Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/2005
12/27/2005US6980064 Slide-screw tuner with single corrugated slug
12/27/2005US6980017 Test interconnect for bumped semiconductor components and method of fabrication
12/27/2005US6980015 Back side probing method and assembly
12/27/2005US6980014 Interposer and methods for fabricating same
12/27/2005US6980013 Probe card
12/27/2005US6980012 Wafer probe station for low-current measurements
12/27/2005US6979230 Light socket
12/27/2005US6979203 IC socket
12/22/2005WO2005122240A1 Silicon wafer for probe bonding and probe bonding method using thereof
12/22/2005WO2005121825A2 Test arrangement including anisotropic conductive film for testing power module
12/22/2005WO2005121824A2 Thermal optical chuck
12/22/2005WO2005121813A1 Improvements in or relating to probe cards
12/22/2005WO2005084328A3 Burn-in testing apparatus and method
12/22/2005WO2005060718A3 Cap at resistors of electrical test probe
12/22/2005WO2005043594B1 Method for forming photo-defined micro electrical contacts
12/22/2005US20050283325 Current sense resistor circuit with average kelvin sense features
12/22/2005US20050282410 Flexible contact-connection device
12/22/2005US20050280591 Antenna efficiency test device
12/22/2005US20050280590 Method and apparatus to control an antenna efficiency test device
12/22/2005US20050280433 Electrical test probes, methods of making, and methods of using
12/22/2005US20050280432 Test probe for semiconductor package
12/22/2005US20050280431 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
12/22/2005US20050280430 Test method for electronic modules using movable test contactors
12/22/2005US20050280429 Method and apparatus for magnetically achieving electrical continuity
12/22/2005US20050280428 Probe card and the production method
12/22/2005US20050280427 Apparatus for probing multiple integrated circuit devices
12/22/2005US20050279530 Compliant spring contacts, methods of making, and utilization as electrical contacts in probe card and flip-chip applications
12/22/2005DE102004036540A1 Current and voltage sensing component diagnosis unit for car safety components has compact ergonomic hand held housing with display, control button and probes
12/22/2005DE102004027887A1 Prüfeinrichtung zur elektrischen Prüfung eines Prüflings Test equipment for electrical testing a device under test
12/22/2005DE102004027886A1 Prüfeinrichtung zur elektrischen Prüfung eines Prüflings sowie Verfahren zur Herstellung einer Prüfeinrichtung Checking means for electrical testing of a test specimen as well as methods for preparing a test device
12/22/2005DE102004020349A1 Test adapter device for testing printed cards has a printed circuit board, pressure-conductive rubbers, a rigid contact pin and a test device system
12/21/2005EP1608040A1 Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method
12/21/2005EP1607753A1 Current sense resistor circuit with averaging kelvin sense features
12/21/2005EP1607751A1 Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board
12/21/2005EP1607750A1 Detachable probing tip for a measurement probing system
12/21/2005EP1607749A2 Test probe assembly for IC chips
12/20/2005US6977515 Method for forming photo-defined micro electrical contacts
12/20/2005US6977514 Probe structure
12/20/2005US6976852 Socket for electrical parts
12/15/2005WO2005119856A1 Contactor and electrical connector
12/15/2005WO2005119851A1 Terminal block and current sensor integration
12/15/2005WO2005101038A3 Wireless test cassette
12/15/2005WO2005043176A3 Probe testing structure
12/15/2005WO2004099630A8 Combination hand tool and electrical testing device
12/15/2005US20050277323 Mechanically reconfigurable vertical tester interface for IC probing
12/15/2005US20050275419 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
12/15/2005US20050275418 High density interconnect system having rapid fabrication cycle
12/15/2005US20050275417 Micro probe 2
12/15/2005US20050275099 Semiconductor apparatus and method of manufacturing semiconductor apparatus
12/15/2005US20050275084 Compliant contact pin assembly and card system
12/15/2005US20050275083 Compliant contact pin assembly and card system
12/15/2005DE102004063299A1 Halbleiterwaferprüfgerät und Sondenübertragungseinrichtung Halbleiterwaferprüfgerät and probe transmission device
12/15/2005DE102004026514A1 Fuel cell system has contact pin on printed circuit board for measuring cell voltage
12/15/2005DE10161755B4 Kontaktstift zum Testen mikroelektronischer Bauteile mit kugelförmigen Kontakten Pin for testing of microelectronic components with spherical contacts
12/14/2005EP1605588A2 Wide bandwidth attenuator input circuit for a measurement probe
12/14/2005EP1604217A1 Apparatus and method for cooling optically probed integrated circuits
12/14/2005EP1549962A4 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
12/14/2005CN2746401Y Electrical parameter test equipment
12/14/2005CN2746399Y Detection joint of radio-frequency coaxial connector
12/14/2005CN2746398Y Vacuum fixture
12/14/2005CN1708693A Test head positioning apparatus
12/14/2005CN1707272A Inspection apparatus
12/14/2005CN1231764C Conductive contact
12/13/2005US6975130 Techniques for controlling movement of a circuit board module along a card cage slot
12/13/2005US6975128 Electrical, high temperature test probe with conductive driven guard
12/13/2005US6975127 Planarizing and testing of BGA packages
12/13/2005US6975126 Contactor apparatus for semiconductor devices and a test method of semiconductor devices
12/13/2005US6975105 Side supports with adjustable center of gravity
12/13/2005US6975104 Clamp meter with dual display
12/13/2005US6975030 Silicon carbide contact for semiconductor components
12/13/2005US6974335 Interchangeable multi-form factor module socket
12/13/2005US6973722 Release height adjustment of stressy metal devices by annealing before and after release
12/08/2005WO2005116670A1 Circuit board inspecting apparatus and circuit board inspecting method
12/08/2005WO2005116667A1 Probe
12/08/2005WO2005116666A1 Socket for connecting ball-grid-array integrated circuit device to test circuit
12/08/2005US20050272282 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method
12/08/2005US20050272172 Method of temporarily securing a die to a burn-in carrier
12/08/2005US20050270135 Method of making photolithographically-patterned out-of-plane coil structures
12/08/2005US20050270057 Test arrangement including anisotropic conductive film for testing power module
12/08/2005US20050270056 Thermal optical chuck
12/08/2005US20050270045 Electrical contact
12/08/2005US20050270044 Contact probe for a testing head
12/08/2005US20050270043 Digital potentiometer with resistor binary weighting decoding
12/08/2005US20050270017 System and method for automatically comparing test points of a PCB
12/08/2005US20050269511 Probe driving method, and probe apparatus
12/08/2005DE102004023987A1 Elektrische Prüfeinrichtung Electrical test equipment
12/07/2005EP1602932A1 Arrangement of a measuring instrument with a family of sensors
12/07/2005EP1601979A2 Apparatus for making high-sensitivity measurements of various parameters, and sensors particularly useful in such apparatus
12/07/2005EP1274991A4 Current measuring apparatus for battery
12/07/2005EP0855037B1 Loaded board drop pin fixture
12/07/2005CN1230685C Test method and test seat making process for high-power surface mounted integrated circuit
12/06/2005US6973406 Apparatus and method for electrical testing of electrical circuits
12/06/2005US6972582 Apparatus and method for measuring semiconductor wafer electrical properties
12/06/2005US6972580 Selectively configurable probe structures, e.g., for testing microelectronic components
12/06/2005US6972578 Method and system for compensating thermally induced motion of probe cards
12/06/2005US6972573 Device and method for inspecting circuit board
12/06/2005US6972556 System and method for measuring the power consumed by a circuit on a printed circuit board
12/06/2005US6972552 Method for the precise measurement of dependency on amplitude and phase of a plurality of high frequency signals and a device for carrying out said method
12/06/2005US6972202 Method of manufacturing and testing a semiconductor device
12/06/2005US6972200 Method for manufacturing flip-chip semiconductor assembly
1 ... 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 ... 273