| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/06/2005 | US20050001643 Contact probe and probe device |
| 01/06/2005 | US20050001642 Contact probe and probe device |
| 01/06/2005 | US20050001641 Contact probe and probe device |
| 01/06/2005 | US20050001639 Test probe for finger tester and corresponding finger tester |
| 01/06/2005 | US20050001638 Closed-grid bus architecture for wafer interconnect structure |
| 01/06/2005 | US20050001637 Support member assembly for conductive contactor |
| 01/06/2005 | US20050001611 Applying parametric test patterns for high pin count asics on low pin count testers |
| 01/05/2005 | EP1493209A1 Shielded cable terminal with contact pins mounted to printed circuit board |
| 01/05/2005 | DE10324450A1 Kontaktierungsvorrichtung für elektronische Schaltungseinheiten und Herstellungsverfahren A contacting device for electronic circuit units, and manufacturing processes |
| 01/05/2005 | DE10297654T5 Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente Holding insert and handling device with such a retaining insert for electronic components |
| 01/05/2005 | CN1561656A Method for mounting an electronic component |
| 01/05/2005 | CN1560642A Coating technique on surface of testing covering plate and is manufacturing method |
| 01/05/2005 | CN1560637A Probe connecting structure for detecting tool of printed circuit board |
| 01/04/2005 | US6839646 Electron beam test system and electron beam test method |
| 01/04/2005 | US6838898 Apparatus and method for testing high current circuit assemblies |
| 01/04/2005 | US6838896 Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 01/04/2005 | US6838895 High resolution analytical probe station |
| 01/04/2005 | US6838893 Probe card assembly |
| 01/04/2005 | US6838890 Membrane probing system |
| 12/30/2004 | US20040267109 Housing for a thin active probe |
| 12/30/2004 | US20040266272 Contactor for testing semiconductor device and manufacturing method thereof |
| 12/30/2004 | US20040266089 Methods for planarizing a semiconductor contactor |
| 12/30/2004 | US20040266036 Apparatus for deforming resilient contact structures on semiconductor components |
| 12/30/2004 | US20040263304 High power space transformer |
| 12/30/2004 | US20040263197 Method for in-line testing of flip-chip semiconductor assemblies |
| 12/30/2004 | US20040263196 Method for in-line testing of flip-chip semiconductor assemblies |
| 12/30/2004 | US20040263195 Method for in-line testing of flip-chip semiconductor assemblies |
| 12/30/2004 | US20040263194 Inspecting apparatus for semiconductor device |
| 12/30/2004 | US20040263193 Inspecting apparatus for semiconductor device |
| 12/30/2004 | US20040263189 Probe of under side of component through opening in a printed circuit board |
| 12/30/2004 | US20040263188 Multiple two axis floating probe block assembly using split probe block |
| 12/30/2004 | US20040263150 Resistor arrangement, manufacturing method, and measurement circuit |
| 12/30/2004 | US20040262603 Apparatus for preventing cross talk and interference in semiconductor devices during test |
| 12/30/2004 | US20040262030 Conductive printed board, multicore cable and ultrasonic probe using the same |
| 12/29/2004 | WO2004114392A1 Method and equipment for inspecting electric characteristics of specimen |
| 12/29/2004 | WO2004113935A2 Test fixture for impedance measurements |
| 12/29/2004 | WO2004113933A2 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 12/29/2004 | WO2004017695B1 Shock absorber means for components and cards |
| 12/29/2004 | EP1492130A2 Resistor arrangement, process for production and measuring circuit |
| 12/29/2004 | CN1559008A Coaxial tilt pin fixture for testing high frequency circuit board |
| 12/29/2004 | CN1558243A Manufacturing method for probe sleeve and needle tube |
| 12/29/2004 | CN1558242A Low impedance probe structure and purpose |
| 12/29/2004 | CN1558241A Adapter structure for testing patch integrated circuit |
| 12/28/2004 | US6836138 Module having test architecture for facilitating the testing of ball grid array packages, and test method using the same |
| 12/28/2004 | US6836135 Optical testing device |
| 12/28/2004 | US6836131 Spray cooling and transparent cooling plate thermal management system |
| 12/28/2004 | US6836130 Method and apparatus for wafer scale testing |
| 12/28/2004 | US6836129 Air interface apparatus for use in high-frequency probe device |
| 12/28/2004 | US6836110 Universal tester to handler docking plate |
| 12/28/2004 | US6836003 Integrated circuit package alignment feature |
| 12/28/2004 | US6835898 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| 12/28/2004 | US6835577 Method for making a block for testing components |
| 12/23/2004 | WO2004112195A1 Anisotropc conductive connector device and production method therefor and circuit device inspection device |
| 12/23/2004 | WO2004001807A3 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/23/2004 | US20040259406 Connecting unit including contactor having superior electrical conductivity and resilience, and method for producing the same |
| 12/23/2004 | US20040257103 Module having test architecture for facilitating the testing of ball grid array packages, and test method using the same |
| 12/23/2004 | US20040257101 Probe area setting method and probe device |
| 12/23/2004 | US20040257100 Non-abrasive electrical test contact |
| 12/23/2004 | US20040257099 Conductive coil contact member |
| 12/23/2004 | US20040257098 Probe card |
| 12/23/2004 | US20040257097 Vacuum-actuated test fixture for testing printed circuit boards |
| 12/23/2004 | US20040257096 Back side probing method and assembly |
| 12/23/2004 | US20040257084 Cable for electronic battery tester |
| 12/23/2004 | US20040257063 System and method for measuring the power consumed by a circuit on a printed circuit board |
| 12/22/2004 | EP1489695A1 Anisotropic conductive film and method for producing the same |
| 12/22/2004 | EP1489428A2 Flexible membrane probe and method of use thereof |
| 12/22/2004 | EP1488245A1 Apparatus for interfacing electronic packages and test equipment |
| 12/22/2004 | EP1488243A1 Modular housing for electrical instrument and mounting member therefor |
| 12/22/2004 | EP1147426B1 Clip-on ammeter for measuring a current circulating in conductors |
| 12/22/2004 | CN2666087Y Printed circuit board with contact surface used for connecting antenna |
| 12/22/2004 | CN2665976Y 电连接器 The electrical connector |
| 12/22/2004 | CN2665718Y Small-sized three-phase electric measuring instrument |
| 12/22/2004 | CN1556926A Tester and testing method |
| 12/22/2004 | CN1181528C Probe card for testing semiconductor chip with many semiconductor device and method thereof |
| 12/22/2004 | CN1181354C Inspection unit and method of manufacturing substrate |
| 12/21/2004 | US6834243 Apparatus and method for electrical testing of electrical circuits |
| 12/21/2004 | US6833727 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 12/21/2004 | US6833719 Apparatus for evaluating electrical characteristics |
| 12/21/2004 | US6833716 Electro-optical analysis of integrated circuits |
| 12/21/2004 | US6833695 Simultaneous display of data gathered using multiple data gathering mechanisms |
| 12/21/2004 | US6833636 Compact load bank for testing power systems |
| 12/19/2004 | CA2470986A1 Vacuum-actuated test fixture for testing printed circuit boards |
| 12/16/2004 | WO2004109720A1 High pressure resistance body element |
| 12/16/2004 | WO2004109308A1 Device interface unit |
| 12/16/2004 | WO2004109306A1 Method and apparatus for testing electrical characteristics of object under test |
| 12/16/2004 | WO2004109302A1 Anisotropic conductive connector and wafer inspection device |
| 12/16/2004 | WO2004109301A1 Connector |
| 12/16/2004 | WO2004083783A3 Hand mounted testing meter |
| 12/16/2004 | US20040252474 Integrated circuit stack with lead frames |
| 12/16/2004 | US20040251923 Flexible membrane probe and method of use thereof |
| 12/16/2004 | US20040251891 Suction cap for IC sockets and IC socket assembly using same |
| 12/16/2004 | DE10320381A1 Platinentestvorrichtung mit schrägstehend angetriebenen Kontaktiernadeln Board test device with obliquely driven contacting needles |
| 12/15/2004 | EP1486789A2 Contact probe |
| 12/15/2004 | EP1485700A2 Battery monitoring method and apparatus |
| 12/15/2004 | EP1092338B1 Assembly of an electronic component with spring packaging |
| 12/15/2004 | CN1555490A Method and system for designing a probe card |
| 12/15/2004 | CN1555489A Method and apparatus for retaining a spring probe |
| 12/15/2004 | CN1180527C Power supply source for photoelectricity type current transformer |
| 12/15/2004 | CN1180274C Grinding chip |
| 12/15/2004 | CN1180264C Test probe for device for testing printed circuit boards |