| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 10/04/2005 | US6952093 Adaptive small-signal compensation for switching regulators |
| 10/01/2005 | CA2463061A1 System and method for reading power meters |
| 09/29/2005 | WO2005091006A1 Probe device capable of being used for plural kinds of testers |
| 09/29/2005 | WO2005091000A1 Contact probe for a testing head |
| 09/29/2005 | WO2005090999A1 A watt hour meter box with plurality of meters therein |
| 09/29/2005 | US20050215086 Sheet-form connector and production method and application therefor |
| 09/29/2005 | US20050215081 Method and apparatus for testing PCBA subcomponents |
| 09/29/2005 | US20050212545 Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
| 09/29/2005 | US20050212544 Performance board and testing system |
| 09/29/2005 | US20050212541 Test probe |
| 09/29/2005 | US20050212540 Probe card and method for constructing same |
| 09/29/2005 | US20050212539 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 09/29/2005 | US20050212521 Electronic battery tester or charger with databus connection |
| 09/29/2005 | US20050211381 RF sensor clamp assembly |
| 09/29/2005 | US20050210665 Tray for storing and transporting semi-conductor and other microelectronic components |
| 09/29/2005 | US20050210650 System and method for disassembling scrapped vehicle |
| 09/29/2005 | DE20320996U1 Probing apparatus for measuring electrical characteristics of integrated circuit, has signal contact tip for selective engagement with signal contact pad of device under test and coupled to impedance matching resistor |
| 09/29/2005 | DE102004042719A1 Current sensor has measurement resistance made as narrower length or meander integrated in same material as conductor |
| 09/29/2005 | DE102004035343A1 Contacting card for use in testing integrated circuits, has a substrate carrier with contacts matching those of a wafer substrate to be tested and connects from these contacts to a testing device |
| 09/29/2005 | DE102004012371A1 Adaptervorrichtung zum Prüfen von elektrischen Verbrauchern, insbesondere für oder in einem Kraftfahrzeug Adapter device for testing electrical loads, particularly for or in a motor vehicle |
| 09/29/2005 | DE10118051B4 Batterienmessklemme mit Fremdstartstützpunkt Batteries measuring terminal with jump-starting base |
| 09/28/2005 | EP1580565A2 Flexible test cable |
| 09/28/2005 | EP1580562A1 Contact probe for a testing head |
| 09/28/2005 | EP1579225A2 Microelectronic contact structure |
| 09/28/2005 | EP1451594B1 Test probe for a finger tester and corresponding finger tester |
| 09/28/2005 | EP0886894B1 Contact carriers for populating substrates with spring contacts |
| 09/28/2005 | CN2729733Y Pendulum type checking apparatus |
| 09/28/2005 | CN1675757A Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method |
| 09/28/2005 | CN1675756A Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 09/28/2005 | CN1675755A Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method |
| 09/28/2005 | CN1673759A Flexible test cable |
| 09/28/2005 | CN1673019A System and method for disassembling scrapped vehicle |
| 09/27/2005 | US6949943 Method for in-line testing of flip-chip semiconductor assemblies |
| 09/27/2005 | US6949919 Unbreakable micro-browser |
| 09/27/2005 | US6948941 Interconnect assemblies and methods |
| 09/27/2005 | US6948940 Helical microelectronic contact and method for fabricating same |
| 09/22/2005 | WO2005088320A1 Adapter device for testing electrical consumers, in particular for or in a motor vehicle |
| 09/22/2005 | WO2005086722A2 Optical current sensor with flux concentrator and method of attachment for non-circular conductors |
| 09/22/2005 | US20050209810 Measuring instrument with sensors |
| 09/22/2005 | US20050208796 Spiral contactor, contact sheet having spiral contactor, and connecting device having contact sheet |
| 09/22/2005 | US20050206401 Test sockets, test systems, and methods for testing microfeature devices |
| 09/22/2005 | US20050206399 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 09/22/2005 | US20050206398 Test probe for finger tester and corresponding finger tester |
| 09/22/2005 | US20050206397 Probe card cooling assembly with direct cooling of active electronic components |
| 09/22/2005 | US20050206396 Vacuum prober and vacuum probe method |
| 09/22/2005 | US20050206395 Probe tile for probing semiconductor wafer |
| 09/22/2005 | US20050206387 Device for measuring an electrical quantity of a storage battery |
| 09/22/2005 | US20050206368 Burn-in testing apparatus and method |
| 09/22/2005 | US20050206367 Automatic range finder for electric current testing |
| 09/22/2005 | US20050205865 IC testing apparatus and methods |
| 09/22/2005 | US20050205728 Meter stand |
| 09/22/2005 | DE19837138B4 Prüfkarte zum Prüfen von Chips mit integrierten Schaltungen Probe card for testing integrated circuit chips |
| 09/22/2005 | DE19821194B4 Halbleiterbauelement-Testgerät The semiconductor device testing apparatus |
| 09/22/2005 | DE19709687B4 Elektrisches oder elektronisches Gerät und Leiterplatte für ein solches Gerät Electrical or electronic device and printed circuit board for such a device |
| 09/21/2005 | EP1577676A1 Method and circuit for the protection of test contactors in high current measurements of semiconductor components |
| 09/21/2005 | EP1576378A2 Composite motion probing |
| 09/21/2005 | EP1102999B1 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
| 09/21/2005 | CN2727991Y Special purpose clamp for polymer battery charging/discharging detector |
| 09/21/2005 | CN2727746Y Ball-type grating array movable testing stand |
| 09/21/2005 | CN2727745Y Novel magnetoelectric meter type inner-magnetism measuring mechanism |
| 09/21/2005 | CN1672057A Method of making microelectronic spring contact array |
| 09/21/2005 | CN1672056A Probe for testing electric conduction |
| 09/21/2005 | CN1671009A Spiral contactor, contact sheet and connecting device |
| 09/21/2005 | CN1670540A Electric signal connecting device, probe assembly and detector using the same |
| 09/21/2005 | CN1220068C Dry load test apparatus |
| 09/21/2005 | CN1220063C Integrated block on-line measuring apparatus |
| 09/20/2005 | US6947291 Photolithographically-patterned out-of-plane coil structures and method of making |
| 09/20/2005 | US6946861 Circuit board testing jig |
| 09/20/2005 | US6946859 Probe structures using clamped substrates with compliant interconnectors |
| 09/20/2005 | US6946850 Method and apparatus for filtering unwanted noise while amplifying a desired signal |
| 09/20/2005 | US6946378 Methods for fabricating protective structures for bond wires |
| 09/20/2005 | US6946375 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 09/20/2005 | US6945827 Microelectronic contact structure |
| 09/15/2005 | WO2005085877A1 Probe and probe manufacturing method |
| 09/15/2005 | WO2005084328A2 Burn-in testing apparatus and method |
| 09/15/2005 | WO2005006784A3 Interface device for testing telecommunication circuits |
| 09/15/2005 | US20050202716 Insert and electronic component handling apparatus provided with the same |
| 09/15/2005 | US20050202576 Compliant contact structures, contactor cards and test system including same, and methods of fabrication and use |
| 09/15/2005 | US20050200841 Detection of defects in patterned substrates |
| 09/15/2005 | US20050199744 Opaque aerosol container capacity indicator |
| 09/15/2005 | DE10393364T5 Lochmikrosonde unter Nutzung einer MEMS-Technik und ein Verfahren zur Herstellung derselben Hollow microprobe using an MEMS technique and a method of manufacturing the same |
| 09/15/2005 | DE102005009588A1 Multi-function measurement meter or instrument has extra warning light indicators for indicating when certain measurement sockets have been connected to, to help prevent incorrect connections being made |
| 09/15/2005 | CA2557600A1 Burn-in testing apparatus and method |
| 09/14/2005 | EP1574866A1 Inspection method and inspection equipment |
| 09/14/2005 | EP1042681B1 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 09/14/2005 | CN2725898Y Adapting probe for measurer of printed circuitboard |
| 09/14/2005 | CN1668932A Method and test adapter for testing an appliance having a smart card reader |
| 09/14/2005 | CN1668931A Probe card for testing integrated circuits |
| 09/14/2005 | CN1668929A Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 09/14/2005 | CN1668928A Fiducial alignment mark on microelectronic spring contact |
| 09/14/2005 | CN1667422A Coaxial input adapter for giga hertz transverse electromagnetic wave cell |
| 09/14/2005 | CN1667368A Measuring instrument with sensors |
| 09/13/2005 | US6943149 Thrombosis, restenosis, hypertension, heart failure, arrhy-thmia, inflammation, angina, stroke, atherosclerosis, cancer, ischemic conditions, angiogenesis related disorders, neuro-degenerative disorders |
| 09/13/2005 | US6943043 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 09/13/2005 | US6942497 Socket assembly for test of integrated circuit, and its integrated circuit and tester |
| 09/13/2005 | US6942493 Connector structure for connecting electronic parts |
| 09/09/2005 | WO2005083843A1 Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomer |
| 09/09/2005 | WO2005083773A1 Probe card, and method of producing the same |
| 09/09/2005 | WO2005083453A1 Circuit substrate inspection device and circuit substrate inspection method |
| 09/09/2005 | WO2004099792A3 Planarizing and testing of bga packages |