Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/2005
10/20/2005US20050231223 Membrane probing system with local contact scrub
10/20/2005US20050231222 Wafer probing that conditions devices for flip-chip bonding
10/20/2005US20050231221 Contact spring and socket combination for high bandwidth probe tips
10/20/2005US20050231220 Terminal of IC test fixture
10/20/2005US20050231205 Scan tool for electronic battery tester
10/20/2005US20050231187 Method and structure for variable pitch microwave probe assembly
10/20/2005US20050230825 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer
10/20/2005US20050230811 Compliant contact pin assembly and card system
10/20/2005US20050230810 Compliant contact pin assembly and card system
10/20/2005US20050230809 Compliant contact pin assembly and card system
10/20/2005US20050230622 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
10/20/2005US20050229393 Methods of forming a contact pin assembly
10/19/2005CN2735356Y Double-probe 3D micromotion coupling test bench for optoelectronic device die
10/19/2005CN2735350Y Energy-saving type watt-hour meter with wide load range
10/19/2005CN2735348Y Improved structure for printed circuit board test device
10/19/2005CN2735347Y Improved structure for printed circuit board test device
10/19/2005CN2735346Y Earthing structure of circuit board test device
10/19/2005CN2735345Y Circuit board assistant testing component and circuit board having the component
10/19/2005CN2735344Y Circuit board assistant testing component and circuit board having the component
10/19/2005CN1685493A A hollow microprobe using a mems technique and a method of manufacturing the same
10/19/2005CN1685240A Anisotropic conductive sheet and probe for measuring impedances
10/19/2005CN1685239A Rf芯片测试方法和系统 Rf chip testing method and system
10/19/2005CN1683933A Probe element and its test card
10/19/2005CN1224137C Electric resistance measuring connector and measuring device and measuring method for circuit board electric resistance
10/19/2005CN1223915C Carrier, system for testing computer and/or software installation
10/19/2005CN1223863C Planarizing interposer
10/18/2005US6957405 Methods for manufacturing an electronic device having an electronically determined physical test member
10/18/2005US6957005 Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components
10/18/2005US6956727 High side current monitor with extended voltage range
10/18/2005US6956448 Electromagnetic energy probe with integral impedance matching
10/18/2005US6956390 Method and apparatus for verifying temperature during integrated circuit thermal testing
10/18/2005US6956389 Highly resilient cantilever spring probe for testing ICs
10/18/2005US6956388 Multiple two axis floating probe assembly using split probe block
10/18/2005US6956387 Socket connection test modules and methods of using the same
10/18/2005US6956386 Micro-cantilever type probe card
10/18/2005US6956362 Modular active test probe and removable tip module therefor
10/18/2005US6956174 Tip structures
10/18/2005US6955870 Method of manufacturing a semiconductor device
10/13/2005WO2005096441A1 Cable terminal with air-enhanced contact pins
10/13/2005WO2005096368A1 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
10/13/2005WO2005096000A1 System and method for reading power meters
10/13/2005WO2005095999A1 Inspection block
10/13/2005WO2005094482A2 Tray for storing and transporting semi-conductor and other microelectronic components
10/13/2005US20050227512 Kelvin contact module for a microcircuit test system
10/13/2005US20050227510 Small array contact with precision working range
10/13/2005US20050227383 Manufacturing method of semiconductor integrated circuit device and probe card
10/13/2005US20050225347 Wireless test cassette
10/13/2005US20050225346 Cooling fin connected to a cooling unit and a pusher of the testing apparatus
10/13/2005US20050225345 Method of testing semiconductor wafers with non-penetrating probes
10/13/2005US20050225344 Interconnect having spring contacts
10/13/2005US20050225343 Device and method of testing an electronic component
10/13/2005US20050225342 Method of manufacturing a semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece
10/13/2005US20050225341 Method to prevent damage to probe card
10/13/2005US20050225339 Double side probing of semiconductor devices
10/13/2005US20050225337 Contact system for wafer level testing
10/13/2005US20050225336 Probe card and method for manufacturing probe card
10/13/2005US20050225315 Socket cover and test interface
10/13/2005US20050225313 Holder for conductive contact
10/13/2005US20050225312 Galvanometer
10/13/2005DE10393724T5 Prüfkopf für kombinierte Signale Probe for combined signals
10/13/2005DE102004013665A1 CT-adapter (in-circuit test) for testing computer mother boards using a UV light radiator instead of needles with contact-free current transfer from the signal transmitter in the adapter to the board under test
10/13/2005DE102004013659A1 Vorrichtung zum Erfassen einer elektrischen Größe eines Akkumulators A device for detecting an electrical quantity of an accumulator
10/12/2005EP1585374A1 Circuit board checker and circuit board checking method
10/12/2005EP1584934A1 Device for releasable connecting an interface to a test equipment
10/12/2005EP1584932A1 Method of testing semiconductor wafers with non-penetrating probes
10/12/2005EP1583975A1 Universal-messadapter-system
10/12/2005EP1293016B1 Electrically shielded connector
10/12/2005CN2733363Y Electronic component and circuit and circuit board detecting device
10/12/2005CN2733362Y Pushing device of electric crystal test module
10/12/2005CN1682118A Die carrier
10/12/2005CN1682117A Interface comprising a thin PCB with protrusions for testing an integrated circuit
10/12/2005CN1681106A Manufacturing method of semiconductor integrated circuit device and probe card
10/12/2005CN1681101A Detecting head of tester
10/12/2005CN1222778C Phase detector
10/12/2005CN1222776C Probe card and method of producing the same
10/12/2005CN1222775C Test systems for wireless-communications devices
10/11/2005US6954081 Method for in-line testing of flip-chip semiconductor assemblies
10/11/2005US6953893 Circuit board for connecting an integrated circuit to a support and IC BGA package using same
10/11/2005US6953700 Method for in-line testing of flip-chip semiconductor assemblies
10/11/2005US6953699 Method for in-line testing of flip-chip semiconductor assemblies
10/11/2005US6953519 making a cantilever using lithographic techniques and forming microscopic electrodes at a distal end of the cantilever by sputtering and gas-assisted etching processing using a focused charge particle beam
10/11/2005US6953348 IC socket
10/06/2005WO2005093442A1 Method for manufacturing semiconductor integrated circuit device
10/06/2005WO2005093437A1 Electric characteristic measurement method and electric characteristic measurement device
10/06/2005WO2005091962A2 Dual channel source measurement unit for semiconductor device testing
10/06/2005WO2005091916A2 Flexible microcircuit space transformer assembly
10/06/2005US20050222784 System and method for reading power meters
10/06/2005US20050221654 Battery pack-cordless power device interface system
10/06/2005US20050218926 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate
10/06/2005US20050218902 Battery test module
10/06/2005US20050218868 Battery pack - cordless power device interface system
10/06/2005US20050218867 Battery pack - cordless power device interface system
10/06/2005US20050218429 Flexible microcircuit space transformer assembly
10/06/2005US20050217885 Circuit board for connecting an integrated circuit to a support and ic bga package using same
10/06/2005DE10205115B4 Kopplungsvorrichtung für Platinen Coupling device for boards
10/06/2005DE102005005489A1 Needle probe, for testing micro-electronic and micro-mechanical components e.g. in a wafer strip, has a longitudinal arm of a non- or semi-conductive material with a downward metal point at the free end
10/05/2005EP1583406A2 Interconnect assembly for printed circuit boards
10/05/2005CN2731455Y Gas generating simulator for coal layer
10/04/2005US6952110 Testing apparatus for carrying out inspection of a semiconductor device
10/04/2005US6952109 Selectively configurable probe structures, e.g., for testing microelectronic components
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