Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/2005
09/09/2005WO2004092090A3 Temperature compensated vertical pin probing device
09/08/2005US20050194986 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof
09/08/2005US20050194983 Wafer probe station having a skirting component
09/08/2005US20050194963 Dual channel source measurement unit for semiconductor device testing
09/08/2005US20050194180 Compliant contact pin assembly, card system and methods thereof
09/08/2005DE4313816B4 Vorrichtung für die Handhabung von zu prüfenden elektronischen Leiterplatten, insbesondere in Fertigungslinien Apparatus for the handling of electronic circuit boards to be tested, in particular in production lines
09/08/2005DE19748823B4 Servicefreundliche Kontaktiervorrichtung Service friendly contactor
09/08/2005DE102004033646A1 Struktur und Verfahren zum Einbrenntesten für eine Packung Structure and method for burn-in testing for a pack
09/08/2005DE102004007851A1 Intelligent connector for battery, especially in vehicle, has measurement resistance integrated into connection device, 2 predefined contact points, between which measurement resistance lies and by which measurement circuit can be contacted
09/07/2005EP1570513A2 Microelectronic packaging and components
09/07/2005EP1570510A2 Fast localization of electrical failures on an integrated circuit system and method
09/07/2005EP1570279A1 Guarded tub enclosure
09/07/2005EP1570277A2 Method of making a socket to perform testing on integrated circuits and such a socket
09/07/2005EP1356307A4 Nickel alloy probe card frame laminate
09/07/2005EP0995996B1 Conductive contact
09/07/2005EP0925509B1 Probe structure having a plurality of discrete insulated probe tips
09/07/2005CN1665020A Multipurpose load plate
09/07/2005CN1665012A System for processing electronic devices
09/07/2005CN1665011A Multifunctional probe card
09/07/2005CN1664591A Exploration piece and its regeneration method
09/06/2005US6940298 High fidelity electrical probe
09/06/2005US6940270 Hand mounted testing meter
09/06/2005US6940266 Enhanced cost effective method for high current measurements
09/06/2005US6940093 Special contact points for accessing internal circuitry of an integrated circuit
09/06/2005US6939740 Method of fabricating an encapsulated semiconductor device with partly exposed leads
09/06/2005US6939474 Method for forming microelectronic spring structures on a substrate
09/06/2005US6939175 Coaxial cable for overvoltage protection
09/06/2005US6939145 Spring element for use in an apparatus for attaching to a semiconductor and a method of making
09/06/2005US6939142 Semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece
09/06/2005US6938338 Method of making an electronic contact
09/01/2005WO2005080996A1 Adapter for circuit board examination and device for circuit board examination
09/01/2005US20050193291 Application functionality for a test tool for application programming interfaces
09/01/2005US20050191952 Cleaning sheet for probe needles
09/01/2005US20050191876 Spring element for use in an apparatus for attaching to a semiconductor and a method of making
09/01/2005US20050191472 Laser welding of resin members using a ridge for enhancing weld strength
09/01/2005US20050189957 Integrated circuit temperature sensing device and method
09/01/2005US20050189956 Electronic components with plurality of contoured microelectronic spring contacts
09/01/2005US20050189955 Semiconductor device test probe having improved tip portion
09/01/2005US20050189540 Module inspection fixture
09/01/2005DE102004007696A1 Testvorrichtung zum Prüfen eines Halbleiterbauteils mit Kontaktflächen auf seiner Oberseite und seiner Unterseite und Verfahren zum Prüfen des Halbleiterbauteils Test apparatus for testing a semiconductor device with contact areas on its top and bottom and method for testing the semiconductor device
09/01/2005DE102004006298A1 Verbindungsanordnung für ein Messelement eines Batteriesensors Connection arrangement for a sensing element of a battery sensor
08/2005
08/31/2005EP1569003A1 Measuring device
08/31/2005EP1569000A2 Probe card
08/31/2005EP1568470A2 Laser welding of resin members using a ridge for enhancing weld strength
08/31/2005CN2722254Y Testing needle structural improvement of base board detection
08/31/2005CN1662822A System for burn-in testing of electronic devices
08/31/2005CN1662821A Placing table drive device and probe method
08/31/2005CN1662820A Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
08/31/2005CN1662819A Test method for yielding a known good die
08/31/2005CN1661376A 探针卡 Probe Card
08/31/2005CN1661375A 探针卡 Probe Card
08/31/2005CN1660559A Laser welding of resin members using a ridge for enhancing weld strength
08/31/2005CN1217197C Probe card for LCD detection
08/31/2005CN1217196C Sensitive detector for automatically regulating band width of oscillograph and method of detecting
08/30/2005US6937045 Shielded integrated circuit probe
08/30/2005US6937044 Bare die carrier
08/30/2005US6937043 Apparatus and method for testing electronic component
08/30/2005US6937042 Contact probe and probe device
08/30/2005US6937041 Method for manufacturing a substrate and a display device
08/30/2005US6937040 Probe module and a testing apparatus
08/30/2005US6937039 Tip and tip assembly for a signal probe
08/30/2005US6937038 Contactor having conductive particles in a hole as a contact electrode
08/30/2005US6937037 Probe card assembly for contacting a device with raised contact elements
08/30/2005US6937036 Interface device an interface between testing equipment and an integrated circuit
08/25/2005WO2005078460A1 Device and method for testing a semi-conductor component having contact surfaces on both sides
08/25/2005WO2005078459A1 Quick attachment fixture and power card for diode-based light devices
08/25/2005US20050184749 Control system and method of semiconductor inspection system
08/25/2005US20050184747 Spring plunger probe
08/25/2005US20050184745 Probe card
08/25/2005US20050184744 Wafer probe station having a skirting component
08/25/2005US20050184743 Probe card
08/25/2005US20050184722 Clamp meter with dual display
08/24/2005EP1566642A1 Probe card
08/24/2005EP1566641A1 Clamp meter with dual display
08/24/2005EP1565757A2 Probe array and method of its manufacture
08/24/2005CN2720669Y Crimp conductive terminal
08/24/2005CN1659745A Connector, electronic component fixing device, and tester
08/24/2005CN1659442A Device and method of testing an electronic component
08/24/2005CN1657952A Clamp meter with dual display
08/24/2005CN1657949A Integral probe card and assembling mode
08/24/2005CN1216293C Probe device
08/23/2005US6933740 Electronic circuit inspection sensor and inspection system using same
08/23/2005US6933738 Fiducial alignment marks on microelectronic spring contacts
08/23/2005US6933737 Probe card
08/23/2005US6933736 Prober
08/23/2005US6933713 High bandwidth oscilloscope probe with replaceable cable
08/23/2005US6932635 Electronic component testing socket and electronic component testing apparatus using the same
08/20/2005CA2489228A1 Clamp meter with dual display
08/18/2005WO2005076024A1 See-saw interconnect assembly with dielectric carrier grid providing spring suspension
08/18/2005WO2005076023A1 Test equipment
08/18/2005WO2005076018A1 Needle-like member, conductive contact, and conductive contact unit
08/18/2005WO2005075966A1 Apparatus for measuring work functions of materials
08/18/2005WO2005074661A2 Rf sensor clamp assembly
08/18/2005US20050182585 Structure and method for package burn-in testing
08/18/2005US20050181656 Socket for electrical parts
08/18/2005US20050179457 Burn-in test apparatus for BGA packages using forced heat exhaust
08/18/2005US20050179456 High density cantilevered probe for electronic devices
08/18/2005US20050179454 Probes with perpendicularly disposed spring pins, and methods of making and using same
08/18/2005DE10297763T5 Prüfgerät für elektronische Bauelemente An electronic component tester
08/18/2005DE102004002360A1 Measurement fuse for a measurement instrument comprises a meltable fuse connected in series with a measurement resistance across which a measurement instrument is connected
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