| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 05/31/2006 | CN1258212C Connector for semiconductor device and method for testing semiconductor device |
| 05/31/2006 | CN1258071C Step-recursion nano-level measuring system based on high-precision inductive probe |
| 05/30/2006 | US7053750 Voltage probe systems having improved bandwidth capability |
| 05/30/2006 | US7053643 Radio frequency (RF) test probe |
| 05/30/2006 | US7053641 Interconnect having spring contacts |
| 05/30/2006 | US7053640 System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment |
| 05/30/2006 | US7053638 Surrounding structure for a probe card |
| 05/30/2006 | US7053635 Support member assembly for electroconductive contact members |
| 05/30/2006 | US7053623 Spark ignition system with diagnostic capabilities |
| 05/26/2006 | WO2006054823A1 Integrated silicone contactor with conduction reinforceing layer |
| 05/26/2006 | WO2006054329A1 Contactor and test method using contactor |
| 05/25/2006 | US20060110984 Light socket 3 |
| 05/25/2006 | US20060109016 Microprobe tips and methods for making |
| 05/25/2006 | US20060108147 Printed wiring board |
| 05/24/2006 | EP1659410A2 Contact tip structures for microelectronic interconnection elements and methods of making same |
| 05/24/2006 | CN2783331Y Electronic circuit board test instrument |
| 05/24/2006 | CN1257410C Conductive measuring probe |
| 05/23/2006 | US7049840 Hybrid interconnect and system for testing semiconductor dice |
| 05/23/2006 | US7049838 Semiconductor device tester with slanted contact ends |
| 05/23/2006 | US7049837 Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method |
| 05/23/2006 | US7049836 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method |
| 05/23/2006 | US7049835 Probe card for high speed testing |
| 05/23/2006 | US7049834 Semiconductor device test method and semiconductor device tester |
| 05/23/2006 | US7049693 Electrical contact array for substrate assemblies |
| 05/23/2006 | US7047638 Method of making microelectronic spring contact array |
| 05/23/2006 | CA2221421C Tantalum lined probe |
| 05/18/2006 | WO2006051880A1 Sheet-form probe and probe card and wafer inspection method |
| 05/18/2006 | WO2006051878A1 Sheet-shaped probe, probe card and wafer inspecting method |
| 05/18/2006 | WO2006051845A1 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection apparatus |
| 05/18/2006 | WO2006051190A1 Battery sensor device |
| 05/18/2006 | WO2006002046A3 Mechanically reconfigurable vertical tester interface for ic probing |
| 05/18/2006 | US20060105594 Method for package burn-in testing |
| 05/18/2006 | US20060105475 Fast localization of electrical failures on an integrated circuit system and method |
| 05/18/2006 | US20060103403 System for evaluating probing networks |
| 05/18/2006 | DE102005025403A1 Elektrische Schaltvorrichtung mit magnetischen Verstellelementen Electrical switching apparatus with magnetic adjusting elements |
| 05/17/2006 | CN2781565Y Structure of wafer probe card |
| 05/17/2006 | CN1774838A Anisotropic conductive connector and circuit-device electrical-inspection device |
| 05/17/2006 | CN1774638A Inspection probe |
| 05/17/2006 | CN1774522A Metal structure and method for production thereof |
| 05/17/2006 | CN1773303A Clamp for vertical cavity emission laser To coaxial encapsulation lest |
| 05/17/2006 | CN1773294A Test apparatus for electronic device connection interface |
| 05/17/2006 | CN1256831C 可编程高频脉冲信号发生器 Programmable frequency pulse signal generator |
| 05/17/2006 | CN1256761C Contact component and its manufacture and probe contact assembly using the contact component |
| 05/16/2006 | US7046023 Probe for combined signals |
| 05/16/2006 | US7046022 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 05/16/2006 | US7046020 Probes with perpendicularly disposed spring pins, and methods of making and using same |
| 05/16/2006 | US7045889 Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 05/16/2006 | US7043831 Method for fabricating a test interconnect for bumped semiconductor components by forming recesses and cantilevered leads on a substrate |
| 05/11/2006 | WO2006050321A1 Current sensing lug |
| 05/11/2006 | WO2006049871A1 Apparatus for non-contact testing of microcircuits |
| 05/11/2006 | WO2006049133A1 Probe |
| 05/11/2006 | WO2006048625A1 Kelvin connector including temperature sensor |
| 05/11/2006 | WO2006048233A1 Battery current sensor for a motor vehicle |
| 05/11/2006 | WO2006048232A1 Battery current sensor for a motor vehicle |
| 05/11/2006 | WO2006048231A1 Battery current sensor for a motor vehicle |
| 05/11/2006 | WO2004072658A3 Apparatus for making high-sensitivity measurements of various parameters, and sensors particularly useful in such apparatus |
| 05/11/2006 | US20060097840 High pressure resistance body element |
| 05/11/2006 | US20060097743 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 05/11/2006 | US20060097731 Accurate and efficient sensing method for bi-directional signals |
| 05/11/2006 | US20060096779 Multilayer type printed-wiring board and method of measuring impedance of multilayer type printed-wiring board |
| 05/11/2006 | DE10357809B4 Magnetische Erfassungsvorrichtung und Verfahren zu dessen Herstellung Magnetic detection device and process for its preparation |
| 05/10/2006 | EP1655612A1 Universal test fixture |
| 05/10/2006 | CN2779408Y Electrical connection structure of wafer probe card |
| 05/10/2006 | CN1769897A Contact probe unit |
| 05/10/2006 | CN1255874C Contactor for semiconductor device |
| 05/10/2006 | CN1255686C Conductive contact unit system |
| 05/09/2006 | US7042563 Optical coupling for testing integrated circuits |
| 05/09/2006 | US7042558 Eddy-optic sensor for object inspection |
| 05/09/2006 | US7042380 Digital potentiometer with resistor binary weighting decoding |
| 05/09/2006 | US7042241 Low-current pogo probe card |
| 05/09/2006 | US7042240 Burn-in testing apparatus and method |
| 05/09/2006 | US7042238 Socket for inspection |
| 05/09/2006 | US7042236 Measuring probe for measuring high frequencies |
| 05/09/2006 | US7042207 Inductive measurement system and method |
| 05/09/2006 | US7042080 Semiconductor interconnect having compliant conductive contacts |
| 05/04/2006 | WO2006046650A1 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment |
| 05/04/2006 | WO2006045366A1 Intelligent security connection device |
| 05/04/2006 | WO2006014894A3 Method and apparatus for producing co-planar bonding pads on a substrate |
| 05/04/2006 | US20060091898 Unknown |
| 05/04/2006 | DE4205725B4 Torque motor or moving-magnet galvanometer - useful for optical scanner e.g. for guiding laser beam |
| 05/04/2006 | CA2584631A1 Power supply and communications controller |
| 05/03/2006 | EP1651948A1 Scanning probe inspection apparatus |
| 05/03/2006 | CN2777550Y Probe |
| 05/03/2006 | CN2777549Y Probe assembly for detector of electronic element, circuit and circuit board |
| 05/03/2006 | CN2777548Y Probe assembly for detector of electronic element, circuit and circuitboard |
| 05/03/2006 | CN2777547Y Adjustable auxiliary fixe for signal quantity probe |
| 05/03/2006 | CN2777546Y Circuit board protector |
| 05/03/2006 | CN1768454A Anisotropic electrically conductive film and method of producing the same |
| 05/03/2006 | CN1768271A Test head positioning system and method |
| 05/03/2006 | CN1766652A Method and apparatus for a wobble fixture probe for probing test access point structures |
| 05/03/2006 | CN1766651A Method and apparatus for a twisting fixture probe for probing test access point structures |
| 05/03/2006 | CN1766650A Module for bullet connection capable of connecting multiple electrical contacts |
| 05/03/2006 | CN1766649A Apparatus for detecting electronic element, circuit and circuit board |
| 05/03/2006 | CN1254687C Probe substrate and method of mfg. probe substrate |
| 05/02/2006 | US7038477 Contactor having conductive particles in a hole as a contact electrode |
| 05/02/2006 | US7038476 Electrical signal taking-out device |
| 05/02/2006 | US7038475 Test method for semiconductor components using conductive polymer contact system |
| 05/02/2006 | US7038471 Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 05/02/2006 | US7038462 Method and apparatus for electrical commoning of circuits |
| 05/02/2006 | US7036218 Method for producing a wafer interposer for use in a wafer interposer assembly |