| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 10/27/2004 | EP1471358A2 Coaxial probe interface |
| 10/27/2004 | EP1471357A2 Ic socket |
| 10/27/2004 | EP1470431A2 Apparatus and method for dynamic diagnostic testing of integrated circuits |
| 10/27/2004 | EP1075655A4 Electronic battery tester |
| 10/27/2004 | CN1173189C Device for testing electric passing through for electric wire connector |
| 10/27/2004 | CN1173185C Gauge head device |
| 10/26/2004 | US6809539 Probe card for testing an integrated circuit |
| 10/26/2004 | US6809536 Apparatus for measuring properties of probe card and probing method |
| 10/26/2004 | US6809535 Notched electrical test probe tip |
| 10/26/2004 | US6809534 Semiconductor device test method and semiconductor device tester |
| 10/26/2004 | US6809511 Device power supply and IC test apparatus |
| 10/26/2004 | US6809509 Electrical monitoring system |
| 10/26/2004 | US6808841 Battery terminal unit provided with a current sensor |
| 10/26/2004 | US6807734 Microelectronic contact structures, and methods of making same |
| 10/21/2004 | WO2004090560A2 Automatic test machine for testing printed circuit boards |
| 10/21/2004 | US20040209491 Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested |
| 10/21/2004 | US20040207425 Inspection apparatus and probe card |
| 10/21/2004 | US20040207424 High resolution analytical probe station |
| 10/21/2004 | US20040207423 Electrical inspection apparatus |
| 10/21/2004 | US20040207421 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 10/21/2004 | US20040207419 Inspecting device and probe card |
| 10/21/2004 | US20040207417 Electronic probe with positionable tip |
| 10/21/2004 | US20040207416 Wafer-mounted micro-probing platform |
| 10/21/2004 | US20040206903 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 10/21/2004 | DE10354020A1 Verfahren zum Testen einer Halbleitervorrichtung A method for testing a semiconductor device |
| 10/21/2004 | DE10314462A1 Electric circuit boards fabrication test arrangement, includes actuator for releasing link between main- and secondary-guide slides as reaction to control signal |
| 10/21/2004 | DE10314192A1 Sockel insbesondere für Handler sowie Bestückungsverfahren hierzu Socket particular handler and assembly method thereof |
| 10/20/2004 | EP1468776A2 Microelectronics spring contact elements |
| 10/20/2004 | EP1468048A1 Apparatus and method for cleaning test probes |
| 10/20/2004 | EP0860101B1 Method for producing contact pads on adapter boards and adapter board for testing pattern boards |
| 10/20/2004 | EP0748450B2 Printed circuit board test set with test adapter and method for setting the latter |
| 10/20/2004 | CN1538515A Method for manufacturng semiconductor device |
| 10/20/2004 | CN1538513A Method and system for improving testability and reducing test time for packaged integrated circuits |
| 10/19/2004 | US6806763 Programmable reference voltage generating circuit |
| 10/19/2004 | US6806724 Probe for combined signals |
| 10/19/2004 | US6806723 Contactor having contact electrodes formed by laser processing |
| 10/19/2004 | US6806697 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe |
| 10/19/2004 | US6806493 Spring element for use in an apparatus for attaching to a semiconductor and a method of attaching |
| 10/19/2004 | US6805563 Socket for electrical parts |
| 10/14/2004 | WO2004088795A1 Anisotropic electrically conductive film and method of producing the same |
| 10/14/2004 | WO2004044949A3 Probe station with low noise characteristics |
| 10/14/2004 | US20040203262 Helical microelectronic contact and method for fabricating same |
| 10/14/2004 | US20040201394 Method and system for improving testability and reducing test time for packaged integrated circuits |
| 10/14/2004 | US20040201392 Alignment features in a probing device |
| 10/14/2004 | US20040201390 Test interconnect for bumped semiconductor components and method of fabrication |
| 10/14/2004 | US20040201389 Needle assembly of probe card |
| 10/14/2004 | US20040201388 Support for an electronic probe and related methods |
| 10/14/2004 | US20040201016 Interconnect structure |
| 10/14/2004 | US20040200633 Compliant electrical contact assembly |
| 10/14/2004 | US20040200515 Probe pin cleaning device |
| 10/14/2004 | DE10297410T5 Rollenkontakt mit leitenden Bürsten Roller contact with conductive brush |
| 10/13/2004 | EP1466265A2 Programmable array for efficient computation of convolutions in digital signal processing |
| 10/13/2004 | EP1466182A1 Electrical feedback detection system for multi-point probes |
| 10/13/2004 | EP1466181A1 Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe |
| 10/13/2004 | EP1016104B1 Transformer system provided with a decoupling system |
| 10/13/2004 | CN2648627Y Crimp conductive terminal |
| 10/13/2004 | CN1537233A 导电性触头 Conductive contacts |
| 10/13/2004 | CN1537232A Programmable test socket |
| 10/13/2004 | CN1536635A Detection card for testing semiconductor |
| 10/13/2004 | CN1535765A 探针洗净装置 Probe cleaning device |
| 10/13/2004 | CN1171093C Ic测试装置 Ic test device |
| 10/12/2004 | US6803779 Interconnect assembly for use in evaluating probing networks |
| 10/12/2004 | US6803778 Probe for a wire inserting detection jig |
| 10/12/2004 | US6803756 Wafer probe station |
| 10/12/2004 | US6802731 Contact pin and socket for electrical parts |
| 10/07/2004 | WO2004086565A1 Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method |
| 10/07/2004 | WO2004086063A1 An apparatus for measuring an a.c. current in a cable |
| 10/07/2004 | WO2004086062A1 Connecteur de mesure de resistances electriques, dispositif de connecteur de mesure de resistances electriques et leur procede de fabrication, dispositif de mesure de la resistance electrique de circuits substrats, et methode de mesure |
| 10/07/2004 | WO2004086061A1 Base, especially for handlers, and insertion method therefor |
| 10/07/2004 | US20040198081 Microelectronic spring contact elements |
| 10/07/2004 | US20040196061 Socket or adapter device for semiconductor devices, method for testing semiconductor devices, and system comprising at least one socket or adapter device |
| 10/07/2004 | US20040196059 Variable inductance test socket and method of manufacturing using such a test socket |
| 10/07/2004 | US20040196058 Method for fabricating a probe pin for testing electrical characteristics of an apparatus |
| 10/07/2004 | US20040196057 Socket or adapter device for semiconductor devices, method for testing semiconductor devices, and system comprising at least one socket or adapter device |
| 10/07/2004 | US20040196056 System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
| 10/07/2004 | US20040196021 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe |
| 10/07/2004 | US20040195665 Apparatus and method for testing semiconductor devices |
| 10/07/2004 | US20040195584 Test insert with electrostatic discharge structures and associated methods |
| 10/07/2004 | US20040194299 Method of manufacturing a probe card |
| 10/07/2004 | DE202004010045U1 Fastening and contacting device for an electronic electricity meter, has an adapter plate that permits its mounting in a parked position, in which no power is drawn from the network, prior to its setting to an operating state |
| 10/07/2004 | DE10052998B4 Aufnahmeplattform für eine Stromzählereinheit Receiving platform for a current counter unit |
| 10/06/2004 | CN1534754A Temperature monitoring system of testing classifying machine |
| 10/06/2004 | CN1170311C Manufacturing method of semiconductor device and packaging equipment therefor |
| 10/05/2004 | US6801047 Wafer probe station having environment control enclosure |
| 10/05/2004 | US6801031 Method and apparatus for current measurement for electronically-controlled pump |
| 10/05/2004 | US6799976 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 09/30/2004 | WO2004084296A1 Probe positioning and bonding device and probe bonding method |
| 09/30/2004 | WO2004084295A1 Probe and method of making same |
| 09/30/2004 | WO2004083877A1 Fault tracking apparatus |
| 09/30/2004 | WO2004083873A2 Adjusting device for the planarization of probe sets of a probe card |
| 09/30/2004 | WO2004083836A1 System and method of planar positioning |
| 09/30/2004 | WO2004083783A2 Hand mounted testing meter |
| 09/30/2004 | US20040193989 Test system including a test circuit board including through-hole vias and blind vias |
| 09/30/2004 | US20040189334 Flexible multi-layered probe |
| 09/30/2004 | US20040189333 Carrier for receiving and electrically contacting individually separated dies |
| 09/30/2004 | US20040189332 Automatically adjustable wafer probe card |
| 09/30/2004 | US20040189276 Systems and methods for making a high-bandwidth coaxial cable connection |
| 09/29/2004 | EP1463276A1 Electronic test & diagnostic apparatus |
| 09/29/2004 | EP1461628A1 Cooling assembly with direct cooling of active electronic components |
| 09/29/2004 | CN1532909A Dtecting method for semiconductor element |