Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
08/2005
08/17/2005EP1488245A4 Apparatus for interfacing electronic packages and test equipment
08/17/2005EP1485700A4 Battery monitoring method and apparatus
08/17/2005EP1221056B1 Sensor for detecting high-frequency oscillations of an electrical voltage and an arrangement of such a sensor
08/17/2005EP1137950B1 Voltage sensor
08/17/2005EP0859686B1 Fabricating interconnects and tips using sacrificial substrates
08/17/2005CN2718586Y Probe assembly structure in detecting apparatus of electronic and test industry
08/17/2005CN2718585Y Special spring for electronic and test industry
08/17/2005CN2718584Y Testing device for testing determined panel
08/17/2005CN2718583Y Detecting constructional element
08/17/2005CN1654964A Contact film probe and manufacturing method thereof
08/16/2005US6931620 Inspection method and inspection system using charged particle beam
08/16/2005US6930498 Membrane probing system
08/16/2005US6930497 Flexible multi-layered probe for measuring a signal from an object
08/16/2005US6930496 Range resistors for AC-DC transfer measurements
08/16/2005US6929486 Socket for electrical parts and method for using the same
08/11/2005WO2005074328A1 Organic el panel
08/11/2005WO2005072438A2 Multi-signal single beam probe
08/11/2005WO2005072406A2 Test system and method for reduced index time
08/11/2005US20050176282 Connector for a measurement element in a battery sensor
08/11/2005US20050174808 Quick attachment fixture and power card for diode-based light devices
08/11/2005US20050174136 Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomer
08/11/2005US20050174134 Method and apparatus for testing bumped die
08/11/2005US20050174130 Spatially resolved electromagnetic property measurement
08/11/2005US20050174105 Testing apparatus
08/11/2005US20050173790 Protective structures for bond wires
08/11/2005DE102005001180A1 Einpoliger Spannungsdetektor, insbesondere für oberirdische elektrische Leitung Single-pole voltage detector, in particular for overhead electrical line
08/10/2005EP0839322B1 Microelectronic contact structure and method of making same
08/10/2005CN2717065Y Socket for conducting apparatus
08/10/2005CN1653340A High performance probe system for testing semiconductor wafers
08/10/2005CN1652052A Method for compensating deviation of test temperature
08/10/2005CN1214493C Telescopic pin-socket coupling structure for signal coupler
08/10/2005CN1214250C Apparatus and method for testing non-componented printed circuit boards
08/10/2005CN1214249C Test needle for raster-matching adapter for printed circuit boards testing device
08/10/2005CN1214248C Mechanism for clamping device interface board to peripheral
08/09/2005US6927598 Test probe for electrical devices having low or no wedge depression
08/09/2005US6927593 System for testing semiconductor die on multiple semiconductor wafers
08/09/2005US6927589 Apparatus for testing bumped die
08/09/2005US6927588 Ball alignment plate testing apparatus and method for testing semiconductor chips
08/09/2005US6927586 Temperature compensated vertical pin probing device
08/09/2005US6927585 Membrane probing system with local contact scrub
08/09/2005US6927579 Parallel arc fault diagnostic for aircraft wiring
08/09/2005US6927343 Contactor for testing miniaturized devices and components
08/09/2005US6927332 Flexible test cable
08/09/2005US6927078 Method of measuring contact resistance of probe and method of testing semiconductor device
08/09/2005US6925706 Index head in semiconductor device test handler
08/09/2005US6925699 Method of producing a quantity of integrated circuits
08/04/2005WO2005070143A2 Radio frequency identification tag inlay sortation and assembly
08/04/2005US20050170689 Socket and/or adapter device for testing semi-conductor components, and an apparatus and process for loading a socket and/or adapter device with a corresponding semi-conductor component
08/04/2005US20050168233 Test system and method for reduced index time
08/04/2005US20050168232 Probing method and prober
08/04/2005US20050168230 Cap at resistors of electrical test probe
08/04/2005US20050167899 Wafer scale thermal stress fixture and method
08/04/2005US20050167816 Method for making a socket to perform testing on integrated circuits
08/04/2005CA2553203A1 Radio frequency identification tag inlay sortation and assembly
08/03/2005EP1559116A2 Probe station with low noise characteristics
08/03/2005CN2715341Y 探针卡 Probe Card
08/03/2005CN2715164Y High tension transmission line insulator leakage current collecting ring
08/03/2005CN1650181A Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method
08/03/2005CN1650179A Electronic device test system
08/03/2005CN1650176A Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board
08/03/2005CN1648674A Integrated printed circuit board and test contactor for high speed semiconductor testing
08/03/2005CN1213469C Apparatus and method for contact failure inspection in semiconductor devices
08/03/2005CN1213306C Radio-frequency power sensor using capacitance to measure radio frequency signal power
08/02/2005US6924656 Method and apparatus for testing BGA-type semiconductor devices
08/02/2005US6924654 Structures for testing circuits and methods for fabricating the structures
08/02/2005US6924653 Selectively configurable microelectronic probes
07/2005
07/28/2005WO2005069447A1 Electrical connector
07/28/2005WO2005069019A1 Probe guard
07/28/2005WO2005069018A1 Electric connecting device and contactor
07/28/2005WO2005040836A3 Isolation buffers with controlled equal time delays
07/28/2005US20050164428 Flip chip packaging process employing improved probe tip design
07/28/2005US20050164416 Method for processing an integrated circuit
07/28/2005US20050162179 Probe with trapezoidal contactor and device based on application thereof, and method of producing them
07/28/2005US20050162177 Multi-signal single beam probe
07/28/2005US20050162152 Test socket
07/28/2005US20050162151 Device transfer mechanism for a test handler
07/28/2005US20050162147 High bandwidth oscilloscope probe with replaceable cable
07/28/2005US20050161801 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
07/28/2005US20050161800 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet
07/28/2005US20050161256 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
07/28/2005DE19945176B4 Anordnung von Federkontakten in einem vorbestimmten Raster Arrangement of spring contacts in a predetermined grid
07/28/2005DE112004000029T5 Bauelementanschlussgerät Component lead device
07/28/2005DE102004034357A1 Prüfkarten Trägerelement Test cards support element
07/27/2005EP1557877A1 Probe device that controls temperature of object to be inspected and probe inspection method
07/27/2005EP1557679A2 High side current monitor
07/27/2005EP1557677A2 Electricity meter assembly
07/27/2005EP1556707A1 Contact probe with off-centered back-drilled aperture
07/27/2005EP1350119A4 Low cost, on-line corrosion monitor and smart corrosion probe
07/27/2005EP1181698B1 Current pick-up shoe with two assembly positions
07/27/2005CN2713630Y Coating structure for probe card
07/27/2005CN2713474Y Replaceable tool assembly structure for autotest packaging machine
07/27/2005CN1646924A Holder for conductive contact
07/27/2005CN1646923A Holder for conductive contact
07/27/2005CN1646922A Conductive contact
07/27/2005CN1645589A Probe guard
07/26/2005US6922069 Needle assembly of probe card
07/26/2005US6922068 Method for testing high power SMD type IC with method for making manual and automation test base
07/26/2005US6922048 Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents
07/26/2005US6920689 Method for making a socket to perform testing on integrated circuits
07/21/2005WO2005066644A1 Measurement connector for test device
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