| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 12/06/2005 | US6971793 Test handler temperature monitoring system |
| 12/01/2005 | WO2005115069A1 Ic socket |
| 12/01/2005 | WO2005115068A2 High density interconnect system having rapid fabrication cycle |
| 12/01/2005 | WO2005114228A1 Laminated board and probe card |
| 12/01/2005 | US20050266734 Support member assembly for conductive contact members |
| 12/01/2005 | US20050266733 Attachable/detachable probing tip system for a measurement probing system |
| 12/01/2005 | US20050266690 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 12/01/2005 | US20050264373 Switching matrix and method for distinction of a connecting line |
| 12/01/2005 | US20050264315 Test device for electrical testing of a unit under test |
| 12/01/2005 | US20050264313 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
| 12/01/2005 | US20050264312 Test device for electrical testing of a unit under test, as well as a method for production of a test drive |
| 12/01/2005 | US20050264307 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method |
| 12/01/2005 | US20050264278 Device for releasable connecting an interface with a test equipment |
| 12/01/2005 | US20050264276 Attachable/detachable variable spacing probing tip system |
| 12/01/2005 | US20050262953 Hand-held probing adapter for a measurement probing system |
| 12/01/2005 | DE19919946B4 Verfahren, Vorrichtung und Messortreferenzquelle zum Erzeugen eines Signals mit einer programmierbaren Frequenz A method, apparatus and Messortreferenzquelle for generating a signal having a programmable frequency |
| 12/01/2005 | DE102004022128A1 Stromzählereinrichtung Current meter device |
| 12/01/2005 | DE102004022127A1 Stromzählereinrichtung Current meter device |
| 11/30/2005 | EP1600782A1 Testing device for electronic testing of a sample and and method for producing a device |
| 11/30/2005 | EP1600781A1 Device for the electrical test of a device under test |
| 11/30/2005 | EP1292834B1 Systems for testing integrated circuits |
| 11/30/2005 | CN2743839Y Vertical plug pin type electric parameter testing clamp |
| 11/30/2005 | CN2743838Y Embedded high-precision electric parameter detecting clamp |
| 11/30/2005 | CN1702470A Probe card for probing wafers with raised contact elements |
| 11/30/2005 | CN1702464A Attachable/detachable probing tip system for a measurement probing system |
| 11/30/2005 | CN1702463A Probe for high electric current |
| 11/30/2005 | CN1702462A Electrical detection facility |
| 11/30/2005 | CN1702461A Sampling electrical detection facility and method for manufacturing the same |
| 11/30/2005 | CN1229649C Re-locatable partial discharge transducer head |
| 11/29/2005 | USRE38894 Method and apparatus for testing integrated circuits |
| 11/29/2005 | US6970895 Programmable delay indexed data path register file for array processing |
| 11/29/2005 | US6970634 Fiber optic wafer probe |
| 11/29/2005 | US6970005 Multiple-chip probe and universal tester contact assemblage |
| 11/29/2005 | US6970001 Variable impedance test probe |
| 11/29/2005 | US6969976 Dynamic current limit adjustments |
| 11/29/2005 | US6969622 Anisotropically conductive connector, its manufacture method and probe member |
| 11/29/2005 | US6969266 Adapter for connecting a chip and a socker |
| 11/29/2005 | US6969262 IC socket |
| 11/29/2005 | US6968614 Method for positioning an electronic module having a contact column array into a template |
| 11/24/2005 | WO2005112218A1 Earthing and overvoltage protection arrangement |
| 11/24/2005 | WO2005111632A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 11/24/2005 | WO2005111631A1 Probe attach tool |
| 11/24/2005 | WO2005055369A3 Methods for making vertical electrical feed through structures |
| 11/24/2005 | US20050261861 Method and test adapter for testing an appliance having a smart card reader |
| 11/24/2005 | US20050258854 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device |
| 11/24/2005 | US20050258852 Plate with an indicator for discerning among pre-identified probe holes in the plate |
| 11/24/2005 | US20050258848 Selectively configurable probe strucutres, e.g., for testing microelectronic components |
| 11/24/2005 | US20050258847 Method of connecting probe pin to circuit board and method of manufacturing probe card |
| 11/24/2005 | US20050258846 Test board for high-frequency system level test |
| 11/24/2005 | US20050258845 Pad type wafer test apparatus |
| 11/24/2005 | US20050258844 Freely deflecting knee probe with controlled scrub motion |
| 11/24/2005 | US20050258843 Holder for conductive contanct |
| 11/24/2005 | US20050258835 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 11/24/2005 | US20050258820 Apparatus and method for the determination of a direction of an object |
| 11/24/2005 | US20050258816 Photoelectrocatalytic method and photoelectrochemical detector for electrochemical analysis |
| 11/24/2005 | DE102004022125A1 Stromzählereinrichtung Current meter device |
| 11/23/2005 | EP1407280B1 Method of manufacturing a probe card |
| 11/23/2005 | EP1322964B1 Electronic test head positioner |
| 11/23/2005 | CN2742448Y Signal quick collecting mechanism for printed circuit board detector |
| 11/23/2005 | CN2742447Y Printed circuit board test tool with telescopic regulating mechanism |
| 11/23/2005 | CN2742446Y Detecting clamp |
| 11/23/2005 | CN1700437A Test board for high-frequency system level test |
| 11/23/2005 | CN1700022A Method and system for generating testing pulse for driving tested electronic components |
| 11/23/2005 | CN1700021A Apparatus and method for isolating input channels in electronic testing instrument |
| 11/23/2005 | CN1700020A Test probe |
| 11/23/2005 | CN1228641C Nickel alloy probe card frame laminate |
| 11/23/2005 | CN1228639C Clamp for measuring current circulating in conductors |
| 11/23/2005 | CN1228638C 接触探针 The touch probe |
| 11/22/2005 | US6967557 Wafer test space transformer |
| 11/22/2005 | US6967556 High power space transformer |
| 11/22/2005 | US6967498 Apparatus and method for inspecting electronic circuits |
| 11/22/2005 | US6967493 Probe card and contactor of the same |
| 11/22/2005 | US6967492 Spring contact probe device for electrical testing |
| 11/22/2005 | US6967475 Device transfer mechanism for a test handler |
| 11/22/2005 | US6967473 Attachable/detachable variable spacing probing tip system |
| 11/22/2005 | US6967307 Method and process of contact to a heat softened solder ball array |
| 11/22/2005 | US6967113 Method for in-line testing of flip-chip semiconductor assemblies |
| 11/17/2005 | WO2005109450A1 Compliant electrical contact assembly |
| 11/17/2005 | US20050255796 Probe cleaning sheet and cleaning method |
| 11/17/2005 | US20050253762 Mobile electromagnetic compatibility (EMC) test laboratory |
| 11/17/2005 | US20050253620 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 11/17/2005 | US20050253619 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 11/17/2005 | US20050253618 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof |
| 11/17/2005 | US20050253614 Electrical connecting method |
| 11/17/2005 | US20050253613 Probe apparatus with optical length-measuring unit and probe testing method |
| 11/17/2005 | US20050253612 Apparatus and method for terminating probe apparatus of semiconductor wafer |
| 11/17/2005 | US20050253610 Test method for semiconductor components using anisotropic conductive polymer contact system |
| 11/17/2005 | US20050253608 Electrical test device |
| 11/17/2005 | US20050253607 Electric signal connecting device and probe assembly and probing device using the same |
| 11/17/2005 | US20050253605 Probe for high electric current |
| 11/17/2005 | US20050253604 Surrounding structure for a probe card |
| 11/17/2005 | US20050253603 Ultra-broadband differential voltage probes |
| 11/17/2005 | US20050253602 Resilient contact probe apparatus, methods of using and making, and resilient contact probes |
| 11/17/2005 | US20050253575 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 11/17/2005 | DE102004020187A1 Umverdrahtungssubstratstreifen mit mehreren Halbleiterbauteilpositionen Rewiring substrate having a plurality of semiconductor component positions |
| 11/17/2005 | DE10137128B4 Testvorrichtung zum Testen von Testobjekten und Verfahren zum Übermitteln eines Testsignals Test apparatus for testing of test objects and method for transmitting a test signal |
| 11/17/2005 | CA2564297A1 System and method for testing integrated circuits |
| 11/17/2005 | CA2564191A1 Compliant electrical contact assembly |
| 11/16/2005 | EP1596429A1 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 11/16/2005 | EP1596212A1 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof |