| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 03/29/2006 | EP1203202B1 Enhancing voltmeter functionality |
| 03/29/2006 | CN1752759A Integrated circuit testing card |
| 03/29/2006 | CN1752758A Integrated circuit plug socket having signal switching device and electron element testing method |
| 03/28/2006 | US7020443 System for measuring a radio frequency signal in a wireless station and a wiring board switch |
| 03/28/2006 | US7019544 Transmission line input structure test probe |
| 03/28/2006 | US7019512 Planarity diagnostic system, e.g., for microelectronic component test systems |
| 03/28/2006 | US7018857 Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe |
| 03/28/2006 | US7017435 Hand-held probing adapter for a measurement probing system |
| 03/28/2006 | US7017428 Test kit for semiconductor package and method for testing semiconductor package using the same |
| 03/23/2006 | US20060061377 Pin electronics implemented system and method for reduced index time |
| 03/23/2006 | US20060061375 Probe card |
| 03/23/2006 | US20060061374 Inspection method and inspection equipment |
| 03/23/2006 | US20060060779 Semiconductor probe with resistive tip and method of fabricating the same |
| 03/23/2006 | DE102005039671A1 Kombinierte Testinstrumentensonde und Spannungsdetektor Combined test instrument probe and voltage detector |
| 03/22/2006 | EP1637893A1 Method and apparatus for testing electrical characteristics of object under test |
| 03/22/2006 | EP1155333B1 Advanced instrument packaging for electronic energy meter |
| 03/22/2006 | CN1751244A Chip-mounting tape inspecting method and probe unit used for inspection |
| 03/22/2006 | CN1246932C Anisotropic conductive connector, its mfg. method and probe member |
| 03/22/2006 | CN1246893C Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| 03/22/2006 | CN1246699C High resolution analytical probe station |
| 03/22/2006 | CN1246698C Conductive contact element |
| 03/21/2006 | US7016199 Receiver with sliding hanger structure |
| 03/21/2006 | US7015711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method |
| 03/21/2006 | US7015710 Contact probe and probe device |
| 03/21/2006 | US7015709 Ultra-broadband differential voltage probes |
| 03/21/2006 | US7015708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts |
| 03/21/2006 | US7015707 Micro probe |
| 03/21/2006 | US7015685 Semiconductor tester |
| 03/21/2006 | US7014527 Die level testing using machine grooved storage tray with vacuum channels |
| 03/21/2006 | US7014476 Electrical connector |
| 03/16/2006 | WO2005060719A3 Resistive probe tips |
| 03/16/2006 | US20060057886 Holding device for holding an electronic component |
| 03/16/2006 | US20060057875 Probe card covering system and method |
| 03/16/2006 | US20060057866 Microelectronic packaging and components |
| 03/16/2006 | DE102004007851B4 Anschlussvorrichtung für eine Batterie Connection device for a battery |
| 03/15/2006 | CN1747071A Semiconductor probe with resistive tip and method of fabricating the same |
| 03/15/2006 | CN1245632C Detection card and preparation, method thereof |
| 03/14/2006 | US7012444 Semiconductor tester |
| 03/14/2006 | US7012442 Test signal distribution system for IC tester |
| 03/14/2006 | US7012441 High conducting thin-film nanoprobe card and its fabrication method |
| 03/14/2006 | US7011532 Spring element for use in an apparatus for attaching to a semiconductor and a method of making |
| 03/14/2006 | US7011531 Membrane probe with anchored elements |
| 03/14/2006 | US7010854 Re-assembly process for MEMS structures |
| 03/14/2006 | US7010849 Methods for manufacturing a resistor-pin assembly of a voltage probe |
| 03/09/2006 | WO2006026346A1 Stacked tip cantilever electrical connector |
| 03/09/2006 | WO2006025309A1 Rpobe needle, method of manufacturing probe needle, and method of manufacturing three-dimensional body structure |
| 03/09/2006 | WO2006025279A1 Wafer inspection-use anisotropic conductive connector and production method and applications therefor |
| 03/09/2006 | WO2006002163A3 Method and apparatus for magnetically achieving electrical continuity |
| 03/09/2006 | WO2005072406A3 Test system and method for reduced index time |
| 03/09/2006 | US20060049854 Current sense shunt resistor circuit |
| 03/09/2006 | DE112004000610T5 Metallstruktur und deren Herstellungsverfahren Metal structure and their method of preparation |
| 03/08/2006 | EP1633019A1 Anisotropc conductive connector device and production method therefor and circuit device inspection device |
| 03/08/2006 | EP1632954A2 Semiconductor probe with resistive tip and method of fabricating the same |
| 03/08/2006 | CN2763812Y Probe, assembling method and probe board |
| 03/08/2006 | CN2763811Y Compression joint conductive device with bent pin structure |
| 03/08/2006 | CN2763810Y Spring for electronic and test use |
| 03/08/2006 | CN1745310A Wrist joint for positioning a test head |
| 03/08/2006 | CN1745309A Composite motion probing |
| 03/08/2006 | CN1745308A Apparatus and method for limiting over travel in a probe card assembly |
| 03/08/2006 | CN1745307A Method of making a socket to perform testing on integrated circuits and such a socket |
| 03/08/2006 | CN1745306A Microelectronic contact structure |
| 03/08/2006 | CN1743851A Clamp for inspecting printed circuit board |
| 03/08/2006 | CN1743794A Projector for detecting plane displaying board and projecting method realized by same |
| 03/08/2006 | CN1244816C Superconductor high-temperature strip critical current measuring apparatus |
| 03/08/2006 | CN1244815C Adapter for testing printed circuit boards and testing needle for such adapter |
| 03/07/2006 | US7010442 Systems and methods for operating a measurement and testing instrument |
| 03/07/2006 | US7009383 Wafer probe station having environment control enclosure |
| 03/07/2006 | US7009381 Adapter method and apparatus for interfacing a tester with a device under test |
| 03/07/2006 | US7009377 Cartridge system for a probing head for an electrical test probe |
| 03/07/2006 | US7008818 Flip chip packaging process employing improved probe tip design |
| 03/07/2006 | US7008804 Methods for compensating for a test temperature deviation |
| 03/07/2006 | US7007408 Method and apparatus for removing and/or preventing surface contamination of a probe |
| 03/07/2006 | CA2226613C Surge protection system including proper operation indicator |
| 03/02/2006 | WO2006023380A1 A HIGHLY RESILIENT CANTILEVER SPRING PROBE FOR TESTING ICs |
| 03/02/2006 | WO2006021280A1 Calibration standard |
| 03/02/2006 | WO2004113933A3 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 03/02/2006 | US20060046345 Method for fabricating a silicon carbide interconnect for semiconductor components using heating and oxidizing |
| 03/02/2006 | US20060043991 Circuit board checker and circuit board checking method |
| 03/02/2006 | US20060043988 Methods of making a resilient contact apparatus and resilient contact probes |
| 03/02/2006 | US20060043987 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 03/02/2006 | US20060043983 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 03/02/2006 | US20060043959 Combined test instrument probe and voltage detector |
| 03/02/2006 | US20060043477 Interposers for chip-scale packages and intermediates thereof |
| 03/02/2006 | US20060042834 Electronic device with a warped spring connector |
| 03/02/2006 | DE102004040859A1 Electrical terminal block has groove starting at upper level of terminal housing so tip of contact pin can be plugged through groove and recess as far as lower current bar so lower current bar can be contacted by test plug |
| 03/01/2006 | EP1630830A1 High pressure resistance body element |
| 03/01/2006 | EP1630563A1 Method of manufacturing a probe card |
| 03/01/2006 | EP1629288A1 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 03/01/2006 | EP1456676B1 System for remote reading and control of electric energy consumption |
| 03/01/2006 | CN2762143Y Film probe for testing |
| 03/01/2006 | CN1742210A Probe device and display substrate testing apparatus using same |
| 03/01/2006 | CN1740802A Apparatus for measuring clock signal generation |
| 03/01/2006 | CN1740798A Non-suction head type apparatus for taking and putting measured electronic elements |
| 03/01/2006 | CN1740797A Method and apparatus for taking and putting electronic elements waiting for measurement |
| 03/01/2006 | CN1244263C Socket of semiconductor package |
| 03/01/2006 | CN1244147C Socket for semiconductor package |
| 03/01/2006 | CN1243985C Constant current constant voltage method for testing convertor driven by pulses in quasi-sinusoidal power under room temperature |
| 03/01/2006 | CN1243984C Variable-spacing probe head adapter for measuring probe |
| 03/01/2006 | CN1243983C Support body assembly for conductive contactor |
| 02/28/2006 | US7006046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |