| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 08/10/2004 | US6773934 Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer |
| 08/10/2004 | CA2165120C Microwave circuit test fixture |
| 08/05/2004 | WO2004066378A1 Probe device with optical length-measuring device and method of inspecting probe |
| 08/05/2004 | WO2004053976A3 Method of making a socket to perform testing on integrated circuits and such a socket |
| 08/05/2004 | US20040152348 Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component |
| 08/05/2004 | US20040152347 Socket assembly for test of integrated circuit, and its integrated circuit and tester |
| 08/05/2004 | US20040152232 Stud-cone bump for probe tips used in known good die carriers |
| 08/05/2004 | US20040150490 Interface apparatus for integrated circuit testing |
| 08/05/2004 | US20040150416 Probe station thermal chuck with shielding for capacitive current |
| 08/05/2004 | US20040150383 Electrical component measuring instrument |
| 08/05/2004 | US20040148773 Angled flying lead wire bonding process |
| 08/05/2004 | DE10297010T5 Elektrisch leitende Kontakteinheit Electrically conductive contact unit |
| 08/04/2004 | EP1443337A2 Electro-optic measuring instrument |
| 08/04/2004 | EP1442307A2 Method and system for compensating thermally induced motion of probe cards |
| 08/04/2004 | EP0792462B1 Probe card assembly and method of using the same |
| 08/04/2004 | CN2630856Y Electromagnetic drive device |
| 08/04/2004 | CN1518667A Conductive contactor and electric probe unit |
| 08/04/2004 | CN1160577C Electric current pick-up shoe |
| 08/03/2004 | US6771090 Indexing rotatable chuck for a probe station |
| 08/03/2004 | US6771088 Method and apparatus for testing semiconductor devices using the back side of a circuit board |
| 08/03/2004 | US6771085 Socketless/boardless test interposer card |
| 08/03/2004 | US6771084 Single-sided compliant probe apparatus |
| 08/03/2004 | US6769963 IC handler and contact cleaning method |
| 07/29/2004 | US20040145385 Multipoint plane measurement probe and methods of characterization and manufacturing using same |
| 07/29/2004 | US20040145382 Probe structure |
| 07/29/2004 | DE10340333A1 Carrier for holding and individual electrical contacting of individual semiconductor dies during testing or burning in has contact assemblies with an elastomer bump that enables contacting of dies using a vacuum force |
| 07/29/2004 | DE10301827A1 Power semiconductor measurement arrangement for measuring chips still contained within a wafer, whereby a wafer support has individual recesses in which testing needles are inserted to ensure they are precisely positioned |
| 07/29/2004 | DE10301124A1 Universal measurement system, for adapting or contacting of different semiconductor package types, comprises an adapter for connecting a package matched socket to a standard PGA (pin grid array) socket |
| 07/29/2004 | DE10300532A1 Socket or adapter for use in semiconductor component testing systems, especially for memory component testing, is designed to permit solder-free mounting on a contact assembly |
| 07/29/2004 | DE10300531A1 Socket or adapter for use in semiconductor component testing systems, especially for memory component testing, has a connection pin that is inserted into a matching contact so that a clamped connection is formed |
| 07/28/2004 | EP1441232A2 Method for connecting electronic components |
| 07/28/2004 | EP1440957A2 Ceramic heater |
| 07/28/2004 | CN2629045Y Electric connector |
| 07/28/2004 | CN1159757C Device for connection of test head and probe board in substrate-testing system |
| 07/27/2004 | US6768653 Mount structure |
| 07/27/2004 | US6768331 Wafer-level contactor |
| 07/27/2004 | US6768330 IC component test socket assembly having error protection device |
| 07/27/2004 | US6768329 Structure and method of testing failed or returned die to determine failure location and type |
| 07/27/2004 | US6768328 Single point probe structure and method |
| 07/27/2004 | US6768327 Testing head having vertical probes for semiconductor integrated electronic devices |
| 07/27/2004 | US6768322 Device for measuring an electrical current that flows through a strip conductor |
| 07/27/2004 | US6767221 IC socket module |
| 07/27/2004 | US6767219 Contactor, method for manufacturing such contactor, and testing method using such contactor |
| 07/27/2004 | CA2244692C Temperature compensated current measurement device |
| 07/22/2004 | WO2003030010A3 Programmable array for efficient computation of convolutions in digital signal processing |
| 07/22/2004 | US20040143411 Test handling apparatus and method |
| 07/22/2004 | US20040142583 Spring interconnect structures |
| 07/22/2004 | US20040140825 Apparatus and method for electrical testing of electrical circuits |
| 07/22/2004 | US20040140824 Probe card |
| 07/22/2004 | US20040140823 Test system, test contactor, and test method for electronic modules |
| 07/22/2004 | US20040140822 Integrated circuit tester with high bandwidth probe assembly |
| 07/22/2004 | US20040140821 Test PCB and contactor for testing of electronic device |
| 07/22/2004 | US20040140820 Probing method and prober |
| 07/22/2004 | US20040140819 Differential voltage probe |
| 07/22/2004 | US20040140794 Wafer probing test apparatus and method of docking the test head and probe card thereof |
| 07/22/2004 | DE10297011T5 Elektrisch leitende Kontakteinheit Electrically conductive contact unit |
| 07/21/2004 | EP1439397A2 Method of performing a burn-in |
| 07/21/2004 | EP1438596A2 Method and apparatus for in-circuit testing of sockets |
| 07/21/2004 | EP1438591A1 Coaxial tilt pin fixture for testing high frequency circuit boards |
| 07/21/2004 | EP1238288B1 Battery sensor device |
| 07/21/2004 | CN2627517Y Improved 58 probes tool structure |
| 07/21/2004 | CN1514938A Method for mfg. of probe pin, and method for mfg. of probe card |
| 07/21/2004 | CN1158531C Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 07/20/2004 | US6765402 Back pressure test fixture to allow probing of integrated circuit package signals |
| 07/20/2004 | US6765401 Semiconductor testing apparatus for conducting conduction tests |
| 07/20/2004 | US6765400 Inspection apparatus and probe card |
| 07/20/2004 | US6765399 Test socket and system |
| 07/20/2004 | US6765396 Method, apparatus and software for testing a device including both electrical and optical portions |
| 07/20/2004 | US6764869 Method of assembling and testing an electronics module |
| 07/20/2004 | US6763581 Method for manufacturing spiral contactor |
| 07/20/2004 | US6763578 Method and apparatus for manufacturing known good semiconductor die |
| 07/15/2004 | WO2004059330A2 Microelectronic contact structure |
| 07/15/2004 | WO2004059328A2 Composite motion probing |
| 07/15/2004 | WO2004049424A3 Microelectronic packaging and components |
| 07/15/2004 | US20040137774 Socket for electrical parts |
| 07/15/2004 | US20040137767 IC socket for a fine pitch IC package |
| 07/15/2004 | US20040135594 Compliant interposer assembly for wafer test and "burn-in" operations |
| 07/15/2004 | US20040135593 Fabrication method of semiconductor integrated circuit device and its testing apparatus |
| 07/15/2004 | US20040135592 Test socket for packaged semiconductor devices |
| 07/15/2004 | US20040135587 Color code and alphanumeric system for identifying components of a proximity measurement system |
| 07/15/2004 | DE10059745B4 Messvorrichtung zum Testen unverpackter Chips Measuring device for testing unpackaged chips |
| 07/15/2004 | DE10053745B4 Vorrichtung und Verfahren zur Kontaktierung eines oder mehrerer Anschlüsse an einem elektronischen Bauteil An apparatus and method for contacting one or more connections to an electronic component |
| 07/14/2004 | EP1436636A1 Method and apparatus for sub-micron imaging and probing on probe station |
| 07/14/2004 | EP0979415B1 Manipulator with expanded range of motion |
| 07/14/2004 | EP0772784B1 A method of and a system for moving a measuring means above a test object |
| 07/14/2004 | CN1513219A Socket connector and contact for use in socket connector |
| 07/14/2004 | CN1512556A Contactor for detecting ball grid array package chip in semiconductor |
| 07/14/2004 | CN1512186A Probe sheet, probe card, semiconductor detector and method for producing semiconductor device |
| 07/14/2004 | CA2454967A1 Device for measuring an electric current |
| 07/13/2004 | US6762616 Probe system |
| 07/13/2004 | US6762615 Parallel test board used in testing semiconductor memory devices |
| 07/13/2004 | US6762612 Probe contact system having planarity adjustment mechanism |
| 07/08/2004 | US20040130343 High density cantilevered probe for electronic devices |
| 07/08/2004 | US20040130342 Air socket for testing integrated circuits |
| 07/08/2004 | US20040130312 Composite motion probing |
| 07/08/2004 | DE202004005165U1 Probe holder used in taking high frequency measurements during testing of semiconductor chips, includes X and Y planes lying at least approximately in common plane |
| 07/08/2004 | DE10257589A1 Measurement adapter for connecting to an automotive flat type fuse is configured to allow connection to the fuse in situ so that current measurements can be made without breaking a circuit |
| 07/07/2004 | EP1435645A2 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober |
| 07/07/2004 | EP1435524A1 Battery sensor device |
| 07/07/2004 | EP0979389B1 Cable tray assembly for testing device |