G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
11/2004
11/17/2004	EP1476761A1 Contact actuator with contact force control
11/17/2004	EP0775318B1 Capacitive open-circuit test employing an improved threshold determination
11/17/2004	CN2657220Y 改良的探针构造 Improved probe structure
11/17/2004	CN2657164Y Straps type calibrator
11/17/2004	CN1547669A Method of manufacturing a probe card
11/16/2004	US6819181 Method and structure for integrated circuit interference isolation enhancement
11/16/2004	US6819132 Method to prevent damage to probe card
11/16/2004	US6819131 Passive, grease-free cooled device fixtures
11/16/2004	US6819128 Latch locking mechanism of a KGD carrier
11/16/2004	US6819127 Method for testing semiconductor components using interposer
11/16/2004	US6818986 Semiconductor device and method of inspecting the same
11/16/2004	US6818840 Method for manufacturing raised electrical contact pattern of controlled geometry
11/11/2004	WO2004097435A1 Examining instrument for liquid crystal panel
11/11/2004	US20040224148 Anisotropically conductive sheet
11/11/2004	US20040223309 Enhanced compliant probe card systems having improved planarity
11/11/2004	US20040222809 System for probing, testing, burn-in, repairing and programming of integrated circuits
11/11/2004	US20040222808 System and method of measuring probe float
11/11/2004	US20040222806 Semiconductor device test method and semiconductor device tester
11/11/2004	US20040222784 Fixture for test cards of testing machine
11/11/2004	US20040222778 Method for the precise measurement of dependency on amplitude and phase of a plurality of high frequency signals and a device for carrying out said method
11/11/2004	US20040222211 Carbon-containing aluminum nitride sintered body, and ceramic substrate for a semiconductor producing/examining device
11/11/2004	DE29924677U1 Multi-function tool has a handle with a forward assembly in which sensors or tools can be fitted including sensors for measurement and testing purposes to reduce the amount of instruments needing to be carried
11/11/2004	DE10318725A1 Controller, especially for motor vehicle, has shunt for current measurement inserted in circuit board for current measurement with 2 fixing legs joined by contact leg, and solid press-in pins at free ends
11/10/2004	EP1475641A2 Method and device for precise measurement of dependency on amplitude and phase of plurality of high frequency signals
11/10/2004	EP1474695A1 Method and apparatus for testing electronic devices
11/10/2004	CN1545627A Magnetic resonance apparatus with excitation antennae system
11/10/2004	CN1545625A Insert and electronic component handling apparatus having the same
11/10/2004	CN1545139A 晶片探测器 Wafer probe
11/10/2004	CN1175483C Wafer detector and ceramic substrate used for wafer detector
11/10/2004	CN1175276C Testing and ageing apparatus, cascade system using the apparatus and method of testing
11/10/2004	CN1175274C Tester and holder for tester
11/10/2004	CN1175271C Device for and method of inspecting liquid crystal display panel and method of mfg. liquid crystal display panel
11/10/2004	CN1175270C Machine for electric test of printed circuits with adjustable position of sound needles
11/10/2004	CN1174836C Membrane probing system
11/09/2004	US6815966 System for burn-in testing of electronic devices
11/09/2004	US6815963 Probe for testing a device under test
11/09/2004	US6815962 Connection/inspection device for semiconductor elements
11/09/2004	US6815961 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies
11/09/2004	US6815960 Electron beam test system and electron beam test method
11/09/2004	US6815959 Systems and methods for measuring properties of conductive layers
11/09/2004	US6814609 Electrical signal read-out method and device therefor
11/09/2004	US6814602 Test connector with leaf springs
11/09/2004	US6813804 Apparatus and method for cleaning probe card contacts
11/09/2004	CA2137369C Capacitive probe type circuit board with shielded connector
11/04/2004	WO2004095646A1 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument
11/04/2004	WO2004095039A1 Insert for electronic component-handling device, tray, and electronic component handling device
11/04/2004	WO2004095038A1 Insert and tray respectively for electronic component handling device and electronic component handling device
11/04/2004	WO2004053944A3 Fast localization of electrical failures on an integrated circuit system and method
11/04/2004	WO2004048982A3 Probe array and method of its manufacture
11/04/2004	US20040221199 Systems and methods for probing processor signals
11/04/2004	US20040217772 System for testing semiconductor die on multiple semiconductor wafers
11/04/2004	US20040217771 Probe for integrated circuit test socket
11/04/2004	US20040217770 Planarizing and testing of BGA packages
11/04/2004	US20040217769 Device probing using a matching device
11/04/2004	US20040217768 Prefabricated and attached interconnect structure
11/04/2004	US20040217767 Wafer probing that conditions devices for flip-chip bonding
11/04/2004	US20040217764 Electronic component characteristic measuring device
11/04/2004	US20040217530 Indexing rotatable chuck for a probe station
11/04/2004	US20040217350 Probe unit and its manufacturing method
11/04/2004	US20040217342 Anisotropically conductive connector, production process thereof and application product thereof
11/04/2004	US20040216239 Combination hand tool and electrical testing device
11/04/2004	DE202004013305U1 Kalibrierstandard Calibration
11/04/2004	DE19949573B4 Träger, System und Verfahren zur Verwendung beim Testen und/oder Installieren von Software auf einer Personalcomputer-Systemeinheit Support system and method for use in testing and / or installing software on a personal computer system unit
11/03/2004	EP1256004B1 Voltage sensor
11/03/2004	EP0781419B1 Method and device for making connection
11/03/2004	CN1542507A Liquid crystal display assembly
11/03/2004	CN1542505A Display assembly and assembling method thereof
11/03/2004	CN1542455A Probe unit and its manufacturing method
11/03/2004	CN1174257C Method and device for detecting circuit board
11/03/2004	CN1174251C Method for making cards with multiple contact tips and cards obtained thereby
11/02/2004	US6812723 Probe pin for a probe card
11/02/2004	US6812719 Electronic probe with a tip that is securable to an electronic device
11/02/2004	US6812692 Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same
11/02/2004	US6812685 Auto-selecting, auto-ranging contact/noncontact voltage and continuity tester
11/02/2004	US6811668 Apparatus for the operation of a microfluidic device
11/02/2004	US6811420 Contact pin and socket for electrical parts
11/02/2004	US6811407 Socket for electrical parts
11/02/2004	US6811406 Microelectronic spring with additional protruding member
10/2004
10/28/2004	WO2004093254A1 Anisotropic conductive connector and circuit-device electrical-inspection device
10/28/2004	WO2004093252A2 Electrical connector and method for making
10/28/2004	WO2004093189A1 Helical microelectronic contact and method for fabricating same
10/28/2004	WO2004092750A1 Alignment features in a probing device
10/28/2004	WO2004092749A1 Inspection probe
10/28/2004	WO2004092748A1 Probe
10/28/2004	WO2004092435A1 Metal structure and method for production thereof
10/28/2004	WO2004092090A2 Temperature compensated vertical pin probing device
10/28/2004	US20040214455 Socket for electrical parts
10/28/2004	US20040214409 Method and apparatus for manufacturing known good semiconductor die
10/28/2004	US20040212391 Method for universal wafer carrier for wafer level die burn-in
10/28/2004	US20040212389 Method and apparatus for processing semiconductor devices in a singulated form
10/28/2004	US20040212386 Method of testing FPC bonding yield and FPC having testing pads thereon
10/28/2004	US20040212383 IC socket
10/28/2004	US20040212382 Test socket for semiconductor components having serviceable nest
10/28/2004	US20040212381 Inspection coaxial probe and inspection unit incorporating the same
10/28/2004	US20040212379 Probe module and a testing apparatus
10/28/2004	US20040212092 Methods of fabricating semiconductor substrate-based BGA interconnections
10/28/2004	US20040211589 High conducting thin-film nanoprobe card and its fabrication method
10/28/2004	US20040211061 Method of forming socket contacts
10/28/2004	DE19541287B9 Mit Schaltstift versehener Federkontaktstift Provided with switching pin spring pin
10/28/2004	DE10348027A1 Testsonde mit variabler Impedanz Test probe with variable impedance

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