| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 02/01/2005 | US6850082 Probe holder for testing of a test device |
| 02/01/2005 | US6848928 Socket |
| 02/01/2005 | US6848139 Combination hand tool and electrical testing device |
| 01/31/2005 | CA2475195A1 Electronic component test apparatus |
| 01/27/2005 | WO2005008261A1 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts |
| 01/27/2005 | US20050017760 Current sense shunt resistor circuit |
| 01/27/2005 | US20050017742 Integrated circuit package testing device and method |
| 01/27/2005 | US20050017741 Wafer probe station having environment control enclosure |
| 01/27/2005 | US20050017739 Method and apparatus for processing semiconductor devices in a singulated form |
| 01/27/2005 | US20050017708 Apparatus and method for electromechanical testing and validation of probe cards |
| 01/27/2005 | US20050016251 Forming tool for forming a contoured microelectronic spring mold |
| 01/27/2005 | US20050015968 Magnetic detection apparatus and method of manufacturing the same |
| 01/27/2005 | US20050015967 Method for testing print circuit boards |
| 01/27/2005 | DE10297648T5 Prüfstation Inspection station |
| 01/26/2005 | CN2674458Y Adapter structure for testing integrated circuit |
| 01/26/2005 | CN1571928A Method of assembling and testing an electronics module |
| 01/26/2005 | CN1571133A Inverse needle regulating harness for liftable probe card and needle regulating method |
| 01/26/2005 | CN1570652A 可编程高频脉冲信号发生器 Programmable frequency pulse signal generator |
| 01/25/2005 | US6847224 Test probe |
| 01/25/2005 | US6847221 Probe pin assembly |
| 01/25/2005 | US6847220 Method for ball grid array chip packages having improved testing and stacking characteristics |
| 01/25/2005 | US6847219 Probe station with low noise characteristics |
| 01/25/2005 | US6847218 Probe card with an adapter layer for testing integrated circuits |
| 01/25/2005 | US6847203 Applying parametric test patterns for high pin count ASICs on low pin count testers |
| 01/25/2005 | US6847202 Apparatus for recognizing working position of device transfer system in semiconductor device test handler and method thereof |
| 01/25/2005 | US6847199 Capturing both digital and analog forms of a signal through the same probing path |
| 01/25/2005 | US6846735 Compliant test probe with jagged contact surface |
| 01/25/2005 | US6846193 Socket |
| 01/25/2005 | CA2283976C A medical consultation management system |
| 01/20/2005 | WO2005006784A2 Interface device for testing telecommunication circuits |
| 01/20/2005 | WO2005006003A1 Lsi test socket for bga |
| 01/20/2005 | WO2005005996A2 Apparatus and method for electromechanical testing and validation of probe cards |
| 01/20/2005 | WO2004090560A3 Automatic test machine for testing printed circuit boards |
| 01/20/2005 | US20050014399 Socket for electrical parts |
| 01/20/2005 | US20050014394 Contact-connection device for electronic circuit units and production method |
| 01/20/2005 | US20050014323 Methods for protecting intermediate conductive elements of semiconductor device assemblies |
| 01/20/2005 | US20050014301 Method and apparatus for processing semiconductor devices in a singulated form |
| 01/20/2005 | US20050012516 Burn-in socket adapt to assembly sensor thereon |
| 01/20/2005 | US20050012513 Probe card assembly |
| 01/20/2005 | US20050012221 Semiconductor interconnect having conductive spring contacts, method of fabrication, and test systems incorporating the interconnect |
| 01/20/2005 | US20050011764 Apparatus for the operation of a microfluidic device |
| 01/20/2005 | US20050011080 System and method of planar positioning |
| 01/20/2005 | US20050011027 Contact actuator with contact force control |
| 01/20/2005 | DE10328870A1 Widerstandsanordnung, Herstellungsverfahren und Messschaltung Resistor assembly, manufacturing processes and measuring circuit |
| 01/19/2005 | EP1498942A1 Signal detection contactor and signal correcting system |
| 01/19/2005 | EP1498738A1 Socket for electrical parts |
| 01/19/2005 | CN2672660Y Circuit for producing analogue damping vibration wave |
| 01/19/2005 | CN2672659Y Instrument and meter casing |
| 01/19/2005 | CN2672658Y Instrument and meter casing |
| 01/19/2005 | CN1567557A Test carrier plate |
| 01/19/2005 | CN1566973A Modularized elastic needle set arrangement |
| 01/19/2005 | CN1566963A Terminal block units |
| 01/19/2005 | CN1185499C Method and apparatus for searching conductor in conductor array with tight space |
| 01/19/2005 | CN1185498C Circuit board for testing semiconductor device |
| 01/18/2005 | US6845477 Semiconductor test device for conducting an operation test in parallel on many chips in a wafer test and semiconductor test method |
| 01/18/2005 | US6844825 Electric energy service apparatus with tamper detection |
| 01/18/2005 | US6844749 Integrated circuit test probe |
| 01/18/2005 | US6844748 Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| 01/18/2005 | US6844747 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting |
| 01/18/2005 | US6844738 Coaxial radio frequency adapter and method |
| 01/13/2005 | WO2005003793A1 Probe card and semiconductor testing device using probe sheet or probe card and semiconductor device producing method |
| 01/13/2005 | US20050009386 Compliant electrical probe device incorporating anisotropically conductive elastomer and flexible circuits |
| 01/13/2005 | US20050009218 Test method and test apparatus for semiconductor device |
| 01/13/2005 | US20050007581 Optical testing device |
| 01/13/2005 | US20050007142 Method for in-line testing of flip-chip semiconductor assemblies |
| 01/13/2005 | US20050007141 Method for in-line testing of flip-chip semiconductor assemblies |
| 01/13/2005 | US20050007138 High speed electromechanically driven test ahead |
| 01/13/2005 | US20050007137 System for burn-in testing of electronic devices |
| 01/13/2005 | US20050007134 Probe card |
| 01/13/2005 | US20050007132 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 01/13/2005 | US20050007131 Membrane probing system |
| 01/13/2005 | US20050007130 Contact probe and probe device |
| 01/13/2005 | US20050007128 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts |
| 01/13/2005 | US20050006583 Method of inspecting pattern and inspecting instrument |
| 01/12/2005 | EP1496368A1 Conductive contact |
| 01/12/2005 | EP1496367A1 Holder for conductive contact |
| 01/12/2005 | EP1496366A1 Holder for conductive contact |
| 01/12/2005 | EP1203202A4 Enhancing voltmeter functionality |
| 01/12/2005 | EP1113274B1 Conductive contact |
| 01/12/2005 | CN2670949Y Electricity meter with hidden probe container |
| 01/12/2005 | CN1565151A Socket and contact of semiconductor package |
| 01/12/2005 | CN1565054A Prober and probe testing method for temperature-controlling object to be tested |
| 01/12/2005 | CN1564949A Electronic component characteristic measuring device |
| 01/12/2005 | CN1564947A Socket and contact of semiconductor package |
| 01/12/2005 | CN1564458A Element structure utlizing photoshort circuit for generating sub-carrier lifetime guide electrical pulse |
| 01/12/2005 | CN1564001A Portable signal generating method and system based on USB mobile memory tech |
| 01/12/2005 | CN1564000A Digital signal source with waveform indication |
| 01/12/2005 | CN1184680C Method forp roducing semi-conductor device |
| 01/11/2005 | US6842030 Test systems for low-temperature environmental testing of semiconductor devices |
| 01/11/2005 | US6842029 Non-invasive electrical measurement of semiconductor wafers |
| 01/11/2005 | US6842024 Probe station having multiple enclosures |
| 01/11/2005 | US6842023 Probe card apparatus and electrical contact probe having curved or sloping blade profile |
| 01/11/2005 | US6841991 Planarity diagnostic system, E.G., for microelectronic component test systems |
| 01/11/2005 | US6841990 Mechanical interface for rapid replacement of RF fixture components |
| 01/11/2005 | US6841986 Inductively coupled direct contact test probe |
| 01/11/2005 | US6840778 Contact base with detachable contacts for making electrical contact with an electronic component, in particular a multipin electronic component, and module carrier |
| 01/11/2005 | US6840374 A cleaning apparatus comprising a tacky gel layer polysiloxane, an endcapped homo- or copolymer; tip used to test semiconductors dies |
| 01/11/2005 | US6839948 Tooling plate adapted to facilitate rapid and precise attachment into a probing station |
| 01/08/2005 | WO2005003796A1 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 01/06/2005 | US20050001644 Contact probe and probe device |