| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/25/2006 | EP1617974A2 Combination hand tool and electrical testing device |
| 01/25/2006 | CN2754101Y Small-sized electronic circuit board detecting table |
| 01/25/2006 | CN1726398A Inspection method and inspection equipment |
| 01/25/2006 | CN1238928C Socket connector and contact for use in socket connector |
| 01/25/2006 | CN1238727C Inspecting apparatus and inspecting method for circuit board |
| 01/25/2006 | CN1238725C Device and method for inspection of circuit substrate |
| 01/24/2006 | US6989681 Socket for testing a semiconductor device and a connecting sheet used for the same |
| 01/24/2006 | US6989664 RF power sensor for measuring an RF signal power using capacitance |
| 01/24/2006 | US6989663 Flatness correction |
| 01/24/2006 | US6988609 Work measurement apparatus |
| 01/19/2006 | WO2006007440A1 Electrical test probes, methods of making, and methods of using |
| 01/19/2006 | WO2006007004A2 Method and apparatus to control an antenna efficiency test device |
| 01/19/2006 | WO2006007003A2 Antenna efficiency test device |
| 01/19/2006 | WO2005091000A8 Contact probe for a testing head |
| 01/19/2006 | US20060012389 Test socket, test system and test method for semiconductor components with serviceable nest |
| 01/19/2006 | US20060011830 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 01/19/2006 | US20060011799 Fixing means for cards and components |
| 01/19/2006 | US20060011467 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 01/19/2006 | DE102004030140B3 Flexible Kontaktierungsvorrichtung Flexible contacting |
| 01/19/2006 | DE102004030129A1 Schaltungsanordnung und Verfahren zur Einstellung der Leistungsaufnahme einer an einem Gleichspannungsnetz betreibbaren Last Circuit arrangement and method for adjusting the power consumption of a can be operated with a DC power load |
| 01/18/2006 | EP1617468A1 Probe apparatus with optical length-measuring unit and probe testing method |
| 01/18/2006 | EP1617230A1 Insert for electronic component-handling device, tray, and electronic component handling device |
| 01/18/2006 | EP1616352A1 Helical microelectronic contact and method for fabricating same |
| 01/18/2006 | EP1616197A1 Alignment features in a probing device |
| 01/18/2006 | EP1218765B1 Wafer-level burn-in and test cartridge |
| 01/18/2006 | EP1029249A4 Test head structure for integrated circuit tester |
| 01/18/2006 | CN2752775Y Signal generator of picture-tube screen quality inspection machine |
| 01/18/2006 | CN2752774Y Exposed thin film probe |
| 01/18/2006 | CN1723544A Fast localization of electrical failures on an integrated circuit system and method |
| 01/18/2006 | CN1722948A Semiconductor apparatus and method of manufacturing semiconductor apparatus |
| 01/18/2006 | CN1722545A Socket for semiconductor device |
| 01/18/2006 | CN1722535A Stud bump socket |
| 01/18/2006 | CN1722532A Contact tip structure for microelectronic interconnection elements |
| 01/18/2006 | CN1722402A Reversible integrated circuit disc and method using it |
| 01/18/2006 | CN1721861A Probe apparatus manufacturing method thereof and substrate inspecting method using the same |
| 01/18/2006 | CN1237853C 基板检测装置 Substrate detection apparatus |
| 01/18/2006 | CN1237663C IC test socket |
| 01/17/2006 | US6987398 System for evaluating probing networks |
| 01/17/2006 | US6987397 Method and probe structure for implementing a single probe location for multiple signals |
| 01/17/2006 | US6986211 System and method of planar positioning |
| 01/12/2006 | WO2006004779A1 Substrate with patterned conductive layer |
| 01/12/2006 | US20060008226 Fiber optic wafer probe |
| 01/12/2006 | US20060006897 Multiple two axis floating probe block assembly using split probe block |
| 01/12/2006 | US20060006894 Socket connection test modules and methods of using the same |
| 01/12/2006 | US20060006893 Socket connection test modules and methods of using the same |
| 01/12/2006 | US20060006892 Flexible test head internal interface |
| 01/12/2006 | US20060006891 Method for testing non-componented circuit boards |
| 01/12/2006 | US20060006890 Interconnect structure that controls spacing between a probe card and a contact substrate |
| 01/12/2006 | US20060006884 Anisotropic, conductive sheet and impedance measuring probe |
| 01/12/2006 | US20060006859 Signal detection contactor and signal calibration system |
| 01/12/2006 | US20060006384 Special contact points for accessing internal circuitry of an intergrated circuit |
| 01/12/2006 | DE19614506B4 Aufbau und Verfahren zur Auswertung von Signalzuständen in einem Sondenmeßnetzwerk Structure and method for evaluation of signal states in a Sondenmeßnetzwerk |
| 01/11/2006 | EP1615297A1 Anisotropic conductive connector and circuit-device electrical-inspection device |
| 01/11/2006 | EP0839321B1 Contact tip structures for microelectronic interconnection elements and methods of making same |
| 01/11/2006 | CN1236483C Detector device |
| 01/11/2006 | CN1236318C Current detector and current measurement apparatus including such detector |
| 01/11/2006 | CN1236317C Test head actuation system with positioning and compliant modes |
| 01/11/2006 | CN1236316C Contact probe unit |
| 01/10/2006 | US6985219 Optical coupling for testing integrated circuits |
| 01/10/2006 | US6985116 Bolometric detection device with antenna and optimized cavity for millimetric or sub-millimetric electromagnetic waves, and manufacturing process for this device |
| 01/10/2006 | US6984996 Wafer probing that conditions devices for flip-chip bonding |
| 01/10/2006 | US6984142 Socket for electrical parts |
| 01/10/2006 | US6983536 Method and apparatus for manufacturing known good semiconductor die |
| 01/05/2006 | WO2006002163A2 Method and apparatus for magnetically achieving electrical continuity |
| 01/05/2006 | WO2006002046A2 Mechanically reconfigurable vertical tester interface for ic probing |
| 01/05/2006 | WO2005065258A3 Active wafer probe |
| 01/05/2006 | WO2005057652A3 Connector for making electrical contact at semiconductor scales and method for forming same |
| 01/05/2006 | US20060001440 Method and system for compensating thermally induced motion of probe cards |
| 01/04/2006 | EP1612891A1 Anisotropic electrically conductive film and method of producing the same |
| 01/04/2006 | EP1611445A1 An apparatus for measuring an a.c. current in a cable |
| 01/04/2006 | EP1395837B1 Device for measuring a b-component of a magnetic field, a magnetic field sensor and an ammeter |
| 01/04/2006 | CN1717795A Microelectronic packaging and components |
| 01/04/2006 | CN1715933A Wide bandwidth attenuator input circuit for a measurement probe |
| 01/04/2006 | CN1235057C Testing device and method for printed boards |
| 01/04/2006 | CN1234501C Electronic test head positioner |
| 01/03/2006 | US6982565 Test system and test method with interconnect having semiconductor spring contacts |
| 01/03/2006 | US6982559 Accurate and efficient sensing circuit and method for bi-directional signals |
| 01/03/2006 | US6982551 Integrated circuit test device |
| 01/03/2006 | US6982550 Unbreakable micro-browser |
| 01/03/2006 | US6982177 Method for in-line testing of flip-chip semiconductor assemblies |
| 01/03/2006 | US6981881 Socket and contact of semiconductor package |
| 12/29/2005 | WO2005125028A1 Pogo pin |
| 12/29/2005 | WO2005124991A1 Circuit arrangement and method for adjusting the power input of a load which can be operated on a direct current supply network |
| 12/29/2005 | WO2005124370A1 A hand-held probe |
| 12/29/2005 | US20050287789 Substrate with patterned conductive layer |
| 12/29/2005 | US20050285609 Probe unit and its manufacturing method |
| 12/29/2005 | US20050285602 Use of magnetic noise compensation in localization of defect in flat plate structure |
| 12/29/2005 | US20050285588 Method and apparatus for testing material integrity |
| 12/28/2005 | EP1610375A2 Contact carriers for populating substrates with spring contacts |
| 12/28/2005 | EP1610132A2 Fabricating interconnects using sacrificial substrates |
| 12/28/2005 | EP1610131A1 Flexible probe |
| 12/28/2005 | EP1444528A4 Electrical test probes and methods of making the same |
| 12/28/2005 | CN2748924Y Optical voltage sensing head |
| 12/28/2005 | CN2748923Y Test tool set up for integrated circuit chip |
| 12/28/2005 | CN1714436A Probe for testing flat panel display and manufacturing method thereof |
| 12/28/2005 | CN1714297A Electric probe system |
| 12/28/2005 | CN1713363A Flexible contact-connection device |
| 12/28/2005 | CN1712971A Realizing method device for universal converter of special tester for circuit board |
| 12/27/2005 | US6980417 Meter with concealed probe receiving deck |
| 12/27/2005 | US6980163 Signal leakage detector |