| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/05/2005 | US6913988 Methods for fabricating semiconductor device test apparatus that include protective structures for intermediate conductive elements |
| 07/05/2005 | US6913483 Cable for electronic battery tester |
| 07/05/2005 | US6913476 Temporary, conformable contacts for microelectronic components |
| 07/05/2005 | US6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods |
| 06/30/2005 | WO2005059926A1 Coaxial cable, twist pair cable, coaxial cable unit, test device, and cpu system |
| 06/30/2005 | WO2005059571A1 Anisotropic conductive connector and circuit device inspection method |
| 06/30/2005 | US20050142918 ZIF connector and semiconductor-testing apparatus using the same |
| 06/30/2005 | US20050142697 Fabrication method of semiconductor integrated circuit device |
| 06/30/2005 | US20050140386 Active wafer probe |
| 06/30/2005 | US20050140383 Electric-connection testing device |
| 06/30/2005 | US20050140382 High density, area array probe card apparatus |
| 06/30/2005 | US20050140381 Probe card with coplanar daughter card |
| 06/30/2005 | US20050140380 Probe device, probe card channel information creation program, and probe card information creation device |
| 06/30/2005 | US20050140366 Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe |
| 06/30/2005 | US20050140006 Method of manufacturing a semiconductor device |
| 06/30/2005 | US20050139682 Portable diagnostic device |
| 06/30/2005 | DE10354080A1 Motor vehicle battery`s current/voltage measuring device, has pole pliers with shanks including two oppositely arranged arc-shaped gripping areas that contact outer contour of pole pin at contacting region of pin |
| 06/29/2005 | EP1548748A1 A method for making probes for atomic force microscopy |
| 06/29/2005 | EP1548451A2 System for the remote reading and control of electric energy consumption |
| 06/29/2005 | EP1548450A2 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 06/29/2005 | EP1546740A1 High density probe device |
| 06/29/2005 | EP1546739A1 Rf chip testing method and system |
| 06/29/2005 | EP1546324A1 Expression vectors encoding epitopes of target-associated antigens |
| 06/29/2005 | CN1633600A Contact structure having silicon finger contactor |
| 06/29/2005 | CN1632603A Capacitor for measuring vane electrical characteristics |
| 06/29/2005 | CN1632596A Circuit film for micro electromechanical probe and fabricating method thereof |
| 06/29/2005 | CN1632595A Method and device for implementing universal adapter of tester special for circuit board |
| 06/29/2005 | CN1208624C Method of making interconnecting elements |
| 06/28/2005 | US6911835 High performance probe system |
| 06/28/2005 | US6911834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing |
| 06/28/2005 | US6911833 Electromagnetically shielded test contactor |
| 06/28/2005 | US6911814 Apparatus and method for electromechanical testing and validation of probe cards |
| 06/28/2005 | US6911811 Contact spring and socket combination for high bandwidth probe tips |
| 06/28/2005 | US6910924 Wireless CASS interface device |
| 06/28/2005 | US6910915 Terminal connector |
| 06/23/2005 | WO2005057735A1 Small array contact with precision working range |
| 06/23/2005 | WO2005057734A1 Fine terminal, its manufacturing method, and contact sheet |
| 06/23/2005 | WO2005057652A2 Connector for making electrical contact at semiconductor scales and method for forming same |
| 06/23/2005 | US20050136704 Die carrier |
| 06/23/2005 | US20050136647 Methods of fabricating contact interfaces |
| 06/23/2005 | US20050134298 Resistive probe tips |
| 06/23/2005 | US20050134297 Electron beam generating apparatus and optical sampling apparatus using the same |
| 06/23/2005 | US20050134289 Measurement connector for test device |
| 06/23/2005 | US20050134256 System for processing electronic devices |
| 06/23/2005 | US20050134255 Coaxial cable unit, test apparatus, and CPU system |
| 06/23/2005 | US20050134254 Enhanced cost effective method for high current measurements |
| 06/23/2005 | DE102004056097A1 Probe for detecting abnormalities in stator core of large generator, has sense core defining air gaps between opposed surfaces of adjacent teeth between which probe is disposed, and respective sensing ends of core |
| 06/22/2005 | EP1544909A1 Probe method,prober,and electrode recucing/plasma-etching process mechanism |
| 06/22/2005 | EP1544625A1 Anisotropic, conductive sheet and impedance measuring probe |
| 06/22/2005 | EP1544624A1 Method for testing dies utilising a machine grooved storage tray |
| 06/22/2005 | CN1630820A Method and apparatus for testing electronic devices |
| 06/22/2005 | CN1207819C Non-folding strain eliminating terminal of coaxial cable and method for making same |
| 06/21/2005 | US6909300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips |
| 06/21/2005 | US6909298 Test socket with integral inductor and method of manufacturing using such a test socket |
| 06/21/2005 | US6909297 Probe card |
| 06/21/2005 | US6909296 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting |
| 06/21/2005 | US6909056 Compliant electrical contact assembly |
| 06/21/2005 | US6908315 Socket for testing a component and method of testing a component |
| 06/16/2005 | WO2005055369A2 Methods for making vertical electrical feed through structures |
| 06/16/2005 | WO2005054878A1 A ground-signal-ground (gsg) test structure |
| 06/16/2005 | WO2005054877A1 Method and arrangement for testing an electronic device |
| 06/16/2005 | US20050130504 Test device for components of integrated circuits |
| 06/16/2005 | US20050130456 Spiral terminal and method of manufacturing the same |
| 06/16/2005 | US20050129301 Electronic part inspection device |
| 06/16/2005 | US20050128471 Optical coupling for testing integrated circuits |
| 06/16/2005 | US20050128020 Ultrafast sampler with non-parallel shockline |
| 06/16/2005 | US20050127935 Semiconductor device tester |
| 06/16/2005 | US20050127930 Die level testing using machine grooved storage tray with vacuum channels |
| 06/16/2005 | US20050127929 Electrical feedback detection system for multi-point probes |
| 06/16/2005 | US20050127928 Semiconductor interconnect having semiconductor spring contacts |
| 06/16/2005 | US20050127927 Indexing rotatable chuck for a probe station |
| 06/16/2005 | US20050127918 Activity-based battery monitor with a universal current measuring apparatus |
| 06/16/2005 | US20050127898 Stage driving apparatus and probe method |
| 06/16/2005 | US20050127896 Component testing system vacuum ring and test plate construction |
| 06/16/2005 | US20050127895 Current sensor wire clamp |
| 06/16/2005 | US20050127531 Method for ball grid array chip packages having improved testing and stacking characteristics |
| 06/16/2005 | US20050126590 Cleaning sheet for a probe |
| 06/15/2005 | EP1542029A2 Surface mounting electronic module and method of testing the same |
| 06/15/2005 | EP1542028A1 Performance board and test system |
| 06/15/2005 | EP1542023A2 Finger tester |
| 06/15/2005 | EP1540360A1 A system for burn-in testing of electronic devices |
| 06/15/2005 | EP1540359A1 Method and test adapter for testing an appliance having a smart card reader |
| 06/15/2005 | EP1540356A1 Interface comprising a thin pcb with protrusions for testing an integrated circuit |
| 06/15/2005 | CN2704845Y Connection-disconnection style high-accurately electric parameter detecting clamp |
| 06/15/2005 | CN2704844Y Clamp for high-accurately detecting electric parameter of product |
| 06/15/2005 | CN1628251A Electrical feedback detection system for multi-point probes |
| 06/15/2005 | CN1627085A Spiral terminal and method of manufacturing the same |
| 06/15/2005 | CN1627084A Probe in use for detection |
| 06/15/2005 | CN1206719C Contactor, method of producing the same, and method of testing using the same |
| 06/14/2005 | US6906543 Probe card for electrical testing a chip in a wide temperature range |
| 06/14/2005 | US6906542 Probing method and prober |
| 06/14/2005 | US6906541 Electric resistance measuring connector and measuring device and measuring method for circuit board electric resistance |
| 06/14/2005 | US6906540 Method for chemically etching photo-defined micro electrical contacts |
| 06/14/2005 | US6906539 High density, area array probe card apparatus |
| 06/14/2005 | US6906508 Component testing system vacuum ring and test plate construction |
| 06/14/2005 | US6906506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe |
| 06/14/2005 | US6905952 Recovery processing method of an electrode |
| 06/09/2005 | WO2005052613A1 Synchronization of modules for analog and mixed signal testing |
| 06/09/2005 | WO2005052604A1 Portable electric testing equipment |
| 06/09/2005 | WO2005052603A1 Apparatus for testing a device with a high frequency signal |