| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 06/09/2005 | US20050124181 Connector for making electrical contact at semiconductor scales |
| 06/09/2005 | US20050124144 Electrical connecting apparatus |
| 06/09/2005 | US20050122151 Dual edge programmable delay unit |
| 06/09/2005 | US20050122125 Guarded tub enclosure |
| 06/09/2005 | US20050121800 Membrane probe with anchored elements |
| 06/09/2005 | DE19616809B4 Prüfmanipulator mit Drehtisch Test manipulator with rotary table |
| 06/09/2005 | DE102004036407A1 Prüfkarte und Verbinder für diese Probe card and connector for this |
| 06/08/2005 | EP1538452A1 Placing table drive device and probe method |
| 06/08/2005 | EP1125330A4 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 06/08/2005 | CN2704050Y Surface-pasted semiconductor device test seat |
| 06/08/2005 | CN1625054A Dual edge programmable delay unit and method for providing programm of the unit |
| 06/07/2005 | US6903602 Calibrated fully differential RC filter |
| 06/07/2005 | US6903563 Contact probe and probe device |
| 06/07/2005 | US6903562 Integrated micromachine relay for automated test equipment applications |
| 06/07/2005 | US6903454 Contact spring configuration for contacting a semiconductor wafer and method for producing a contact spring configuration |
| 06/07/2005 | US6902445 Socket for electrical parts |
| 06/07/2005 | US6902416 High density probe device |
| 06/02/2005 | WO2004100218A3 Prefabricated and attached interconnect structure |
| 06/02/2005 | WO2004099793A3 Device probing using a matching device |
| 06/02/2005 | US20050116730 Double-faced detecting devices for an electronic substrate |
| 06/02/2005 | US20050116728 Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device |
| 06/02/2005 | US20050116727 Voltage probe systems having improved bandwidth capability |
| 06/02/2005 | US20050116351 Semiconductor interconnect having conductive spring contacts |
| 06/02/2005 | US20050116328 Substrate and method of manufacture thereof |
| 06/02/2005 | US20050116223 Burn-in substrate and burn-in device |
| 06/02/2005 | DE10351227A1 Contact-making device for an electricity meter with contact pieces for each phase on its rear side fits each phase with a controllable jumper device for short-circuiting wires |
| 06/01/2005 | EP1536241A2 Probe for measuring electrical characteristics and method of manufacturing the same |
| 06/01/2005 | CN1623099A Cooling assembly with direct cooling of active electronic components |
| 06/01/2005 | CN1623094A Probe card and method for manufacturing probe card |
| 06/01/2005 | CN1621849A Contact type thin film probe |
| 06/01/2005 | CN1621848A Contact type thin film probe |
| 06/01/2005 | CN1204615C Electronic device measuring device and method |
| 06/01/2005 | CN1204613C Adaptive probe device |
| 06/01/2005 | CN1204612C Contact switch for semiconductor device detection and its producing method |
| 05/31/2005 | US6901538 Method, system, and recording medium of testing a 1394 interface card |
| 05/31/2005 | US6900710 Ultrafast sampler with non-parallel shockline |
| 05/31/2005 | US6900653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof |
| 05/31/2005 | US6900652 Flexible membrane probe and method of use thereof |
| 05/31/2005 | US6900651 Electroconductive contact unit assembly |
| 05/31/2005 | US6900649 High frequency RF interconnect for semiconductor automatic test equipment |
| 05/31/2005 | US6900647 Contact probe and probe device |
| 05/31/2005 | US6900646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof |
| 05/31/2005 | US6900645 Semiconductor device test method and semiconductor device tester |
| 05/31/2005 | US6900627 Apparatus and method for testing semiconductor integrated circuit |
| 05/26/2005 | WO2005047909A1 Electronic component/interface interposer |
| 05/26/2005 | US20050114550 Synchronization of modules for analog and mixed signal testing in an open architecture test system |
| 05/26/2005 | US20050110509 Contactor having conductive particles in a hole as a contact electrode |
| 05/26/2005 | US20050110508 Apparatus and test method for isolation and electrical shielding prober chuck stage |
| 05/26/2005 | US20050110507 Electrical characteristic measuring probe and method of manufacturing the same |
| 05/26/2005 | US20050110506 Contact probe for a testing head having vertical probes for semiconductor integrated devices |
| 05/26/2005 | US20050110505 Spring contact probe device for electrical testing |
| 05/26/2005 | US20050110504 Method and apparatus for implementing very high density probing (vhdp) of printed circuit board signals |
| 05/26/2005 | US20050110481 Modular housing for electrical instrument and mounting member therefor |
| 05/26/2005 | US20050108876 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 05/26/2005 | US20050108875 Methods for making vertical electric feed through structures usable to form removable substrate tiles in a wafer test system |
| 05/25/2005 | EP1532456A1 Method of making microelectronic spring contact array |
| 05/25/2005 | EP1038186B1 Test socket |
| 05/25/2005 | DE19960112B4 Testanordnung zum Testen von Rückwandplatinen, Zwischenträgersubstraten, oder bestückten Leiterplatten Test arrangement for testing backplanes, subcarrier substrates or printed circuit boards |
| 05/25/2005 | DE10347111A1 Integrated battery measurement terminal for motor vehicle has battery sensor with housing whose size and shape are adapted so measurement terminal in mounted position cannot rotate when applying torque during fitting of terminal to pole |
| 05/25/2005 | CN2702314Y Detecting probe arrangement |
| 05/25/2005 | CN1620614A Probe card covering system and method |
| 05/25/2005 | CN1619797A Connector and method of manufacturing the same |
| 05/25/2005 | CN1619315A Test probe for electrical devices having low or no wedge depression |
| 05/25/2005 | CN1619314A Detector and tester for display panel experiment |
| 05/25/2005 | CN1203739C Interconnect assembly for printed circuit boards and manufacturing method thereof |
| 05/24/2005 | US6897672 Apparatus to prevent damage to probe card |
| 05/24/2005 | US6897668 Double-faced detecting devices for an electronic substrate |
| 05/24/2005 | US6897667 Test system for silicon substrate having electrical contacts |
| 05/24/2005 | US6897666 Embedded voltage regulator and active transient control device in probe head for improved power delivery and method |
| 05/24/2005 | US6897385 Semiconductor test board for fine ball pitch ball grid array package |
| 05/24/2005 | US6896534 Zero insertion force mount for fixing and making contact with circuit subassemblies on a substrate |
| 05/24/2005 | US6896525 IC tester socket with flexible contact points |
| 05/19/2005 | WO2005045451A1 Conductive contact holder and conductive contact unit |
| 05/19/2005 | WO2005045448A1 Cable terminal with contact pins including electrical components |
| 05/19/2005 | WO2002090054A3 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 05/19/2005 | US20050106907 Anisotropic conductive connector and its production method, and circuit device test instrument |
| 05/19/2005 | US20050106904 Connector and method of manufacturing the same |
| 05/19/2005 | US20050106382 comprises a metal powder having the form of a lot of fine metal particles being linked in a chain shape as a conductive component formed of a metal having paramagnetism |
| 05/19/2005 | US20050104610 Probe station with low noise characteristics |
| 05/19/2005 | US20050104609 Microprobe tips and methods for making |
| 05/19/2005 | US20050104576 Meter with concealed probe receiving deck |
| 05/19/2005 | US20050102833 Release height adjustment of stressy metal devices by annealing before and after release |
| 05/19/2005 | DE19847244B4 Prüfkopf für Mikrostrukturen mit Schnittstelle Probe for microstructures with interface |
| 05/18/2005 | EP1322967B1 Module for a testing device for testing printed circuit boards |
| 05/18/2005 | EP1123465A4 Fluid thrust bearing - indicator with an assembling |
| 05/18/2005 | CN1618124A Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 05/17/2005 | US6894908 Bridge clip with bimetallic leaf and method |
| 05/17/2005 | US6894521 Burn-in carrier for a semiconductor die |
| 05/17/2005 | US6894519 Apparatus and method for determining electrical properties of a semiconductor wafer |
| 05/17/2005 | US6894516 Method and apparatus for implementing very high density probing (VHDP) of printed circuit board signals |
| 05/17/2005 | US6894515 Inspection unit and method of manufacturing substrate |
| 05/17/2005 | US6894513 Multipoint plane measurement probe and methods of characterization and manufacturing using same |
| 05/17/2005 | US6894480 Wafer probing test apparatus and method of docking the test head and probe card thereof |
| 05/17/2005 | US6894479 Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device |
| 05/17/2005 | US6892452 Securing positive electrical connection between wiring board and semiconductor device; pattern forming bumps having pointed tapering end in vertical cross section |
| 05/12/2005 | WO2005043594A2 Method for forming photo-defined micro electrical contacts |
| 05/12/2005 | WO2005043176A2 Probe testing structure |
| 05/12/2005 | WO2005043084A2 A tap- resistant system with an optical device |
| 05/12/2005 | US20050101193 Remote display ammeter for power plug or power strip |
| 05/12/2005 | US20050099763 Controlled compliance fine pitch electrical interconnect |