| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/21/2005 | WO2005066641A1 Auxiliary element for fixing a current sensor to an electrical conductor |
| 07/21/2005 | WO2005065258A2 Active wafer probe |
| 07/21/2005 | WO2004100218B1 Prefabricated and attached interconnect structure |
| 07/21/2005 | WO2004093252B1 Electrical connector and method for making |
| 07/21/2005 | US20050159050 Device interface apparatus |
| 07/21/2005 | US20050159049 Wireless cass interface device |
| 07/21/2005 | US20050159034 Connector, electronic component fixing device, and tester |
| 07/21/2005 | US20050159027 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 07/21/2005 | US20050159025 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 07/21/2005 | US20050159002 Sputtered spring films with low stress anisotropy |
| 07/21/2005 | US20050156614 Semiconductor inspection device and method for manufacturing contact probe |
| 07/21/2005 | US20050156613 Probe card |
| 07/21/2005 | US20050156610 Probe station |
| 07/21/2005 | US20050156313 Inspection device and method for manufacturing the same, method for manufacturing electro-optic device and method for manufacturing semiconductor device |
| 07/21/2005 | US20050156166 Jig device for transporting and testing integrated circuit chip |
| 07/21/2005 | US20050156165 Test assembly including a test die for testing a semiconductor product die |
| 07/21/2005 | US20050155219 Index head in semiconductor device test handler |
| 07/21/2005 | US20050155213 Radio frequency identification tag inlay sortation and assembly |
| 07/21/2005 | DE10359648A1 Loader head device for loading a header/adapter device with a corresponding semiconductor component loads a burn-in header/burn-in adapter device with a corresponding semiconductor component |
| 07/20/2005 | EP1555533A1 Semiconductor inspection device and method of manufacturing contact probe |
| 07/20/2005 | EP1097617B1 Interconnect assembly for printed circuit boards and method of fabrication |
| 07/20/2005 | CN2711898Y High frequency suspension arm type probe card |
| 07/20/2005 | CN2711738Y Low-voltage composite metering pipe for distribution transformer |
| 07/20/2005 | CN1643387A Contactor assembly for testing ceramic surface mount devices and other electronic components assembled by said contactor |
| 07/20/2005 | CN1643386A Modular housing for electrical instrument and mounting member therefor |
| 07/20/2005 | CN1643065A Apparatus and method for cleaning test probes |
| 07/20/2005 | CN1641853A Inspection device and method for manufacturing the same, method for manufacturing electro-optic device and method for manufacturing semiconductor device |
| 07/20/2005 | CN1641362A Display panel optical detection integrating probe module and its manufacturing method |
| 07/20/2005 | CN1211892C Socket for spheric grid array package |
| 07/20/2005 | CN1211664C Probe unit for inspection of base board for assemblying semiconductor chip |
| 07/19/2005 | US6919734 Cooling fin connected to a cooling unit and a pusher of the testing apparatus |
| 07/19/2005 | US6919732 Contact probe and probe device |
| 07/14/2005 | WO2005064352A1 Electric test tip and method and device for carrying out discharge tests using such a test probe |
| 07/14/2005 | WO2005064351A1 Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 07/14/2005 | US20050151557 Low-current pogo probe card |
| 07/14/2005 | US20050151550 Circuit board testing jig |
| 07/14/2005 | US20050151548 Probe for combined signals |
| 07/14/2005 | US20050151547 Probe card |
| 07/14/2005 | US20050151543 Accurate and efficient sensing circuit and method for bi-directional signals |
| 07/14/2005 | DE10357524A1 Current measurement device for current-carrying cable, especially for motor vehicle, has voltage supply device that generates floating operating voltage at internal d.c. voltage output connected to measurement and evaluation device |
| 07/14/2005 | DE102004056715A1 Elektronenstrahl-Erzeugungsvorrichtung und dieselbe verwendende optische Abtastastvorrichtung Electron beam generating device, and used the same optical Abtastastvorrichtung |
| 07/14/2005 | DE10027042B4 Vorrichtung zum Messen, insbesondere Hochfrequenzmessen von elektrischen Bauelementen Apparatus for measuring, particularly high-frequency measurement of electrical components |
| 07/13/2005 | EP1553623A1 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 07/13/2005 | EP1553622A1 Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 07/13/2005 | EP1553621A1 Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 07/13/2005 | EP1553419A1 Probe Card |
| 07/13/2005 | EP1552905A2 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 07/13/2005 | EP1552734A1 Shock absorber means for components and cards |
| 07/13/2005 | CN2709984Y Protection switch of electric energy meter |
| 07/13/2005 | CN2709983Y Probe base of capacitance resistance detector |
| 07/13/2005 | CN2709982Y Cable test table with separate channel |
| 07/13/2005 | CN1639919A Anisotropic conductive connector and its production method, and circuit device test instrument |
| 07/13/2005 | CN1639918A Anisotropic conductive film and method for producing the same |
| 07/13/2005 | CN1639579A Device with board abnormality detecting circuit |
| 07/13/2005 | CN1639577A Test probe alignment apparatus |
| 07/13/2005 | CN1638108A Method of manufacturing a semiconductor device |
| 07/13/2005 | CN1638082A Fabrication method of semiconductor integrated circuit device |
| 07/13/2005 | CN1638080A Die level testing using machine grooved storage tray with vacuum channels |
| 07/13/2005 | CN1637424A Techniques for controlling movement of a circuit board module along card cage slot |
| 07/13/2005 | CN1637420A 探测卡 Probe card |
| 07/13/2005 | CN1210847C 电屏蔽连接器 Electrically shielded connector |
| 07/12/2005 | US6917698 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 07/12/2005 | US6917525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 07/12/2005 | US6917211 Contact probe and probe device |
| 07/12/2005 | US6917210 Integrated circuit tester with high bandwidth probe assembly |
| 07/12/2005 | US6917195 Wafer probe station |
| 07/12/2005 | US6917102 Contact structure and production method thereof and probe contact assembly using same |
| 07/12/2005 | CA2348274C Electro-optic voltage sensor |
| 07/12/2005 | CA2345238C Fluid thrust bearing for indicating instruments |
| 07/07/2005 | WO2005060719A2 Resistive probe tips |
| 07/07/2005 | WO2005060718A2 Cap at resistors of electrical test probe |
| 07/07/2005 | US20050148214 Lithographic contact elements |
| 07/07/2005 | US20050146414 Connecting unit including contactor having superior electrical conductivity and resilience, and method for producing the same |
| 07/07/2005 | US20050146347 Techniques for controlling movement of a circuit board module along card cage slot |
| 07/07/2005 | US20050146345 Low-current pogo probe card |
| 07/07/2005 | US20050146341 Apparatus for interfacing electronic packages and test equipment |
| 07/07/2005 | US20050146339 Method of manufacturing a probe card |
| 07/07/2005 | US20050146338 Ultra-short low-force vertical probe test head and method |
| 07/07/2005 | US20050146337 Method of manufacturing and testing semiconductor device using assembly substrate |
| 07/07/2005 | US20050146336 Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 07/07/2005 | US20050146318 Digital multi-meter with operational error prevention technology |
| 07/07/2005 | US20050146047 Method for fabricating a semiconductor interconnect having conductive spring contacts |
| 07/07/2005 | US20050146046 Method for making probes for atomic force microscopy |
| 07/07/2005 | US20050145842 Socket for testing a semiconductor device and a connecting sheet used for the same |
| 07/07/2005 | DE10392823T5 Steckverbindung, Befestigungsvorrichtung für elektronische Komponenten und Tester Plug-in connection, fastening device for electronic components and Tester |
| 07/07/2005 | DE10392441T5 Eine miniaturisierte Kontaktfeder A miniaturized contact spring |
| 07/06/2005 | EP1550875A1 Apparatus and method for controlling insertion of a module |
| 07/06/2005 | EP1549962A2 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 07/06/2005 | EP1549961A1 Test head positioning apparatus |
| 07/06/2005 | EP1210208A4 Membrane probing system |
| 07/06/2005 | CN2708325Y Ammeter having audible and visible alarm |
| 07/06/2005 | CN1636142A Contact actuator with contact force controlling mechanism |
| 07/06/2005 | CN1209806C Contactor for testing small device and parts |
| 07/06/2005 | CN1209804C Spiral contactor and manufacturing method thereof, semiconductor detection apparatus using same and electronic element |
| 07/06/2005 | CN1209632C Printed circuit board test apparatus and method |
| 07/05/2005 | US6914467 Dual edge programmable delay unit |
| 07/05/2005 | US6914446 Chip tester having a heat-exchanger with an extendable period of operation |
| 07/05/2005 | US6914445 Modular socket for testing an integrated circuit |
| 07/05/2005 | US6914444 Semiconductor device test method and semiconductor device tester |
| 07/05/2005 | US6914441 Detection of defects in patterned substrates |