Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/2005
11/16/2005EP1596204A1 Electrical testing facility
11/16/2005EP1108216A4 High resolution analytical probe station
11/16/2005CN2741054Y Rocorder for sum of electric charge
11/16/2005CN1698183A Probe pin zero-point detecting method and probe device
11/16/2005CN1697978A Device interface unit
11/16/2005CN1697977A Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device
11/16/2005CN1696710A Detection device
11/16/2005CN1696709A 接触探针 The touch probe
11/16/2005CN1696708A Electrical test device
11/15/2005US6965246 Burn-in socket assembly
11/15/2005US6965245 Prefabricated and attached interconnect structure
11/15/2005US6965244 High performance probe system
11/15/2005US6965226 Chuck for holding a device under test
11/10/2005WO2005106512A1 Manual test device
11/10/2005WO2005106504A1 Electric connecting device
11/10/2005US20050250376 Interface test system
11/10/2005US20050248359 Membrane probing system
11/10/2005US20050248005 Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents
11/10/2005US20050247755 Probe attach tool
11/10/2005DE10118027B4 Batteriemessklemme mit Fremdstartstützpunkt und integrierter Meßsensorik Battery measuring terminal with jump-starting base and integrated measuring sensor
11/09/2005EP1593975A1 Electricity meter assembly
11/09/2005EP1593974A1 Electricity meter assembly
11/09/2005EP1593972A1 Electricity meter assembly
11/09/2005EP1364221A4 Planarizing interposer
11/09/2005EP1305643B1 Signal measurement
11/09/2005CN2739644Y IC measuring switch board
11/09/2005CN1695238A Probe method, prober, and electrode reducing/plasma-etching processing mechanism
11/09/2005CN1693904A Self-control electric limit type single-phase watt-hour meter
11/09/2005CN1693903A Contact probe, method of manufacturing the contact probe, and device and method for inspection
11/09/2005CN1693902A Detection device
11/09/2005CN1226632C Conductive contact unit
11/08/2005US6963210 Various electrical characteristics and small test point testing module
11/08/2005US6963208 Probe device, probe card channel information creation program, and probe card information creation device
11/08/2005US6963207 Apparatus and method for terminating probe apparatus of semiconductor wafer
11/08/2005US6963198 Signal detection contactor and signal correcting system
11/08/2005US6963195 Apparatus for sensing current
11/08/2005US6963127 Protective structures for bond wires
11/08/2005US6962826 Method for in-line testing of flip-chip semiconductor assemblies
11/03/2005WO2005103740A2 Intelligent probe card architecture
11/03/2005WO2005103735A1 Sheet-shaped probe, manufacturing method thereof and application thereof
11/03/2005WO2005103734A1 Sheet-like probe, method of producing the probe, and application of the probe
11/03/2005WO2005103733A1 Sheet-like probe, method of producing the probe, and application of the probe
11/03/2005WO2005103732A1 Sheet-shaped probe, manufacturing method thereof and application thereof
11/03/2005WO2005103731A1 Sheet-shaped probe, manufacturing method thereof and application thereof
11/03/2005WO2005103730A1 Sheet-like probe, method of producing the probe, and application of the probe
11/03/2005WO2005103729A1 Rewiring substrate strip with several semiconductor component positions
11/03/2005WO2005043594A3 Method for forming photo-defined micro electrical contacts
11/03/2005US20050243523 Shock absorber means for components and cards
11/03/2005US20050242801 Unbreakable micro-browser
11/03/2005US20050241175 Method and apparatus for removing and/or preventing surface contamination of a probe
11/03/2005DE4223658B4 Testvorrichtung für Halbleiter-Chips Test apparatus for semiconductor chips
11/02/2005EP1592057A2 Method and apparatus for removing and/or preventing surface contamination of a probe
11/02/2005EP1591351A1 Electric inspection device of cockpit module assembly for vehicle
11/02/2005CN2738254Y Waterproof voltmeter case
11/02/2005CN1692283A Sheet-form connector and production method and application therefor
11/02/2005CN1690717A IC detection device
11/01/2005US6961670 Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis
11/01/2005US6960924 Electrical contact
11/01/2005US6960923 Probe card covering system and method
11/01/2005US6960919 Measurement connector for test device
11/01/2005US6960765 Probe driving method, and probe apparatus
11/01/2005US6960123 Cleaning sheet for probe needles
11/01/2005US6960092 Compression mount and zero insertion force socket for IC devices
11/01/2005US6959481 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
10/2005
10/27/2005WO2005101041A1 Socket cover and test interface
10/27/2005WO2005101039A1 Inspection unit
10/27/2005WO2005101038A2 Wireless test cassette
10/27/2005US20050237078 Compliant micro-browser for a hand held probe
10/27/2005US20050237077 Method for testing using a universal wafer carrier for wafer level die burn-in
10/27/2005US20050237076 Method for testing using a universal wafer carrier for wafer level die burn-in
10/27/2005US20050237075 Method for testing using a universal wafer carrier for wafer level die burn-in
10/27/2005US20050237074 Structures for testing circuits and methods for fabricating the structures
10/27/2005US20050237073 Intelligent probe card architecture
10/27/2005US20050237072 Device for testing printed circuit boards
10/27/2005US20050237070 Conductive contact
10/27/2005US20050237069 Semiconductor device test method and semiconductor device tester
10/27/2005US20050237051 Optical current sensor with flux concentrator and method of attachment for non-circular conductors
10/27/2005US20050236717 System in-package test inspection apparatus and test inspection method
10/27/2005US20050236648 Inspection method and inspection system using charged particle beam
10/27/2005DE102005013270A1 Schaltungsplatine zum Verbinden einer integrierten Schaltung mit einem Träger und einem IC-BGA-Gehäuse, das dieselbe verwendet Circuit board for connecting an integrated circuit having a substrate and an IC BGA package, using the same
10/27/2005DE102004063248A1 System und Verfahren zum Zerlegen von Schrottfahrzeugen System and method for separating scrap vehicles
10/27/2005DE102004017191A1 Vorrichtung und Verfahren zur Ermittlung einer Richtung eines Objekts Apparatus and method for determining a direction of an object
10/26/2005EP1129510B1 Sharpened, oriented contact tip structures
10/26/2005EP0744033B1 An integrated resistor for sensing electrical parameters
10/26/2005CN1224680C Method for preparing emulsified fuel and implementing device
10/25/2005US6958618 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
10/25/2005US6958616 Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins
10/25/2005US6958598 Efficient switching architecture with reduced stub lengths
10/20/2005WO2005099043A2 Battery pack - cordless power device interface system
10/20/2005WO2005098462A2 Probe card and method for constructing same
10/20/2005WO2005098460A2 Double side probing of semiconductor devices
10/20/2005WO2005074661A3 Rf sensor clamp assembly
10/20/2005US20050233614 Test connector with metallic stiffener
10/20/2005US20050233612 Electrical connector
10/20/2005US20050233482 Method of making contact pin card system
10/20/2005US20050232479 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects
10/20/2005US20050231919 Semiconductor device socket
10/20/2005US20050231868 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device
10/20/2005US20050231226 Low-current probe card
10/20/2005US20050231224 Burn-in socket assembly
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