G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
12/2004
12/15/2004	CN1180263C Probe adapter for spherical grid array component
12/14/2004	US6831472 Method of forming an electrical contact
12/14/2004	US6831455 Mechanism for fixing probe card
12/14/2004	US6831452 Systems and methods for wideband single-end probing of variabily spaced probe points
12/14/2004	US6830460 Controlled compliance fine pitch interconnect
12/09/2004	WO2004107401A2 Probe for testing a device under test
12/09/2004	WO2004106949A1 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method
12/09/2004	WO2004106948A1 Multiple connection device for electronic micro-circuit test systems
12/09/2004	WO2004081980A3 Probe card assembly
12/09/2004	US20040248448 Small contactor pin
12/09/2004	US20040248435 Socket for semiconductor device
12/09/2004	US20040246018 TFT array inspection device
12/09/2004	US20040246014 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
12/09/2004	US20040246010 Probe tip in single-sided compliant probe apparatus
12/09/2004	US20040245628 Tape package having test pad on reverse surface and method for testing the same
12/09/2004	US20040244192 Method for packaging an image sensor
12/09/2004	DE10346662B3 Arrangement for measuring vehicle electrical system parameters, has contact element on carrying body; contact can be made to energy storage device pole with carrying body above positioning element
12/09/2004	DE10296750T5 Faser-optische Wafer-Sonde Fiber-optic wafer probe
12/08/2004	EP1483594A2 Contactor assembly for testing ceramic surface mount devices and other electronic components
12/08/2004	CN2662252Y Currentconducting head for circuit board test plate test line
12/08/2004	CN1553197A Electric power optical voltage sensor signal reconfiguration and outputting module
12/07/2004	US6829547 Measurement test instrument and associated voltage management system for accessory device
12/07/2004	US6828812 Test apparatus for testing semiconductor dice including substrate with penetration limiting contacts for making electrical connections
12/07/2004	US6828810 Semiconductor device testing apparatus and method for manufacturing the same
12/07/2004	US6828790 Magnetic resonance apparatus with excitation antennae system
12/07/2004	US6828777 Fixture for test cards of testing machine
12/07/2004	US6828773 Adapter method and apparatus for interfacing a tester with a device under test
12/07/2004	US6828769 Cartridge system for a probing head for an electrical test probe
12/07/2004	US6828768 Systems and methods for wideband differential probing of variably spaced probe points
12/07/2004	US6828767 Hand-held voltage detection probe
12/02/2004	WO2004083873A3 Adjusting device for the planarization of probe sets of a probe card
12/02/2004	US20040240724 Tester and testing method
12/02/2004	US20040239921 Probe needle for testing semiconductor chips and method for producing said probe needle
12/02/2004	US20040239570 Low cost electronic probe devices manufactured from conductive loaded resin-based materials
12/02/2004	US20040239357 Contactor for electronic components and test method using the same
12/02/2004	US20040239356 Conductive contact
12/02/2004	US20040239355 Conductive contact
12/02/2004	US20040239352 Probe card used for inspecting semiconductor devices
12/02/2004	US20040239351 Probe head, its assembly method and probe card
12/02/2004	US20040239348 Tip and tip assembly for a signal probe
12/02/2004	US20040239334 Coaxial radio frequency adapter and method
12/02/2004	US20040239309 Remotely controllable oscilloscope
12/02/2004	US20040239308 Multimeter having off-device display device and selection device
12/02/2004	DE10320925A1 Verfahren zum Testen von unbestückten Leiterplatten A method for testing of bare printed circuit boards
12/01/2004	EP1482595A2 Connector apparatus
12/01/2004	EP1482593A1 Anisotropic conductive connector and its production method, and circuit device test instrument
12/01/2004	EP1482314A1 Microelectronic spring contact element
12/01/2004	EP1482313A1 Capacity load type probe, and test jig using the same
12/01/2004	CN2660540Y Conducting structure of probe assembly and wire in electronic and detecting implement
12/01/2004	CN1550785A Probe device and its manufacturing method
12/01/2004	CN1178271C A method and apparatus for transport and tracking of electronic component
12/01/2004	CN1178066C Aging test socket
12/01/2004	CN1178065C Aging test socket
11/2004
11/30/2004	US6825685 Method and system for wafer level testing and burning-in semiconductor components
11/30/2004	US6825678 Wafer level interposer
11/30/2004	US6825649 Non-contact voltage measurement method and device, and detection probe
11/30/2004	US6825558 Carrier module for μ-BGA type device
11/30/2004	US6825422 Interconnection element with contact blade
11/30/2004	US6825052 Test assembly including a test die for testing a semiconductor product die
11/30/2004	US6824395 Semiconductor device-socket
11/25/2004	WO2004102208A1 Sheet-like probe, process for producing the same and its application
11/25/2004	WO2004102207A1 Probe for testing electric conduction
11/25/2004	US20040235207 Connection device and test system
11/25/2004	US20040232938 Method and apparatus for testing semiconductor devices using the back side of a circuit board
11/25/2004	US20040232934 Shielded integrated circuit probe
11/25/2004	US20040232929 Multi point contactor and blade construction
11/25/2004	US20040232927 Probe for testing a device under test
11/25/2004	US20040232926 Electrical signal taking-out device
11/25/2004	US20040232925 Integrated circuit probe card
11/25/2004	US20040231887 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
11/24/2004	CN2658966Y Component for preventnig fracture of wire of outlet
11/24/2004	CN2658755Y Compound testing apparatus
11/24/2004	CN1549279A Method for producing high conducting electric nano-thin film type probe card
11/24/2004	CN1177227C Conductive contact
11/24/2004	CN1177226C Changeable-probe holder and measuring probe
11/24/2004	CN1177225C Short-circuit rod for electrode figure test of panel
11/23/2004	US6823273 Methods and apparatus for secure programming of an electricity meter
11/23/2004	US6822469 Method for testing multiple semiconductor wafers
11/23/2004	US6822468 Method and apparatus for implementing printed circuit board high potential testing to identify latent defects
11/23/2004	US6822467 Low-current pogo probe card
11/23/2004	US6822466 Alignment/retention device for connector-less probe
11/23/2004	US6822463 Active differential test probe with a transmission line input structure
11/23/2004	US6822438 Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer
11/23/2004	US6822436 Universal test interface between a device under test and a test head
11/23/2004	US6821131 IC socket for a fine pitch IC package
11/23/2004	US6820794 Solderless test interface for a semiconductor device package
11/18/2004	WO2004100218A2 Prefabricated and attached interconnect structure
11/18/2004	WO2004099803A1 Circuit board test device comprising contact needles which are driven in a diagonally protruding manner
11/18/2004	WO2004099802A1 Method for testing empty printed circuit boards
11/18/2004	WO2004099793A2 Device probing using a matching device
11/18/2004	WO2004099792A2 Planarizing and testing of bga packages
11/18/2004	WO2004099630A2 Combination hand tool and electrical testing device
11/18/2004	WO2004059330A3 Microelectronic contact structure
11/18/2004	US20040227537 Low-current probe card
11/18/2004	US20040227536 Prober and probe testing method for temperature-controlling object to be tested
11/18/2004	US20040227531 Semiconductor device test method and semiconductor device tester
11/18/2004	US20040227505 Wafer probe station
11/18/2004	US20040227504 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
11/18/2004	DE19833500B4 Testkopf-Positioniereinrichtung für ein Halbleiterbauelement-Testgerät Test head positioning device for a semiconductor component tester
11/18/2004	DE102004014185A1 Probenstift-Reinigungsvorrichtung Samples pen-cleaning device

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