| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/07/2004 | CN1511264A Electrical component measuring instrument |
| 07/07/2004 | CN1511260A 接触探针 The touch probe |
| 07/06/2004 | US6759859 Resilient and rugged multi-layered probe |
| 07/06/2004 | US6759858 Integrated circuit test probe having ridge contact |
| 07/06/2004 | US6759854 Test apparatus for testing devices under test and method for transmitting a test signal |
| 07/06/2004 | US6759853 Automated domain reflectometry testing system |
| 07/06/2004 | US6759842 Interface adapter for automatic test systems |
| 07/06/2004 | US6759261 Thin film-structure and a method for producing the same |
| 07/06/2004 | US6759258 Connection device and test system |
| 07/06/2004 | US6757972 Method of forming socket contacts |
| 07/01/2004 | WO2004055530A1 Guarded tub enclosure |
| 07/01/2004 | US20040127075 Socket |
| 07/01/2004 | US20040127074 Interconnect assemblies and methods |
| 07/01/2004 | US20040124864 System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment |
| 07/01/2004 | US20040124862 Probe card |
| 07/01/2004 | US20040124861 Ultra-short low-force vertical probe test head and method |
| 07/01/2004 | US20040124829 Embedded voltage regulator and active transient control device in probe head for improved power delivery and method |
| 07/01/2004 | US20040124519 Contact structure and production method thereof and probe contact assembly using same |
| 07/01/2004 | US20040124507 Contact structure and production method thereof |
| 07/01/2004 | DE10024875B4 Bauteilhaltersystem zur Verwendung mit Testvorrichtungen zum Testen elektronischer Bauteile Component holder system for use with test apparatus for testing electronic components |
| 06/30/2004 | EP1432994A2 System and method for segmenting the left ventricle in a cardiac mr image |
| 06/30/2004 | EP1432546A1 Optical testing device |
| 06/30/2004 | CN1508555A Shielded probe apparatus for probing semiconductor water |
| 06/30/2004 | CN1508510A Step-recursion nano-level measuring system based on high-precision inductive probe |
| 06/30/2004 | CN1156088C Decoder circuit of binary dial code |
| 06/29/2004 | US6756877 Shunt resistor configuration |
| 06/29/2004 | US6756802 Test system for electronic modules having contactors with spring segment terminal portions |
| 06/29/2004 | US6756801 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 06/29/2004 | US6756798 Contactor assembly for testing ceramic surface mount devices and other electronic components |
| 06/29/2004 | US6756797 Planarizing interposer for thermal compensation of a probe card |
| 06/29/2004 | US6756244 Interconnect structure |
| 06/29/2004 | CA2215081C Clamp jaw, lever bypass meter socket |
| 06/24/2004 | WO2004053976A2 Method of making a socket to perform testing on integrated circuits and such a socket |
| 06/24/2004 | WO2004053944A2 Fast localization of electrical failures on an integrated circuit system and method |
| 06/24/2004 | WO2004053508A1 Inspection method and inspection equipment |
| 06/24/2004 | US20040121627 Microelectronic contact structure |
| 06/24/2004 | US20040119485 Probe finger structure and method for making a probe finger structure |
| 06/24/2004 | US20040119463 Probe card for testing a semiconductor |
| 06/24/2004 | US20040118603 Methods and apparatus for a flexible circuit interposer |
| 06/24/2004 | DE19580814B4 IC-Handler mit IC-Träger IC handler with IC carrier |
| 06/23/2004 | EP1432110A1 Phase current detector |
| 06/23/2004 | EP1431241A2 Probe finger structure and method for making a probe finger structure |
| 06/23/2004 | EP1430317A1 Tap switch for frequency response and partial discharge measurement |
| 06/23/2004 | EP1051464B1 Method for preparing an emulsified fuel and implementing device |
| 06/23/2004 | CN1155070C Process for manufacturing semiconductor device |
| 06/23/2004 | CN1154967C Liquid crystal display panel inspection device and method for manufacturing same |
| 06/23/2004 | CN1154946C Hands-free, user-supported portable computer |
| 06/22/2004 | US6753684 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe |
| 06/22/2004 | US6753676 RF test probe |
| 06/22/2004 | US6753194 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 06/22/2004 | US6752391 Customizable nest with the option of conversion to a permanent nest |
| 06/17/2004 | WO2004049897A2 Portable body for diagnostic equipment |
| 06/17/2004 | US20040115964 IC tester socket with flexible contact points |
| 06/17/2004 | US20040113643 Probe device |
| 06/17/2004 | US20040113639 Guarded tub enclosure |
| 06/17/2004 | US20040112142 Test kit for semiconductor package and method for testing semiconductor package using the same |
| 06/17/2004 | DE10254180A1 Car electromechanical actuator current measurement amplifier has low pass input filter and control signal controlled isolation switch |
| 06/15/2004 | US6751091 Modular housing for use with test equipment |
| 06/15/2004 | US6750669 Method for constructing a flex-rigid laminate probe |
| 06/15/2004 | US6750667 Adapting apparatus with detecting and repairing functions and method thereof |
| 06/15/2004 | US6750136 Contact structure production method |
| 06/15/2004 | US6750070 Process for manufacturing flip-chip semiconductor assembly |
| 06/10/2004 | WO2004049429A1 Probe for testing flat panel display and manufacturing method thereof |
| 06/10/2004 | WO2004049424A2 Microelectronic packaging and components |
| 06/10/2004 | WO2004048982A2 Probe array and method of its manufacture |
| 06/10/2004 | WO2004048981A1 Test adaptor device for testing circuit boards |
| 06/10/2004 | WO2004008163A3 Assembly for connecting a test device to an object to be tested |
| 06/10/2004 | WO2003052437A3 Microprocessor-based probe for integrated circuit testing |
| 06/10/2004 | US20040108865 Back pressure test fixture to allow probing of integrated circuit package signals |
| 06/10/2004 | US20040108848 Adapter method and apparatus for interfacing a tester with a device under test |
| 06/10/2004 | US20040107568 Method for making a socket to perform testing on integrated circuits and socket made |
| 06/09/2004 | EP1425598A1 Magnetic resonance apparatus with excitation antennae system |
| 06/09/2004 | DE10254520A1 Line connections formation method for test adapter for non-multiplexed and multiplexed test system for electronic board, involves pressing pins of needle carrier plate into direct route contact plate |
| 06/09/2004 | CN1502995A Inspection jig for radio frequency device ,and contact probe imcorporated in the jig |
| 06/09/2004 | CN1153269C Probe card and tester using said card |
| 06/08/2004 | US6747472 Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the same |
| 06/08/2004 | US6747467 Assembly apparatus and method of contactor |
| 06/08/2004 | US6747466 Substrate testing apparatus and substrate testing method |
| 06/08/2004 | US6747465 Contractor, method for manufacturing the same, and probe card using the same |
| 06/08/2004 | US6746252 High frequency compression mount receptacle with lineal contact members |
| 06/03/2004 | WO2004046739A1 Electric probe system |
| 06/03/2004 | WO2004027836A3 Die carrier |
| 06/03/2004 | US20040106307 Socket for electrical parts |
| 06/03/2004 | US20040106218 Integrated compound nano probe card and method of making same |
| 06/03/2004 | US20040104741 Method for in-line testing of flip-chip semiconductor assemblies |
| 06/03/2004 | US20040104739 Contact probe |
| 06/03/2004 | US20040104738 Probe card |
| 06/03/2004 | US20040104737 Contact probe |
| 06/03/2004 | DE19983759B4 Elektrisches Kontaktsystem Electrical contact system |
| 06/02/2004 | EP1424748A2 Microelectronic contacts and assemblies |
| 06/01/2004 | US6745140 Electronic test system with test results view filter |
| 06/01/2004 | US6744268 High resolution analytical probe station |
| 06/01/2004 | US6744246 Electrical probe |
| 06/01/2004 | US6743048 Measuring system with cylindrical housing body carrying elastic tongues for connection to a support member |
| 06/01/2004 | US6743043 Socket for electrical parts having separable plunger |
| 06/01/2004 | US6743039 Ball grid array connector |
| 06/01/2004 | US6743033 Contactor for semiconductor device and contact method |
| 05/27/2004 | WO2004044949A2 Probe station with low noise characteristics |
| 05/27/2004 | WO2004044604A1 A probe for combined signals |
| 05/27/2004 | WO2003103351B1 Fixing means |