| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 02/24/2005 | US20050042782 Method and apparatus for processing semiconductor devices in a singulated form |
| 02/24/2005 | US20050041408 Receiver with sliding hanger structure |
| 02/24/2005 | US20050040837 System for evaluating probing networks |
| 02/24/2005 | US20050040811 Universal test interface between a device under test and a test head |
| 02/24/2005 | US20050039331 Electrically shielded connector |
| 02/24/2005 | DE10357809A1 Magnetische Erfassungsvorrichtung und Verfahren zu dessen Herstellung Magnetic detection device and process for its preparation |
| 02/23/2005 | EP1508786A2 Housing for a sensor to be built into a distribution panel or box |
| 02/23/2005 | CN2681141Y Probe improvement for composite fixture |
| 02/23/2005 | CN1585901A Test probe for a finger tester and corresponding finger tester |
| 02/22/2005 | US6859057 Die carrier |
| 02/22/2005 | US6859056 Test fixture for semiconductor package and test method of using the same |
| 02/22/2005 | US6859055 Probe pin array for socket testing |
| 02/22/2005 | US6859054 Probe contact system using flexible printed circuit board |
| 02/22/2005 | US6859053 Probe apparatus manufacturing method thereof and substrate inspecting method using the same |
| 02/22/2005 | US6859031 Apparatus and method for dynamic diagnostic testing of integrated circuits |
| 02/22/2005 | US6858453 Integrated circuit package alignment feature |
| 02/17/2005 | WO2005015692A1 Contact and connector |
| 02/17/2005 | WO2005015245A2 Test head positioning system |
| 02/17/2005 | WO2005015188A1 Scanning probe inspection apparatus |
| 02/17/2005 | US20050037649 Electronic probe extender |
| 02/17/2005 | US20050037638 Load board |
| 02/17/2005 | US20050036374 Probe card substrate |
| 02/17/2005 | US20050036275 Insert and electronic component handling apparatus comprising the same |
| 02/17/2005 | US20050035779 Low-current pogo probe card |
| 02/17/2005 | US20050035777 Probe holder for testing of a test device |
| 02/17/2005 | US20050035776 Frame transfer prober |
| 02/17/2005 | US20050035775 Probe contact system using flexible printed circuit board |
| 02/17/2005 | US20050035754 Socket connection test modules and methods of using the same |
| 02/17/2005 | US20050035347 Probe card assembly |
| 02/17/2005 | US20050034743 Apparatus and method for cleaning probe card contacts |
| 02/16/2005 | EP1506414A2 High peformance probe system for testing semiconductor wafers |
| 02/16/2005 | CN1582397A Roller contact with conductive brushes |
| 02/16/2005 | CN1582395A Method and system for compensating thermally induced motion of probe cards |
| 02/16/2005 | CN1580787A Probe device for flatboard display detection |
| 02/16/2005 | CN1189756C Inspection apparatus and sensor |
| 02/16/2005 | CN1189754C Detector for measuring voltage/current of distribution low voltage line |
| 02/15/2005 | US6856225 Photolithographically-patterned out-of-plane coil structures and method of making |
| 02/15/2005 | US6856156 Automatically adjustable wafer probe card |
| 02/15/2005 | US6856153 Low-current pogo probe card |
| 02/15/2005 | US6856151 Conductive polymer contact system and test method for semiconductor components |
| 02/15/2005 | US6856150 Probe card with coplanar daughter card |
| 02/15/2005 | US6856136 Thermoelectric device test structure |
| 02/15/2005 | US6856129 Current probe device having an integrated amplifier |
| 02/15/2005 | US6856126 Differential voltage probe |
| 02/15/2005 | US6854980 Probe card |
| 02/10/2005 | WO2005013429A1 Compression mount and zero insertion force socket for ic devices |
| 02/10/2005 | WO2003041212A3 Non-linear transmission line using varactors and non-parallel waveguide |
| 02/10/2005 | US20050033536 Systems and methods for operating a measurement and testing instrument |
| 02/10/2005 | US20050032252 Testing apparatus for carrying out inspection of a semiconductor device |
| 02/10/2005 | US20050032229 Probe tip design applied in a flip chip packaging process |
| 02/10/2005 | US20050031013 Instrument for non-contact infrared temperature measurement having current clamp meter functions |
| 02/10/2005 | US20050030050 Contact pin, connection device and method of testing |
| 02/10/2005 | US20050030006 Test adapter for a weapon store test set |
| 02/10/2005 | US20050028363 Contact structures and methods for making same |
| 02/09/2005 | CN2677944Y Device for detecting circuit board |
| 02/09/2005 | CN1578016A Socket for electronic elements |
| 02/09/2005 | CN1578015A Suction cap for ic sockets and ic socket assembly using same |
| 02/09/2005 | CN1578008A Electric connector apparatus |
| 02/09/2005 | CN1188733C Support frame of displaying panel or detector block |
| 02/09/2005 | CN1188730C Device and method for testing liquid crystal display panel |
| 02/08/2005 | US6853211 Method and system having switching network for testing semiconductor components on a substrate |
| 02/08/2005 | US6853210 Test interconnect having suspended contacts for bumped semiconductor components |
| 02/08/2005 | US6853209 Contactor assembly for testing electrical circuits |
| 02/08/2005 | US6853208 Vertical probe card |
| 02/08/2005 | US6853205 Probe card assembly |
| 02/08/2005 | US6853204 Wafer inspection method of charging wafer with a charged particle beam then measuring electric properties thereof, and inspection device based thereon |
| 02/08/2005 | US6853178 Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents |
| 02/08/2005 | US6851612 Portable diagnostic device |
| 02/03/2005 | WO2005011069A1 Socket, and testing device |
| 02/03/2005 | WO2004083783B1 Hand mounted testing meter |
| 02/03/2005 | WO2004001807B1 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 02/03/2005 | US20050026491 Connector assembly with actuation system |
| 02/03/2005 | US20050026477 Method of making contact with circuit units to be tested and self-planarizing test module device of implementing the method |
| 02/03/2005 | US20050024806 Current detection resistor, mounting structure thereof and method of measuring effective inductance |
| 02/03/2005 | US20050024080 Method for in-line testing of flip-chip semiconductor assemblies |
| 02/03/2005 | US20050024073 Micro-cantilever type probe card |
| 02/03/2005 | US20050024072 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 02/03/2005 | US20050024071 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 02/03/2005 | US20050024070 Test signal distribution system for IC tester |
| 02/03/2005 | US20050024069 Probe for combined signals |
| 02/03/2005 | US20050024068 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 02/03/2005 | US20050024067 Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts |
| 02/03/2005 | US20050024040 Planarity diagnostic system, e.g., for microelectronic component test systems |
| 02/03/2005 | US20050023141 Solution phase electrophoresis device, components, and methods |
| 02/03/2005 | US20050022376 Electronic component test apparatus |
| 02/03/2005 | DE19831634B4 Chipträgeranordnung sowie Verfahren zur Herstellung einer Chipträgeranordnung mit elektrischem Test Chip carrier assembly and method of manufacturing a chip carrier assembly with electrical test |
| 02/03/2005 | DE102004028722A1 Rückseitensondierverfahren und -anordnung Rückseitensondierverfahren and arrangement |
| 02/02/2005 | EP1503217A2 Electronic component test apparatus |
| 02/02/2005 | EP1503216A1 Sheet-form connector and production method and application therefor |
| 02/02/2005 | EP1502123A1 Device and method for testing printed circuit boards, and testing probe for said device and method |
| 02/02/2005 | EP1210612A4 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 02/02/2005 | CN2676206Y Test film probe for display panel |
| 02/02/2005 | CN1575514A Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 02/02/2005 | CN1574513A Contact-connection device for electronic circuit units and production method |
| 02/02/2005 | CN1574480A Connecting unit including contactor having superior electrical conductivity and resilience, and method for producing the same |
| 02/02/2005 | CN1573338A Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured |
| 02/02/2005 | CN1573337A Test card |
| 02/02/2005 | CN1187817C Cooling system for IC module processing device |
| 02/02/2005 | CN1187621C Measurer of high-speed memory bus |
| 02/01/2005 | US6850437 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |