Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
03/2005
03/22/2005US6870385 Anisotropic conductive sheet and wafer inspection device
03/22/2005US6870382 System and method for evaluating the planarity and parallelism of an array of probe tips
03/22/2005US6870359 Self-calibrating electrical test probe
03/22/2005US6869289 Multicontact electric connector
03/18/2005CA2441447A1 Method and apparatus for electrical commoning of circuits
03/17/2005WO2004034068A3 Contact structure and production method thereof and probe contact assembly using same
03/17/2005WO2002075783A8 Wafer level interposer
03/17/2005US20050059173 Test apparatus for a semiconductor package
03/17/2005US20050057865 Shunt connection to a PCB of an energy management system employed in an automotive vehicle
03/17/2005US20050057270 Contactor assembly for testing electrical circuits
03/17/2005US20050057269 Test method for electronic modules
03/17/2005US20050057256 Scan tool for electronic battery tester
03/17/2005US20050057243 Dual voltage circuit tester
03/17/2005US20050056451 Electrical gripping testing and installation device
03/17/2005DE10337090A1 Electrical probe for conducting discharge tests has conductive piston arranged axially movably relative to bush, whereby piston is only electrically connected to contact element in first positional region
03/16/2005EP1515399A2 Anisotropic conductive film, production method thereof and method of use thereof
03/16/2005EP1514124A1 Device and method of testing an electronic component
03/16/2005EP1368666B1 Method and apparatus for retaining a spring probe
03/16/2005EP1118002A4 Thermal isolation plate for probe card
03/16/2005EP0760936B2 Strain gauge sensor and modulation amplifier for bridge circuits
03/16/2005CN2686278Y Test protection apparatus combination
03/16/2005CN2685883Y Speical spring for electronic and testing industry detecting apparatus
03/16/2005CN1595735A Method for manufacturing connection apparatus
03/16/2005CN1595184A Testing device for density variable printed circuit board
03/16/2005CN1595174A Road maintenance machinery electronic plug-in unit automatic testing system
03/16/2005CN1193240C Inspection appts. and method adapted to scanning technique employing rolling wire probe
03/16/2005CN1193237C Measuring test instrument voltage control system for auxiliary equipment
03/16/2005CN1193235C 电压传感器 Voltage sensor
03/15/2005US6867609 Probe for testing circuits, and associated methods
03/15/2005US6867608 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
03/15/2005US6867607 Membrane test method and apparatus for integrated circuit testing
03/15/2005US6866531 Socket for electrical parts
03/15/2005US6866255 Sputtered spring films with low stress anisotropy
03/10/2005WO2005022173A1 Device for measuring the intensity of a strong current passing through a wire
03/10/2005US20050052225 Calibrated fully differential rc filter
03/10/2005US20050052195 Probe pins zero-point detecting method, and prober
03/10/2005US20050052194 Prefabricated and attached interconnect structure
03/10/2005US20050052193 Notched electrical test probe tip
03/10/2005DE20316645U1 Modular elastic contact pin group device for integrated circuit testing, has elastic contact pins whose position is defined by holes in upper and lower lids
03/10/2005DE20316644U1 Test socket for modular integrated circuit, has adapting device fixed to contact pin group device on intermediate plate arranged on base
03/09/2005EP1512980A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512979A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512978A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512977A2 Loaded-board, guided-probe test fixture
03/09/2005EP1145612B1 Method for mounting an electronic component
03/09/2005EP0852701B1 Field instrument with optical-to-electrical converter
03/09/2005CN2684374Y Pin adjusting machine with two-way pin adjusting function
03/09/2005CN2684199Y Test prod special for CPU base
03/09/2005CN1591999A Matrix connector
03/09/2005CN1591986A Small contactor pin
03/09/2005CN1591814A Wafer prober
03/09/2005CN1591812A Measuring head for measuring plug-in unit
03/09/2005CN1591025A Solid electronic instrument using pointer cursor instead of movable pointer
03/09/2005CN1591024A Electric connector
03/09/2005CN1192422C Probe card for testing semiconductor device and method for testing semiconductor device
03/09/2005CN1192242C Lead frame structure for testing integrated circuits
03/09/2005CN1192241C Method and device for testing printed circuit board
03/08/2005US6864696 High density, high frequency, board edge probe
03/08/2005US6864695 Semiconductor device testing apparatus and semiconductor device manufacturing method using it
03/08/2005US6864676 Substrate-holding device for testing circuit arrangements on substrates
03/08/2005US6864568 Packaging device for holding a plurality of semiconductor devices to be inspected
03/08/2005US6864105 Method of manufacturing a probe card
03/08/2005US6863576 Electrical test probe flexible spring tip
03/08/2005US6863564 Coaxial radio frequency adapter and method
03/08/2005US6863553 Socket for electrical parts
03/08/2005US6863541 Semiconductor socket and method of replacement of its probes
03/03/2005WO2005019840A1 Current collector for a vehicle
03/03/2005WO2004099630A3 Combination hand tool and electrical testing device
03/03/2005US20050048756 Ball film for integrated circuit fabrication and testing
03/03/2005US20050046537 Wafer test space transformer
03/03/2005US20050046433 Integrated printed circuit board and test contactor for high speed semiconductor testing
03/03/2005US20050046432 Electromagnetically shielded test contactor
03/03/2005US20050046408 Hand held voltage detection probe
03/03/2005DE202004019636U1 Meßspitze für HF-Messung Probe tip for RF measurements
03/03/2005DE10334548A1 Verfahren zum Kontaktieren von zu testenden Schaltungseinheiten und selbstplanarisierende Prüfkarteneinrichtung zur Durchführung des Verfahrens Method of contacting of circuit to be tested units and selbstplanarisierende probe card assembly for performing the method
03/03/2005DE10333089A1 Current processor unit has housing containing conductor and signal areas with chip running temperature compensation program connected through bond wires to current and signal pins
03/02/2005EP1510827A1 Spring probe
03/02/2005EP1510826A1 Integrated printed circuit board and test contactor for high speed semiconductor testing
03/02/2005EP1509776A2 Probe for testing a device under test
03/02/2005CN2682420Y Backlight gauge outfit
03/02/2005CN1589409A Method and apparatus for in-circuit testing of sockets
03/02/2005CN1588636A Detecting clamp and its top cover
03/02/2005CN1191701C Non-contact signal analyzer
03/02/2005CN1191477C Electrical characteristics determining device
03/01/2005US6861863 Inspection apparatus for conductive patterns of a circuit board, and a holder thereof
03/01/2005US6861862 Test socket
03/01/2005US6861861 Device for compensating for a test temperature deviation in a semiconductor device handler
03/01/2005US6861858 Vertical probe card and method for using the same
03/01/2005US6861857 Apparatus and method for positioning an integrated circuit for test
03/01/2005US6861856 Guarded tub enclosure
03/01/2005US6861855 High density interconnection test connector especially for verification of integrated circuits
03/01/2005US6861834 System and method for measuring the power consumed by a circuit on a printed circuit board
03/01/2005US6860740 Device and method for contacting at least one terminal of an electronic element
02/2005
02/25/2005CA2478577A1 Integrated printed circuit board and test contactor for high speed semiconductor testing
02/24/2005WO2005018057A1 Spring-loaded electrical terminal
02/24/2005WO2005005996A3 Apparatus and method for electromechanical testing and validation of probe cards
02/24/2005US20050042932 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies
02/24/2005US20050042927 Interposer
02/24/2005US20050042905 Contact pin and socket for electrical parts
02/24/2005US20050042856 Programmed material consolidation processes for protecting intermediate conductive structures
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