| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/28/2006 | US7006038 System and method for determining optimal broadcast area of an antenna |
| 02/28/2006 | US7005878 Method for in-line testing of flip-chip semiconductor assemblies |
| 02/28/2006 | US7005870 Interconnect bump plate |
| 02/28/2006 | US7005869 Multi point contactor and blade construction |
| 02/28/2006 | US7005868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe |
| 02/28/2006 | US7005054 Method for manufacturing probes of a probe card |
| 02/28/2006 | US7004776 ZIF connector and semiconductor-testing apparatus using the same |
| 02/28/2006 | US7004762 Socket for electrical parts |
| 02/23/2006 | WO2006020625A1 Interconnect assembly for a probe card |
| 02/23/2006 | WO2006019878A2 System and method to support multiple wireless accounts for a given subscriber |
| 02/23/2006 | WO2006018958A1 Connector, printed circuit board, connection device thereof, and test method for electronic parts using the same |
| 02/23/2006 | US20060038579 Rf chip testing method and system |
| 02/23/2006 | US20060038575 Semiconductor device test probe |
| 02/23/2006 | US20060038551 Ultrafast sampler with coaxial transition |
| 02/23/2006 | US20060038172 Apparatus and methods for wafer-level testing of the chip-scale semiconductor device packages |
| 02/23/2006 | DE112004000632T5 Prüfkopf Probe |
| 02/23/2006 | DE10106138B4 Modulares Meß- und/oder Prüfgerät Modular measurement and / or tester |
| 02/23/2006 | CA2583218A1 Interconnect assembly for a probe card |
| 02/22/2006 | EP1627235A2 Probe for testing a device under test |
| 02/22/2006 | CN2760570Y Circuit detecting device with lighting function |
| 02/22/2006 | CN2760561Y Changeover panel with densely covered hole |
| 02/22/2006 | CN2760560Y Switching spring for wiring board test |
| 02/22/2006 | CN2760559Y Universal commutator device for wiring board special testing machine |
| 02/22/2006 | CN1739194A Probe apparatus with optical length-measuring unit and probe testing method |
| 02/22/2006 | CN1739033A Universal measuring adapter system |
| 02/22/2006 | CN1737582A Probe distinguishing device used for measuring instrument |
| 02/22/2006 | CN1737581A Multiple crystal grain needle-detection instrument |
| 02/22/2006 | CN1243244C Method and device for testing monoboard with straight male interconnecting part |
| 02/21/2006 | US7002363 Method and system for compensating thermally induced motion of probe cards |
| 02/21/2006 | US7002362 Test system for bumped semiconductor components |
| 02/21/2006 | US7002360 System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
| 02/21/2006 | US7002336 Test adapter for a weapon store test set |
| 02/21/2006 | US7000315 Method of making photolithographically-patterned out-of-plane coil structures |
| 02/16/2006 | WO2006017581A1 Probe tip plating |
| 02/16/2006 | US20060035404 Method for manufacturing an electronic device having an electronically determined physical test member |
| 02/16/2006 | US20060033521 A Highly Resilient Cantilever Spring Probe Having Curved Surfaces for Testing ICs |
| 02/16/2006 | US20060033520 A highly resilient cantilever spring probe for testing ics |
| 02/16/2006 | US20060033519 Prober and probe testing method for temperature-controlling object to be tested |
| 02/16/2006 | US20060033517 Probe for semiconductor devices |
| 02/16/2006 | US20060033516 Multiple-chip probe and universal tester contact assemblage |
| 02/16/2006 | US20060033511 Interface comprising a thin pcb with protrusions for testing an integrated circuit |
| 02/16/2006 | US20060033100 Anisotropically conductive connector and production process thereof, and probe member |
| 02/16/2006 | US20060032050 Methods of forming a contact array in situ on a substrate |
| 02/16/2006 | DE10357524B4 Strommesseinrichtung Current measuring device |
| 02/16/2006 | DE102004032540A1 Messvorrichtung Measuring device |
| 02/15/2006 | EP1625409A2 Planarizing and testing of bga packages |
| 02/15/2006 | EP1625406A2 Device probing using a matching device |
| 02/15/2006 | CN2758775Y Current transformer terminal button box and electric energy meter terminal button box |
| 02/15/2006 | CN1735810A Probe array and method of its manufacture |
| 02/15/2006 | CN1734737A Intermetallic spring structure |
| 02/14/2006 | US6999888 Automated circuit board test actuator system |
| 02/14/2006 | US6998864 Structures for testing circuits and methods for fabricating the structures |
| 02/14/2006 | US6998862 Test socket for semiconductor components having serviceable nest |
| 02/14/2006 | US6998858 Probe head, its assembly method and probe card |
| 02/14/2006 | US6998857 Probe unit and its manufacture |
| 02/14/2006 | US6998836 Low loss integration of wafer probes with microwave tuners |
| 02/14/2006 | US6998286 Thin film-structure and a method for producing the same |
| 02/14/2006 | US6997762 Electrically shielded connector |
| 02/11/2006 | CA2515632A1 Electric meter tote |
| 02/09/2006 | WO2006013773A1 Contact load measuring apparatus and inspecting apparatus |
| 02/09/2006 | US20060030247 Cleaning sheet and method for a probe |
| 02/09/2006 | US20060028223 Test method of semiconductor devices |
| 02/09/2006 | US20060028222 Interconnect for bumped semiconductor components |
| 02/09/2006 | US20060028200 Chuck for holding a device under test |
| 02/08/2006 | EP1624530A1 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 02/08/2006 | EP1624309A1 Sheet-like probe, process for producing the same and its application |
| 02/08/2006 | EP1624308A1 Probe for testing electric conduction |
| 02/08/2006 | EP1623242A1 Method for testing empty printed circuit boards |
| 02/08/2006 | CN2757142Y Charging reed insulation mechanism |
| 02/08/2006 | CN2757136Y Probe contact head for carbon product resistivity detection |
| 02/08/2006 | CN2757135Y Detector for circuit board |
| 02/08/2006 | CN1731192A Surge voltage generator |
| 02/08/2006 | CN1241024C Module of testing device for testing printed circuit boards |
| 02/08/2006 | CN1241023C Probe cladding device of probe measuring and testing card |
| 02/07/2006 | US6995582 Testing device with a contact for connecting to a contact of a semiconductor component |
| 02/07/2006 | US6995579 Low-current probe card |
| 02/07/2006 | US6995577 Contact for semiconductor components |
| 02/07/2006 | US6994567 Test device for components of integrated circuits |
| 02/07/2006 | US6994544 Wafer scale thermal stress fixture and method |
| 02/02/2006 | US20060025013 Connector circuit board |
| 02/02/2006 | US20060024990 Universal measuring adapter system |
| 02/02/2006 | US20060024989 Helical microelectronic contact and method for fabricating same |
| 02/02/2006 | US20060024988 Interconnect assemblies and methods |
| 02/02/2006 | US20060022664 Method and apparatus for electromagnetic interference shielding in an automated test system |
| 02/01/2006 | EP1621893A1 Device for removing foreign matter adhering to a probe tip face |
| 02/01/2006 | EP1621892A1 Apparatus to Measure an Electrical Current |
| 02/01/2006 | EP1620738A1 Circuit board test device comprising contact needles which are driven in a diagonally protruding manner |
| 02/01/2006 | EP1259829B1 Vertical counter balanced test head manipulator |
| 02/01/2006 | CN1728932A Method and apparatus for electromagnetic interference shielding in an automated test system |
| 02/01/2006 | CN1727904A Probe card and method for testing magnetic sensor |
| 02/01/2006 | CN1240119C Device and method for identifying working position of device conveying system in semiconductor device testing treatment machine |
| 02/01/2006 | CN1239912C Electric power optical voltage sensor signal reconfiguration and outputting module |
| 01/31/2006 | US6992500 Prober and probe testing method for temperature-controlling object to be tested |
| 01/31/2006 | US6992499 Test method and test apparatus for semiconductor device |
| 01/31/2006 | US6992496 Apparatus for interfacing electronic packages and test equipment |
| 01/31/2006 | US6992495 Shielded probe apparatus for probing semiconductor wafer |
| 01/31/2006 | US6991948 Method of electrical characterization of a silicon-on-insulator (SOI) wafer |
| 01/26/2006 | US20060019027 Method for forming microelectronic spring structures on a substrate |
| 01/26/2006 | US20060017451 Substrates including alignment fences |
| 01/26/2006 | US20060017448 Bonding configuration structure for facilitating electrical testing in a bonding process and a testing method using the same |