |
| 04/15/2004 | US20040070416 Device testing apparatus |
| 04/15/2004 | US20040070414 Socket for inspection |
| 04/15/2004 | US20040070413 Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method |
| 04/15/2004 | US20040070412 Device testing contactor, method of producing the same, and device testing carrier |
| 04/15/2004 | US20040070411 Single point probe structure and method |
| 04/15/2004 | US20040070404 Test probe |
| 04/15/2004 | US20040070402 Substrate impedance measurement |
| 04/15/2004 | US20040070010 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 04/15/2004 | US20040068869 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 04/15/2004 | DE10192788T5 Verfahren und Vorrichtung zur Kantenverbindung zwischen Elementen einer integrierten Schaltung Method and device for edge connection between elements of an integrated circuit |
| 04/14/2004 | EP1408338A2 Method for making a probe card with multiple contact tips for testing integrated circuit |
| 04/14/2004 | EP1408337A2 Probe card assembly |
| 04/14/2004 | EP1408327A2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
| 04/14/2004 | EP1407280A1 Method of manufacturing a probe card |
| 04/14/2004 | EP1000363A4 Spreading resistance profiling system |
| 04/14/2004 | EP0880311B1 Electromagnetic field shielding device |
| 04/14/2004 | CN2612118Y Check box |
| 04/14/2004 | CN1489785A Connector for semiconductor device and method for testing semiconductor device |
| 04/14/2004 | CN1489696A 镍合金探针卡框架层压件 Nickel alloy frame laminate probe card |
| 04/14/2004 | CN1489695A Planarizing interposer |
| 04/14/2004 | CN1488952A Integrated block on-line measuring apparatus |
| 04/14/2004 | CN1488945A Integrated circuit performance measurement and circuit experiment apparatus |
| 04/14/2004 | CN1145802C Microelectronic spring contact element and electronic element thereof |
| 04/13/2004 | US6720928 Parallel displacement/inclination measuring apparatus and antenna system |
| 04/13/2004 | US6720786 Lead formation, assembly strip test, and singulation system |
| 04/13/2004 | US6720783 IC socket and spring means of IC socket |
| 04/13/2004 | US6720782 Wafer probe station for low-current measurements |
| 04/13/2004 | US6720781 Circuit board tester probe system |
| 04/13/2004 | US6720780 High density probe card apparatus and method of manufacture |
| 04/13/2004 | US6720557 Particle beam apparatus |
| 04/08/2004 | WO2004030080A1 A hollow microprobe using a mems technique and a method of manufacturing the same |
| 04/08/2004 | WO2004029636A1 Rf chip testing method and system |
| 04/08/2004 | WO2004003575A3 Test device for integrated circuit components |
| 04/08/2004 | WO2003100446A3 High performance probe system for testing semiconductor wafers |
| 04/08/2004 | WO2003079383A3 Contactor assembly for testing ceramic surface mount devices and other electronic components |
| 04/08/2004 | US20040066193 Methods and devices for dissolving hyperpolarised solid material for nmr analyses |
| 04/08/2004 | US20040066181 High-frequency probe tip |
| 04/08/2004 | US20040064941 Sockets for "springed" semiconductor device |
| 04/07/2004 | EP1406292A2 Plasma treatment equipment and impedance measurement tool |
| 04/07/2004 | EP1405113A2 Fibre optic wafer probe |
| 04/07/2004 | CN2610339Y 试电笔 Test pencil |
| 04/07/2004 | CN2610336Y Probe device of line board tester |
| 04/07/2004 | CN1487660A Movement controller for electromagnetic driving mechanism |
| 04/07/2004 | CN1145066C Supporting frame of panel display device or probe block |
| 04/06/2004 | US6717426 Blade-like connecting needle |
| 04/06/2004 | US6717424 Electrode and fixture for measuring electronic components |
| 04/06/2004 | US6717423 Substrate impedance measurement |
| 04/06/2004 | US6717422 Air socket for testing integrated circuits |
| 04/06/2004 | US6717421 Electric contact probe assembly |
| 04/06/2004 | US6717398 Signal launch connecting techniques |
| 04/06/2004 | US6716745 Silicide pattern structures and methods of fabricating the same |
| 04/06/2004 | US6716049 IC socket with bearing springs |
| 04/01/2004 | WO2004027836A2 Die carrier |
| 04/01/2004 | WO2004027437A1 Performance board and test system |
| 04/01/2004 | US20040063642 Novel benzimidazolone peptidomimetics as thrombin receptor antagonists |
| 04/01/2004 | US20040063352 Membrane probe with anchored elements |
| 04/01/2004 | US20040063241 Socket for semiconductor package |
| 04/01/2004 | US20040063229 High fidelity electrical probe |
| 04/01/2004 | US20040061515 Flip chip test structure |
| 04/01/2004 | US20040061514 Wafer probe station for low-current measurements |
| 04/01/2004 | US20040061513 Differential coaxial contact array for high-density, high-speed signals |
| 04/01/2004 | US20040061487 Test probe including control device |
| 04/01/2004 | DE10260766A1 Integrated circuit contacting device for front-end testing has positioning device for defined positioning of test card relative to substrate disc provided with integrated circuits in given configuration |
| 03/31/2004 | EP1402763A2 Method and apparatus for non-destructive testing of leaded packages |
| 03/31/2004 | EP0985154B1 Broadband impedance matching probe |
| 03/31/2004 | CN2609180Y Testing head and testing fixed piece |
| 03/31/2004 | CN1486430A Pusher and electronic part-testing apparatus with the same |
| 03/31/2004 | CN1486428A Low cost, on-line corrosion monitor and smart corrosion probe |
| 03/31/2004 | CN1485622A Fresnel lens and the transmission style screen |
| 03/30/2004 | US6714828 Method and system for designing a probe card |
| 03/30/2004 | US6714030 For measuring electrical characteristics during semiconductor manufacture processes such as probing inspection and burn-in inspection |
| 03/30/2004 | US6714029 Contact pin for testing microelectronic components having substantially spherical contacts |
| 03/30/2004 | US6714028 Roller contact with conductive brushes |
| 03/30/2004 | US6714026 System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
| 03/30/2004 | US6713376 Method of manufacturing a contract element and a multi-layered wiring substrate, and wafer batch contact board |
| 03/25/2004 | WO2004025309A1 Interface comprising a thin pcb with protrusions for testing an integrated circuit |
| 03/25/2004 | WO2003081725B1 A miniaturized contact spring |
| 03/25/2004 | US20040058487 Segmented contactor |