| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 09/02/2004 | US20040169520 Methods and apparatus for testing optical and electrical components |
| 09/02/2004 | DE20320473U1 Electrical resistor assembly used to measure current from battery or generator for road vehicle electrical network has separate flat contact tags |
| 09/02/2004 | DE10000500B4 Vorrichtung zur Messung eines in einem Elektronikmodul fließenden Stroms A device for measuring a current flowing in a current electronic module |
| 09/01/2004 | EP1452879A1 Current detecting circuit and actuator driving apparatus |
| 09/01/2004 | EP1451594A1 Test probe for a finger tester and corresponding finger tester |
| 09/01/2004 | EP0650067B1 Electrooptic instrument |
| 09/01/2004 | CN1526183A Apparatus and methods to pre-stress anisotropic conductive elastomer meterials |
| 09/01/2004 | CN1526163A Probe device and probe testing method |
| 09/01/2004 | CN1525185A Electrical inspection apparatus |
| 09/01/2004 | CN1525183A Probe based information storage for probes used for opens detection in in-circuit testing |
| 09/01/2004 | CN1525179A Work measurement apparatus |
| 08/31/2004 | US6784681 Semiconductor integrated circuit testing system and method |
| 08/31/2004 | US6784680 Contact probe with guide unit and fabrication method thereof |
| 08/31/2004 | US6784679 Differential coaxial contact array for high-density, high-speed signals |
| 08/31/2004 | US6784678 Test apparatus for semiconductor circuit and method of testing semiconductor circuits |
| 08/31/2004 | US6784677 Closed-grid bus architecture for wafer interconnect structure |
| 08/31/2004 | US6784675 Wireless test fixture adapter for printed circuit assembly tester |
| 08/31/2004 | US6784674 Test signal distribution system for IC tester |
| 08/31/2004 | US6783316 Apparatus and method for testing semiconductor devices |
| 08/31/2004 | US6782614 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts |
| 08/31/2004 | US6782613 Interposer structures having formed thereon a plurality of conductive pillars or recesses that are adapted to make electrical contact with the leads of an integrated circuit package |
| 08/26/2004 | WO2004072661A1 Electrical connection device |
| 08/26/2004 | WO2004072658A2 Apparatus for making high-sensitivity measurements of various parameters, and sensors particularly useful in such apparatus |
| 08/26/2004 | WO2004059328A3 Composite motion probing |
| 08/26/2004 | US20040167728 Method for locating wiring swap in a hi-fix structure of a simultaneous multi-electronic device test system |
| 08/26/2004 | US20040166702 Semiconductor device having external contact terminals and method for using the same |
| 08/26/2004 | US20040166664 Thin film-structure and a method for producing the same |
| 08/26/2004 | US20040166330 Thin film-structure and a method for producing the same |
| 08/26/2004 | US20040164759 Prober |
| 08/26/2004 | US20040164758 Substrate impedance measurement |
| 08/26/2004 | US20040164757 Voltage-applying probe, apparatus for manufacturing electron source using the probe, and method for manufacturing electron source using the apparatus |
| 08/26/2004 | US20040164754 Connector-less probe |
| 08/26/2004 | US20040164752 Probe based information storage for probes used for opens detection in in-circuit testing |
| 08/26/2004 | US20040164748 Variable impedance test probe |
| 08/26/2004 | US20040164722 Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents |
| 08/26/2004 | US20040163927 Work measurement apparatus |
| 08/26/2004 | US20040163252 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 08/26/2004 | DE10013345B4 Einrichtung zum Messen eines durch eine Leiterbahn fließenden elektrischen Stroms und deren Anwendung Means for measuring a current flowing through a conductive path of electric current and the application |
| 08/25/2004 | EP1450171A2 Wafer inspection device and wafer inspection method |
| 08/25/2004 | EP1450169A1 Screwdiver having high electric isolation, indicator of the presence of a phase |
| 08/25/2004 | EP0839323B1 Microelectronic spring contact elements |
| 08/25/2004 | CN1524185A A test handling apparatus and method |
| 08/25/2004 | CN1523361A Probe, probe assembly method and probe plate |
| 08/24/2004 | US6781400 Method of testing semiconductor integrated circuits and testing board for use therein |
| 08/24/2004 | US6781396 Low-current probe card |
| 08/24/2004 | US6781395 Contactor with greater contact pressure (adhesive force) between the wiring substrate and the semiconductor device by providing a seal between a base member and the wiring substrate |
| 08/24/2004 | US6781392 Modularized probe card with compressible electrical connection device |
| 08/24/2004 | US6781391 Multi-channel, low input capacitance signal probe and probe head |
| 08/24/2004 | US6781390 Conductive coil contact member |
| 08/24/2004 | US6781360 Jump bar shunt structure for power components |
| 08/24/2004 | US6780001 Forming tool for forming a contoured microelectronic spring mold |
| 08/19/2004 | WO2004070399A1 A method for detecting and monitoring wafer probing process instability |
| 08/19/2004 | US20040161981 Press fitting type spring connector |
| 08/19/2004 | US20040160827 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 08/19/2004 | US20040160236 Contact probe and probe device |
| 08/19/2004 | DE202004007830U1 Force measurement device for measuring the force required to pull a pin element out of a socket in a plug in connector has sensor elements assigned to each of a number of sectors of a testing tip of a plug in pin |
| 08/18/2004 | EP1447846A2 Socket and method for connecting electronic components |
| 08/18/2004 | EP0792464B1 A measuring line for a coaxial conductor for determining energy throughflow and standing wave ratios |
| 08/18/2004 | CN2634497Y Portable meter recording mirror |
| 08/18/2004 | CN2634485Y Probe part |
| 08/18/2004 | CN2634484Y 测试元件 Test elements |
| 08/18/2004 | CN1522483A Contact for spiral contactor and spiral contactor |
| 08/18/2004 | CN1522373A Conductive contact |
| 08/18/2004 | CN1522372A Support body assembly for conductive contactor |
| 08/18/2004 | CN1521895A Press fitting type spring connector |
| 08/18/2004 | CN1521510A Device for measuring the electrical current |
| 08/18/2004 | CN1162707C Detecting head for high-frequency measurement |
| 08/17/2004 | US6778406 Resilient contact structures for interconnecting electronic devices |
| 08/17/2004 | US6777968 Probing method and probing apparatus in which steady load is applied to main chuck |
| 08/17/2004 | US6777967 Inspection method and inspection apparatus |
| 08/17/2004 | US6777964 Probe station |
| 08/17/2004 | US6777963 Chip-mounted contact springs |
| 08/17/2004 | US6777953 Parallel arc fault diagnostic for aircraft wiring |
| 08/17/2004 | US6777677 Method of inspecting pattern and inspecting instrument |
| 08/17/2004 | US6777319 Microelectronic spring contact repair |
| 08/17/2004 | US6776624 Socket for electrical parts |
| 08/12/2004 | WO2004068155A1 Probe device and display substrate testing apparatus using same |
| 08/12/2004 | WO2004068150A1 Universal measuring adapter system |
| 08/12/2004 | US20040157495 Light socket |
| 08/12/2004 | US20040157475 Support member assembly for electroconductive contact members |
| 08/12/2004 | US20040157350 Method for forming photo-defined micro electrical contacts |
| 08/12/2004 | US20040155672 Load board socket adapter and interface method |
| 08/12/2004 | US20040155671 Support for thin wafers |
| 08/12/2004 | US20040155645 Jump bar shunt structure for power components |
| 08/12/2004 | US20040155241 Test assembly for integrated circuit package |
| 08/12/2004 | US20040155240 Apparatus and method for measuring semiconductor wafer electrical properties |
| 08/12/2004 | US20040155009 Method for manufacturing a probe card |
| 08/12/2004 | US20040154165 Method for manufacturing a probe pin and a probe card |
| 08/12/2004 | DE10297044T5 Programmierbarer Testsockel Programmable test socket |
| 08/11/2004 | EP1445620A1 Wafer-level burn-in or testing method using a burn-in or test cartridge |
| 08/11/2004 | EP1445618A1 Device for measuring the electrical current |
| 08/11/2004 | EP1444528A1 Electrical test probes and methods of making the same |
| 08/11/2004 | CN2632683Y Improved measuring probe devices |
| 08/11/2004 | CN1519907A Carrier of holding and electrical contact individual separated wafer |
| 08/11/2004 | CN1519572A Transportation mechanism, mobile probe board transportation appts. using same, and detector thereof |
| 08/11/2004 | CN1161620C Residual current detection device |
| 08/10/2004 | US6774657 Apparatus and method of inspecting semiconductor integrated circuit |
| 08/10/2004 | US6774654 Semiconductor-device inspecting apparatus and a method for manufacturing the same |
| 08/10/2004 | US6774652 Cantilever type probe card and method for production thereof |
| 08/10/2004 | US6774650 Probe card and method of testing wafer having a plurality of semiconductor devices |