| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/12/2005 | US20050099196 Semiconductor inspection device based on use of probe information, and semiconductor inspection method |
| 05/12/2005 | US20050099195 Probe sheet and probe sheet unit using same |
| 05/12/2005 | US20050099194 Arch type probe and probe card using same |
| 05/12/2005 | US20050099193 Electronic component/interface interposer |
| 05/12/2005 | US20050099191 Probe for testing a device under test |
| 05/12/2005 | US20050099172 Systems and methods for determining whether a heat sink is installed |
| 05/12/2005 | US20050098778 Burn-in test adapter and burn-in test apparatus |
| 05/12/2005 | DE202004017714U1 Electrical measurement instrument of the multimeter type, has push-on caps for one or both of its ends that serve to cover at least one functional part of the instrument |
| 05/12/2005 | DE10392306T5 Kontaktstruktur mit Siliziumtastkontaktgeber Contact structure with Siliziumtastkontaktgeber |
| 05/11/2005 | EP1530056A2 Method of testing of a silicon-on-insulator wafer |
| 05/11/2005 | EP1530051A1 Probe sheet |
| 05/11/2005 | EP1530050A2 Arch type probe |
| 05/11/2005 | EP1256006A4 Non-invasive electrical measurement of semiconductor wafers |
| 05/11/2005 | CN2699305Y Electrical measurement meter with safety protection |
| 05/11/2005 | CN1615444A Flexible test head interface |
| 05/11/2005 | CN1615442A System for the remote data acquisition and control of electric energy meters |
| 05/11/2005 | CN1614428A Arch type probe and probe card using same |
| 05/11/2005 | CN1614427A Position regulator for pickup and non-contacted electric resistance rate determiner |
| 05/11/2005 | CN1614426A Probe sheet and probe sheet unit using same |
| 05/11/2005 | CN1201384C Wafer class probe card and its mfg. method |
| 05/11/2005 | CN1201161C Probe card for probing wafers with raised contact elements |
| 05/10/2005 | US6891392 Substrate impedance measurement |
| 05/10/2005 | US6891391 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate |
| 05/10/2005 | US6891387 System for probing, testing, burn-in, repairing and programming of integrated circuits |
| 05/10/2005 | US6891386 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet |
| 05/10/2005 | US6891385 Probe card cooling assembly with direct cooling of active electronic components |
| 05/10/2005 | US6891384 Multi-socket board for open/short tester |
| 05/10/2005 | US6891360 Plated probe structure |
| 05/10/2005 | US6891255 Microelectronic packages having an array of resilient leads |
| 05/10/2005 | US6890787 Methods for protecting intermediate conductive elements of semiconductor device assemblies |
| 05/06/2005 | WO2005040836A2 Isolation buffers with controlled equal time delays |
| 05/05/2005 | US20050095734 Reducing damage to test pads, wires, dielectrics; cutting grooves into reinforcement; thin film detector; electrical connecting to wires |
| 05/05/2005 | US20050095728 Method of electrical characterization of a silicon-on-insulator ( SOI) wafer |
| 05/05/2005 | US20050093565 Fabrication method of semiconductor integrated circuit device |
| 05/05/2005 | US20050093559 Connection pin |
| 05/05/2005 | US20050093558 Carrier for cleaning sockets for semiconductor components having contact balls |
| 05/05/2005 | US20050093557 Method of forming an electrical contact |
| 05/05/2005 | US20050093536 Manual probe carriage system and method of using the same |
| 05/05/2005 | US20050092709 Microprobe for testing electronic device and manufacturing method thereof |
| 05/04/2005 | CN2697657Y Multi-position fraudulent use proof electricity meter casing |
| 05/04/2005 | CN2697653Y Signal isolation box with automatic cover tighting structure |
| 05/04/2005 | CN2697652Y Axial connector |
| 05/04/2005 | CN2697651Y Atomazing transducing chip |
| 05/04/2005 | CN1612322A Fabrication method of semiconductor integrated circuit device |
| 05/04/2005 | CN1612321A Fabrication method of semiconductor integrated circuit device |
| 05/04/2005 | CN1611950A Method of manufacturing protruding-volute contact, contact made by the method |
| 05/04/2005 | CN1611949A Method of manufacturing contact, contact made by the method |
| 05/03/2005 | US6888364 Test system and test contactor for electronic modules |
| 05/03/2005 | US6888362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts |
| 05/03/2005 | US6888344 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter |
| 05/03/2005 | US6888341 Dual voltage circuit tester |
| 05/03/2005 | US6888158 Bare chip carrier and method for manufacturing semiconductor device using the bare chip carrier |
| 05/03/2005 | US6887723 Method for processing an integrated circuit including placing dice into a carrier and testing |
| 05/03/2005 | US6887085 Terminal for spiral contactor and spiral contactor |
| 05/03/2005 | US6886976 Method for controlling the temperature of an electronic component under test |
| 04/28/2005 | WO2004093252A3 Electrical connector and method for making |
| 04/28/2005 | US20050088194 Testing integrated circuits |
| 04/28/2005 | US20050088193 Method of manufacturing protruding-volute contact, contact made by the method, and inspection equipment or electronic equipment having the contact |
| 04/28/2005 | US20050088192 Method of manufacturing contact, contact made by the method, and inspection equipment or electronic equipment having the contact |
| 04/28/2005 | US20050088191 Probe testing structure |
| 04/28/2005 | US20050088189 Capacity load type probe, and test jig using the same |
| 04/28/2005 | US20050088167 Isolation buffers with controlled equal time delays |
| 04/27/2005 | EP1436636A4 Method and apparatus for sub-micron imaging and probing on probe station |
| 04/27/2005 | EP1232634A4 Non-contact signal analyzer |
| 04/27/2005 | EP1018023B1 Probe card for testing wafers |
| 04/27/2005 | CN2696242Y Device for testing panel display screen |
| 04/27/2005 | CN2695977Y Clamp for detecting electronic tuner |
| 04/27/2005 | CN1610832A Insertosome and electronic parts processing device with the same |
| 04/27/2005 | CN1610087A Micro-mechanical chip testing card and producing method thereof |
| 04/26/2005 | US6885207 Method and apparatus for testing electronic devices |
| 04/26/2005 | US6885206 Device for supporting thin semiconductor wafers |
| 04/26/2005 | US6885204 Probe card, and testing apparatus having the same |
| 04/26/2005 | US6885203 Wafer level burn-in using light as the stimulating signal |
| 04/26/2005 | US6885197 Indexing rotatable chuck for a probe station |
| 04/26/2005 | US6884300 Method of cleaning a probe |
| 04/21/2005 | WO2005036188A1 Circuit board inspection device |
| 04/21/2005 | US20050085105 Arrangement for producing an electrical connection between a BGA package and a signal source, and method for producing such a connection |
| 04/21/2005 | US20050083074 Integrated probe module for LCD panel light inspection |
| 04/21/2005 | US20050083073 Probe apparatus |
| 04/21/2005 | US20050083072 Probe card and contactor of the same |
| 04/21/2005 | US20050083071 Electronic circuit assembly test apparatus |
| 04/21/2005 | US20050083038 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method |
| 04/21/2005 | US20050083037 Arrangement and method for testing substrates under load |
| 04/20/2005 | EP1524529A1 Contact probe for a testing head having vertical probes for semiconductor integrated electronic devices |
| 04/20/2005 | EP1523685A2 Assembly for connecting a test device to an object to be tested |
| 04/20/2005 | EP1523684A1 Fiducial alignment marks on microelectronic spring contacts |
| 04/20/2005 | CN1608336A Socket for inspection |
| 04/20/2005 | CN1607653A Spiral contactor and manufacturing method for this apparatus, and a semiconductor inspecting equipment and electronical parts using this apparatus |
| 04/20/2005 | CN1607395A Method and apparatus for detecting non-destructive contact |
| 04/20/2005 | CN1198189C Method for compensating deviation of test temperature |
| 04/19/2005 | US6882168 Probe tile for probing semiconductor wafer |
| 04/19/2005 | US6882167 Method of forming an electrical contact |
| 04/19/2005 | US6882158 Series arc fault diagnostic for aircraft wiring |
| 04/19/2005 | US6882138 Modular test adapter for rapid action engagement interface |
| 04/19/2005 | US6881663 Methods of fabricating silicide pattern structures |
| 04/19/2005 | US6881593 Semiconductor die adapter and method of using |
| 04/19/2005 | US6881274 Test carrier for temporarily packaging bumped semiconductor components in which contact balls on the components are protected during test procedures; made of wear resistant material |
| 04/19/2005 | US6881088 Connector assembly with actuation system |
| 04/19/2005 | US6881072 Membrane probe with anchored elements |
| 04/19/2005 | US6880245 Method for fabricating a structure for making contact with an IC device |