| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 04/14/2005 | WO2005034293A1 Electrical connection component |
| 04/14/2005 | WO2005034232A1 Back-light block for semiconductor vision system |
| 04/14/2005 | WO2005033722A1 Efficient switching architecture with reduced stub lengths |
| 04/14/2005 | US20050079833 Compact temperature transmitter with improved lead connections |
| 04/14/2005 | US20050079772 Cable terminal with air-enhanced contact pins |
| 04/14/2005 | US20050079771 Cable terminal with contact pins including electrical component |
| 04/14/2005 | US20050077914 Non-destructive contact test |
| 04/14/2005 | US20050077913 Compliant contact structures, contactor cards and test system including same, and methods of fabrication and use |
| 04/14/2005 | US20050077912 Method and probe structure for implementing a single probe location for multiple signals |
| 04/14/2005 | US20050077910 Voltage sensing device and associated method |
| 04/14/2005 | US20050077908 Continuity tester apparatus for wiring |
| 04/14/2005 | US20050077905 Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element |
| 04/14/2005 | US20050077542 Anisotropic conductive film, production method thereof and method of use thereof |
| 04/14/2005 | DE10392404T5 Messkopfausrichtungsvorrichtung Probe alignment apparatus |
| 04/14/2005 | DE10343179A1 Current measurement device, especially for monitoring the current of an automotive battery, has voltage measurement means assigned to at least one of a number of consumer fuses |
| 04/14/2005 | DE10297653T5 Verfahren zum Herstellen eines elektrischen Kontaktbauteils zur Prüfung einer elektrischen Vorrichtung und ein elektrisches Kontaktbauteil A method of manufacturing an electrical contact member for testing an electrical device and an electrical contact member |
| 04/14/2005 | DE102004042305A1 Connection pin, especially for a test card for measuring the electrical properties of a semiconductor element, e.g. an LSI chip, has first and second parts with elastic properties |
| 04/13/2005 | EP1523229A2 Assembly of an electronic component with spring packaging |
| 04/13/2005 | CN2692677Y Detecting probe allocating device for printed circuitboard |
| 04/13/2005 | CN1606196A Connecting device using spiral contact |
| 04/13/2005 | CN1605881A Adapter method and apparatus for interfacing a tester with a device under test |
| 04/13/2005 | CN1605873A Electronic device charged via signal input-output terminal |
| 04/13/2005 | CN1605844A Compact temperature transmitter with improved lead connecting pieces |
| 04/13/2005 | CN1197443C Assembly of an electronic component with spring packaging |
| 04/13/2005 | CN1197211C Ic插座 Ic Socket |
| 04/13/2005 | CN1196935C Needle-card adjusting device for planarizing needle sets on a needle card |
| 04/13/2005 | CN1196934C Holder of electro-conductive contactor and method for producing same |
| 04/12/2005 | US6879146 Pneumatic clamps for electric power leads |
| 04/12/2005 | US6879144 Color code alphanumeric system for identifying components of a proximity measurement system |
| 04/07/2005 | WO2005031376A1 Electrochemically fabricated microprobes |
| 04/07/2005 | US20050074992 Adapter for connecting a chip and a socker |
| 04/07/2005 | US20050074910 Manufacturing method of semiconductor device |
| 04/07/2005 | US20050073334 Contact For Semiconductor Components |
| 04/07/2005 | US20050073330 Adjusting device for chip adapter testing pin |
| 04/07/2005 | US20050073327 Range resistors for AC-DC transfer measurements |
| 04/07/2005 | US20050073291 Cartridge system for a probing head for an electrical test probe |
| 04/07/2005 | US20050073041 Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 04/07/2005 | US20050071974 Method of retrofitting a probe station |
| 04/07/2005 | DE10392347T5 Gerät mit einer Schaltung zur Erfassung von Substratfehlern Device with a circuit for detecting substrate defects |
| 04/07/2005 | DE102004041102A1 Semiconductor wafer testing arrangement used in semiconductor production, has temperature control station that transfers wafer to prober through handling system, after applying thermal or mechanical load to wafer |
| 04/07/2005 | DE102004013707A1 Substrate e.g. semiconductor wafer, testing apparatus for use during semiconductor production, has two test arrangements that are jointly connected to handling system, substrate magazine station and alignment station |
| 04/06/2005 | EP1520319A2 Non-linear transmission line using varactors and non-parallel waveguide |
| 04/06/2005 | EP1155331A4 Text probe interface assembly and manufacture method |
| 04/06/2005 | CN1605061A Programmable delay indexed data path register file for array processing |
| 04/06/2005 | CN1605029A Microprocessor-based probe for integrated circuit testing |
| 04/06/2005 | CN1196199C Nonvolatile semiconductor memory device and its imperfect repairing method |
| 04/06/2005 | CN1195988C Apparatus and method for detecting electric trace using photoelectric effect |
| 04/05/2005 | US6876530 Test probe and connector |
| 04/05/2005 | US6876291 Electrical resistor for measuring preferably high-frequency alternating currents |
| 04/05/2005 | US6876216 Integrated circuit probe card |
| 04/05/2005 | US6876214 Method and apparatus for configurable hardware augmented program generation |
| 04/05/2005 | US6876212 Methods and structures for electronic probing arrays |
| 04/05/2005 | US6876203 Parallel insulation fault detection system |
| 04/05/2005 | US6876183 Systems and methods for making a high-bandwidth coaxial cable connection |
| 04/05/2005 | US6876104 High-speed switching circuit and automotive accessory controller using same |
| 04/05/2005 | US6876089 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
| 04/05/2005 | US6876073 Semiconductor device and contractor for inspection |
| 04/05/2005 | US6874227 Method for packaging an image sensor |
| 03/31/2005 | WO2005029934A1 Printed board and method for manufacturing same |
| 03/31/2005 | WO2005029671A1 Electronic circuit for provision of a supply voltage for an electronic user |
| 03/31/2005 | WO2005029575A1 Structure of probe needle for probe card |
| 03/31/2005 | WO2005029099A1 Current measurement device, test device, and coaxial cable and assembled cable used for them |
| 03/31/2005 | WO2004107401A3 Probe for testing a device under test |
| 03/31/2005 | US20050070135 Socket and contact of semiconductor package |
| 03/31/2005 | US20050070133 Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 03/31/2005 | US20050068898 Efficient switching architecture with reduced stub lengths |
| 03/31/2005 | US20050068192 System for the remote acquisition of the electric energy consumptions and for the remote control of the distributed targets of users, also of domestic type |
| 03/31/2005 | US20050068054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies |
| 03/31/2005 | US20050068038 Electronic apparatus recharged via signal I/O terminal |
| 03/31/2005 | US20050067687 Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 03/31/2005 | US20050066523 Method of making an interposer with contact structures |
| 03/30/2005 | EP1519200A1 Method for optimizing probe card analysis and scrub mark analysis data |
| 03/30/2005 | EP1518127A2 Test device for integrated circuit components |
| 03/30/2005 | EP1430317A4 Tap switch for frequency response and partial discharge measurement |
| 03/30/2005 | CN2689232Y Digital signal source with wave form display |
| 03/30/2005 | CN1601717A Probe card substrate |
| 03/30/2005 | CN1601283A Connection pin |
| 03/29/2005 | US6873169 Carrier module for semiconductor device test handler |
| 03/29/2005 | US6873168 Conductive coil contact member |
| 03/29/2005 | US6873163 Spatially resolved electromagnetic property measurement |
| 03/29/2005 | US6873146 Integrated circuit testing device and a method of use therefor |
| 03/29/2005 | US6873145 Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 03/24/2005 | WO2005015245A3 Test head positioning system |
| 03/24/2005 | WO2004113935A3 Test fixture for impedance measurements |
| 03/24/2005 | US20050062493 Method and apparatus for electrical commoning of circuits |
| 03/24/2005 | US20050062492 High density integrated circuit apparatus, test probe and methods of use thereof |
| 03/24/2005 | US20050062489 Probe station having multiple enclosures |
| 03/24/2005 | US20050062465 Method and system for loading substrate supports into a substrate holder |
| 03/24/2005 | US20050062116 Field effect transistor sensor |
| 03/24/2005 | US20050060882 Method to prevent damage to probe card |
| 03/24/2005 | DE10235802B4 Steckverbindung für einen integrierten Schaltkreis Plug connection for an integrated circuit |
| 03/24/2005 | DE10200621B4 Modulträger mit einem Kontaktsockel Module carrier with a contact base |
| 03/24/2005 | DE102004028185A1 Prüfkarte Probe card |
| 03/23/2005 | EP1516192A1 Test method for yielding a known good die |
| 03/23/2005 | EP1516191A1 Multi-socket board for open/short tester |
| 03/23/2005 | EP1247063A4 Scanning force microscope probe cantilever with reflective structure |
| 03/23/2005 | CN2687679Y Wide woking voltage multi-rate electric-energy meter for preventing illegal use |
| 03/23/2005 | CN2687674Y High power adjustable electronic load |
| 03/23/2005 | CN1599869A Testing method and tester for semiconducor integrated circuit device comprising high-speed input/output element |
| 03/23/2005 | CN1598598A Checking device of display panel |