| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/29/2004 | CN1168989C Check terminal for testing electronic chip element, checking method and verifying attachment thereof |
| 09/28/2004 | US6798229 Wide-bandwidth coaxial probe |
| 09/28/2004 | US6798228 Test socket for packaged semiconductor devices |
| 09/28/2004 | US6798223 Test methods, systems, and probes for high-frequency wireless-communications devices |
| 09/28/2004 | US6798189 Current detection resistor, mounting structure thereof and method of measuring effective inductance |
| 09/28/2004 | US6796850 Press fitting type spring connector |
| 09/23/2004 | WO2004081980A2 Probe card assembly |
| 09/23/2004 | US20040185694 Contact for spiral contactor and spiral contactor |
| 09/23/2004 | US20040185585 Method of testing semiconductor device |
| 09/23/2004 | US20040184508 Test handler temperature monitoring system |
| 09/23/2004 | US20040183561 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 09/23/2004 | US20040183558 Variable latch |
| 09/23/2004 | US20040183557 Air socket for testing integrated circuits |
| 09/23/2004 | US20040183556 Fabrication method of semiconductor integrated circuit device |
| 09/23/2004 | US20040183555 Method for testing high power SMD type IC with method for making manual and automation test base |
| 09/23/2004 | US20040183546 Signal detection contactor and signal correcting system |
| 09/23/2004 | US20040183525 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober |
| 09/23/2004 | US20040183524 Method and apparatus for implementing printed circuit board high potential testing to identify latent defects |
| 09/23/2004 | US20040183523 Hand mounted testing meter |
| 09/23/2004 | US20040183520 Device for measuring an electric current |
| 09/23/2004 | US20040182170 Test lead connector with strain relief |
| 09/22/2004 | EP1460434A1 Contact probe |
| 09/22/2004 | EP1459168A1 Programmable delay indexed data path register file for array processing |
| 09/22/2004 | EP1459079A2 Probe card covering system and method |
| 09/22/2004 | EP1459078A2 Microprocessor-based probe for integrated circuit testing |
| 09/22/2004 | EP1297346B1 Device for measuring an electric current that flows through a strip conductor |
| 09/22/2004 | CN1530981A Apparatus and method for detecting electronic element |
| 09/22/2004 | CN1168129C Carrier for testing chip |
| 09/21/2004 | US6794890 Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested |
| 09/21/2004 | US6794889 Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing |
| 09/21/2004 | US6794888 Probe device |
| 09/21/2004 | US6794737 Spring structure with stress-balancing layer |
| 09/16/2004 | WO2004079380A1 Apparatus and mthod for cooling optically probed integrated circ uits |
| 09/16/2004 | US20040181486 Probe card designed by automated system |
| 09/16/2004 | US20040180561 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040179343 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040178814 Semiconductor tester coupling arrangement and electrical testing method thereof |
| 09/16/2004 | US20040178813 Apparatus and method for testing electronic component |
| 09/16/2004 | US20040178812 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040178787 Integrated circuit testing device and a method of use therefor |
| 09/16/2004 | US20040177996 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040177995 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040177985 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040177499 Tested semiconductor device produced by an interconnection element with contact blade |
| 09/16/2004 | DE10308916A1 Appliance for electric contacting substrate, containing integrated circuit with exposed contacts and contacting assembly with counter contacts on contacting plate in spacing corresponding to circuit contacts |
| 09/15/2004 | EP1457783A1 Probe device |
| 09/15/2004 | EP1456676A2 System for the remote data acquisition and control of electric energy meters |
| 09/15/2004 | CN2641661Y Positive/negative coused miniature prober cylinder |
| 09/15/2004 | CN1529818A Conductive contact |
| 09/15/2004 | CN1529817A Socket for semiconductor package |
| 09/15/2004 | CN1529352A Probe card for testing wafer having plurality of semiconductor devices and its manufacturing method |
| 09/15/2004 | CN1529181A Composite tool for electronic and testing industry |
| 09/15/2004 | CN1166957C Probe for testing semiconductor device and its manufacture method and probe device used thereof |
| 09/15/2004 | CN1166956C Semiconductor device testing apparatus |
| 09/14/2004 | US6792376 Apparatus and method for testing socket |
| 09/14/2004 | US6791347 Probe apparatus applicable to a wafer level burn-in screening |
| 09/14/2004 | US6791345 Contactor for testing semiconductor device and manufacturing method thereof |
| 09/14/2004 | US6791317 Load board for testing of RF chips |
| 09/14/2004 | US6791185 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 09/14/2004 | US6791176 Lithographic contact elements |
| 09/14/2004 | US6791171 Systems for testing and packaging integrated circuits |
| 09/14/2004 | US6791110 Semiconductor-package measuring method, measuring socket, and semiconductor package |
| 09/14/2004 | US6790065 Socket for electric part |
| 09/10/2004 | WO2004077904A1 Circuit board checker and circuit board checking method |
| 09/10/2004 | WO2003055031A9 System for the remote data acquisition and control of electric energy meters |
| 09/09/2004 | US20040175979 Contactor |
| 09/09/2004 | US20040175851 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting |
| 09/09/2004 | US20040174309 Signal leakage detector |
| 09/09/2004 | US20040174178 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 09/09/2004 | US20040174177 Inspection method and inspection apparatus |
| 09/09/2004 | US20040174176 Semiconductor interconnect having semiconductor spring contacts, test systems incorporating the interconnect and test methods using the interconnect |
| 09/09/2004 | US20040174175 Apparatus and method for terminating probe apparatus of semiconductor wafer |
| 09/09/2004 | DE19748825B4 Prüfkopf mit einer Kontaktiervorrichtung Probe with a contactor |
| 09/09/2004 | DE10350859A1 Sondenbasierten Informationsspeicher für Sonden, die zur Leerlauferfassung bei einem schaltungsinternen Testen verwendet werden Probe-based information storage for probes, which are used for detection in an idle-circuit testing |
| 09/09/2004 | DE10108743B4 Nadelkarte zum Testen einer integrierten Schaltung und Verwendung der Nadelkarte A needle card for testing an integrated circuit, and using the probe card |
| 09/08/2004 | EP1455388A1 Reliability evaluation tester, reliability evaluation test system, contactor, and reliability evaluation test method |
| 09/08/2004 | EP1455387A1 Probe device |
| 09/08/2004 | EP1454153A2 Flexible interface for a test head |
| 09/08/2004 | EP0834243B1 Photolithographically patterned spring contact |
| 09/08/2004 | CN1528034A 接触器 Contactors |
| 09/08/2004 | CN1528032A Self-aligning socket connector |
| 09/08/2004 | CN1527945A Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 09/08/2004 | CN1527793A Method for forming microelectronic spring structures on a substrate |
| 09/08/2004 | CN1165772C Sensor for detecting high-frequency oscillations of voltage and arrangement of sensor |
| 09/07/2004 | US6788092 Test assembly for integrated circuit package |
| 09/07/2004 | US6788090 Method and apparatus for inspecting semiconductor device |
| 09/07/2004 | US6788085 Self-aligning wafer burn-in probe |
| 09/07/2004 | US6788082 Probe card |
| 09/07/2004 | US6788080 Test probe assembly for circuits, circuit element arrays, and associated methods |
| 09/07/2004 | US6788067 Device for and method of detecting residual current with resistive shunts |
| 09/07/2004 | US6787935 Battery sensor device |
| 09/07/2004 | US6787800 Test vehicle with zig-zag structures |
| 09/07/2004 | US6786319 Belt conveyer with power conduction for electrical test |
| 09/05/2004 | CA2459314A1 Signal leakage detector |
| 09/02/2004 | WO2004075354A1 An interconnecting apparatus and a contact element therefor |
| 09/02/2004 | WO2004075283A1 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 09/02/2004 | WO2004075270A1 Probe pin zero-point detecting method and probe device |
| 09/02/2004 | WO2004074858A1 Chip-mounting tape inspecting method and probe unit used for inspection |
| 09/02/2004 | US20040171268 Feed-through manufacturing method and feed-through |
| 09/02/2004 | US20040169521 High density probe card apparatus and method of manufacture |