| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 04/27/2006 | WO2006044009A2 Interface apparatus for semiconductor device tester and test method therefor |
| 04/27/2006 | WO2006043645A1 Probe and method of manufacturing the same |
| 04/27/2006 | WO2006043607A1 Contact unit and inspection system |
| 04/27/2006 | US20060087327 Probe device and display substrate testing apparatus using same |
| 04/27/2006 | US20060087325 Apparatus for making high-sensitivity measurements of various parameters, and sensors particularly useful in such apparatus |
| 04/27/2006 | DE10143932B4 Shunt-Widerstandanordnung Shunt resistor arrangement |
| 04/26/2006 | EP1650837A1 Socket, and testing device |
| 04/26/2006 | EP1650573A2 Counter balanced vertical docking motion in a driven vertical test head manipulator |
| 04/26/2006 | EP1649550A1 Compression mount and zero insertion force socket for ic devices |
| 04/26/2006 | EP1649296A2 Hand mounted testing meter |
| 04/26/2006 | EP1330333A4 Method of retrofitting a probe station |
| 04/26/2006 | CN2775667Y Magnetic meter pen |
| 04/26/2006 | CN2775666Y Overhead power detecting pincers |
| 04/26/2006 | CN2775665Y Push-pull locking device for overhead power detecting pincers |
| 04/26/2006 | CN2775664Y Telescopic overhead power detecting pincers |
| 04/26/2006 | CN2775663Y Improved detector for real mounting board |
| 04/26/2006 | CN1765032A Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method |
| 04/26/2006 | CN1764844A Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resis |
| 04/26/2006 | CN1763550A Assembled probe body |
| 04/26/2006 | CN1253933C Test equipment for packed semiconductor elements |
| 04/26/2006 | CN1253719C Current sensor assembly |
| 04/26/2006 | CN1253718C Mechanism for fixing probe card |
| 04/25/2006 | US7034558 Test system for device and method thereof |
| 04/25/2006 | US7034557 Inspecting apparatus having a radiator to radiate heat from a semiconductor device |
| 04/25/2006 | US7034555 Grounded test contactor for electromagnetic shielding |
| 04/25/2006 | US7034517 Multimeter with filtered measurement mode |
| 04/25/2006 | US7034495 Indicating instrument |
| 04/25/2006 | US7033920 Method for fabricating a silicon carbide interconnect for semiconductor components |
| 04/25/2006 | US7033196 Connector, electronic component fixing device, and tester |
| 04/25/2006 | US7033184 Electrical interconnect device incorporating anisotropically conductive elastomer and flexible circuit |
| 04/25/2006 | US7032307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus |
| 04/25/2006 | US7032297 Apparatus for installing an electrical wall switch fixture |
| 04/25/2006 | US7032288 Methods for magnetically establishing an electrical connection with a contact of a semiconductor device component |
| 04/20/2006 | WO2005099043A3 Battery pack - cordless power device interface system |
| 04/20/2006 | US20060084290 Manual testing instrument |
| 04/20/2006 | US20060082380 Inspection probe, method for preparing the same, and method for inspecting elements |
| 04/20/2006 | US20060082357 Bus bar current detecting apparatus |
| 04/20/2006 | US20060081583 Method and process of contact to a heat softened solder ball array |
| 04/20/2006 | DE19922082B4 Bauelementegeometrie-unabhängige Vorrichtung zum Testen elektronischer Bauelemente mit verschiebbarem Kontaktmittel Components geometry-independent device for testing electronic components with movable contact means |
| 04/19/2006 | CN2773690Y Detector for display panel examination and experimental device thereof |
| 04/19/2006 | CN1762051A Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 04/19/2006 | CN1762050A Probe and method of making same |
| 04/19/2006 | CN1761883A Method for testing empty printed circuit boards |
| 04/19/2006 | CN1760680A Height adjustable meter reading device |
| 04/19/2006 | CN1760679A Test desk for high frequency characteristics of semiconductor laser chip with noncoplanar electrode |
| 04/19/2006 | CN1760678A Clamp for device of testing electrical properties of faceplate |
| 04/19/2006 | CN1252478C Method for transmitting and storing value and value store electric power meter using the same |
| 04/18/2006 | US7031855 Current sense resistor circuit with averaging Kelvin sense features |
| 04/18/2006 | US7030642 Quick attachment fixture and power card for diode-based light devices |
| 04/18/2006 | US7030638 Method and device with variable resilience springs for testing integrated circuit packages |
| 04/18/2006 | US7030634 Characteristic measuring apparatus for electronic components |
| 04/18/2006 | US7030632 Compliant contract structures, contactor cards and test system including same |
| 04/18/2006 | US7030622 Bonding configuration structure for facilitating electrical testing in a bonding process and a testing method using the same |
| 04/18/2006 | US7030599 Hand held voltage detection probe |
| 04/18/2006 | US7028398 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 04/13/2006 | WO2006038960A1 Floating interface linkage |
| 04/13/2006 | US20060076966 Probe card and contactor of the same |
| 04/13/2006 | US20060076947 Micro-electromechanical system (MEMS) based current & magnetic field sensor having improved sensitivities |
| 04/13/2006 | US20060076946 Self-powered power bus sensor employing wireless communication |
| 04/13/2006 | DE4406674B4 Verfahren zum Prüfen einer Elektrodenplatte A method of testing an electrode plate |
| 04/12/2006 | EP1644747A1 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts |
| 04/12/2006 | EP1155519B1 Electro-optic interface system and method of operation |
| 04/12/2006 | CN1758062A Detecting device |
| 04/12/2006 | CN1251319C Microelectronic component insert making method |
| 04/12/2006 | CN1250973C Probe head adapter for measuring probe |
| 04/12/2006 | CN1250964C Low cost, on-line corrosion monitor and smart corrosion probe |
| 04/11/2006 | US7027991 Voice-responsive command and control system and methodology for use in a signal measurement system |
| 04/11/2006 | US7027637 Adaptive threshold determination for ball grid array component modeling |
| 04/11/2006 | US7026835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad |
| 04/11/2006 | US7026834 Multiple two axis floating probe block assembly using split probe block |
| 04/11/2006 | US7026833 Multiple-chip probe and universal tester contact assemblage |
| 04/11/2006 | US7026806 Apparatus for preventing cross talk and interference in semiconductor devices during test |
| 04/11/2006 | US7026696 Thin film-structure and a method for producing the same |
| 04/11/2006 | US7026618 Highly-sensitive, pyroelectric infrared sensing method and apparatus |
| 04/11/2006 | US7025628 Electronic probe extender |
| 04/11/2006 | US7025600 Semiconductor device having external contact terminals and method for using the same |
| 04/11/2006 | US7024763 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 04/11/2006 | CA2275182C Moving magnet indicating instruments |
| 04/06/2006 | WO2006035856A1 Circuit device inspecting electrode apparatus, method for manufacturing the same and circuit device inspecting apparatus |
| 04/06/2006 | WO2006035025A1 Device for determining electric variables |
| 04/06/2006 | DE4200404B4 Vorrichtung zur elektrischen Prüfung und Verfahren Apparatus for electrical testing and procedure |
| 04/06/2006 | DE102004049251A1 Gerät zum Ermitteln von elektrischen Größen Device for determining electric variables |
| 04/06/2006 | DE102004049153A1 Main conductor for a device like a battery sensor for detecting electric capacities routes a load current between a source of electric energy and electric consumers |
| 04/05/2006 | EP1642145A2 Apparatus and method for electromechanical testing and validation of probe cards |
| 04/05/2006 | CN1757139A Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 04/05/2006 | CN1756961A Apparatus and method for cooling optically probed integrated circuits |
| 04/05/2006 | CN1755375A Signal generation apparatus and method |
| 04/05/2006 | CN1755374A Circuit board testing jig |
| 04/04/2006 | US7024329 Method and apparatus for testing PCBA subcomponents |
| 04/04/2006 | US7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof |
| 04/04/2006 | US7023226 Probe pins zero-point detecting method, and prober |
| 04/04/2006 | US7023225 Wafer-mounted micro-probing platform |
| 04/04/2006 | US7021954 Test connector with metallic stiffener |
| 03/30/2006 | US20060066334 Fiducial alignment masks on microelectronic spring contacts |
| 03/30/2006 | US20060066332 High performance probe system |
| 03/30/2006 | US20060066331 Inspection unit |
| 03/30/2006 | DE4447814B4 Verfahren zum Prüfen von elektrischen Leiterplatten unter Verwendung eines Prüfadapters mit Prüfstiften und Vorrichtung zur Durchführung des Verfahrens A method for testing electrical printed circuit boards using a test adapter with test pins and apparatus for carrying out the method |
| 03/29/2006 | EP1641082A2 Sharpened, oriented contact tip structures |
| 03/29/2006 | EP1640729A1 Anisotropic conductive connector and wafer inspection device |
| 03/29/2006 | EP1315975B1 Method and device for testing printed circuit boards with a parallel tester |