| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 06/29/2006 | DE10134753B4 Anordnung zur Aufnahme eines Halbleiterplättchens mit auf einer Hauptseite angeordneten elektrischen Anschlußelementen zu Testzwecken For testing arrangement for receiving a semiconductor wafer having, arranged on a main electrical connecting elements |
| 06/29/2006 | CA2589353A1 Measuring tip for high-frequency measurement |
| 06/28/2006 | EP1674874A1 Circuit board inspection device |
| 06/28/2006 | EP1673636A2 Test head positioning system |
| 06/28/2006 | EP1328893B1 Method of data recording on/in data supports by means of laser radiation |
| 06/28/2006 | CN2791648Y General electric energy meter pulse socket |
| 06/28/2006 | CN1795391A An apparatus for measuring an AC current in a cable |
| 06/28/2006 | CN1793939A Method for treating surface of probe installed on testing card |
| 06/28/2006 | CN1261993C Detection card for testing semiconductor |
| 06/27/2006 | US7068059 Arrangement for producing an electrical connection between a BGA package and a signal source, and method for producing such a connection |
| 06/27/2006 | US7068057 Low-current pogo probe card |
| 06/27/2006 | US7065870 Segmented contactor |
| 06/22/2006 | WO2006065669A1 Signal module with reduced reflections |
| 06/22/2006 | WO2006064558A1 Contactor member, contactor and contacting method |
| 06/22/2006 | WO2006064546A1 Contact pin, probe card using same and electronic device testing apparatus |
| 06/22/2006 | WO2005121825A3 Test arrangement including anisotropic conductive film for testing power module |
| 06/22/2006 | US20060136156 Systems and methods for operating a measurement and testing instrument |
| 06/22/2006 | US20060134378 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 06/22/2006 | US20060132160 Lsi test socket for bga |
| 06/22/2006 | US20060132157 Wafer probe station having environment control enclosure |
| 06/22/2006 | US20060130322 Semiconductor inspection device and method for manufacturing contact probe |
| 06/21/2006 | CN2789772Y Indicator type current meter |
| 06/21/2006 | CN1790656A Power MOS device testing method and product for realizing the same |
| 06/21/2006 | CN1790042A Multiplex test method for semiconductor wafer and multiplex test probe station therefor |
| 06/21/2006 | CN1790033A Slab display panel detector |
| 06/21/2006 | CN1790032A Detecting apparatus of display panel |
| 06/21/2006 | CN1790031A Workbench for slab display panel detector |
| 06/21/2006 | CN1790030A Digital electric quantity transmitter |
| 06/20/2006 | US7064567 Interposer probe and method for testing |
| 06/20/2006 | US7064566 Probe card assembly and kit |
| 06/20/2006 | US7064564 Bundled probe apparatus for multiple terminal contacting |
| 06/20/2006 | US7063544 System for burn-in testing of electronic devices |
| 06/20/2006 | US7063542 Compliant electrical probe device incorporating anisotropically conductive elastomer and flexible circuits |
| 06/20/2006 | US7063541 Composite microelectronic spring structure and method for making same |
| 06/20/2006 | CA2401479C Elastomeric connector for fuel cell stack cell voltage monitor |
| 06/15/2006 | WO2006062911A1 Test socket and method for making |
| 06/15/2006 | WO2006062733A1 Voltage sensing tool |
| 06/15/2006 | WO2006062152A1 Relay connection member, inspection device, and relay connection member manufacturing method |
| 06/15/2006 | US20060128211 Holding device for holding a tested electronic module |
| 06/15/2006 | US20060125500 Compliant contact structure |
| 06/15/2006 | US20060125471 Planarity diagnostic system, E.G., for microelectronic component test systems |
| 06/15/2006 | US20060125107 Test system for semiconductor components having conductive spring contacts |
| 06/15/2006 | US20060125106 Method for fabricating semiconductor components with conductive spring contacts |
| 06/14/2006 | EP1668376A1 Efficient switching architecture with reduced stub lengths |
| 06/14/2006 | EP1625409A4 Planarizing and testing of bga packages |
| 06/14/2006 | CN2788197Y Needle grid array packaging test and aging examination socket |
| 06/14/2006 | CN2788196Y Base plate for IC test |
| 06/14/2006 | CN1788203A Alignment features in a probing device |
| 06/14/2006 | CN1788202A Sheet-like probe, process for producing the same and its application |
| 06/14/2006 | CN1786720A Plate supply device for testing unit of plate display and sub-working table thereof |
| 06/14/2006 | CN1786719A Apparatus and application for electron preventing error operation of electric tester |
| 06/14/2006 | CN1259573C 探针卡 Probe Card |
| 06/13/2006 | US7061262 Highly resilient cantilever spring probe for testing ICs |
| 06/13/2006 | US7061261 Semiconductor inspection device and method for manufacturing contact probe |
| 06/13/2006 | US7061259 Inspection method and inspection apparatus |
| 06/13/2006 | US7061258 Testing integrated circuits |
| 06/13/2006 | US7061257 Probe card assembly |
| 06/13/2006 | US7061109 Semiconductor substrate-based BGA interconnection for testing semiconductor devices |
| 06/13/2006 | US7060513 Method of testing FPC bonding yield and FPC having testing pads thereon |
| 06/13/2006 | US7059866 integrated circuit contact to test apparatus |
| 06/13/2006 | US7059865 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 06/13/2006 | US7059047 Sockets for “springed” semiconductor devices |
| 06/13/2006 | US7059046 Method for producing a captive wired test fixture and fixture therefor |
| 06/08/2006 | WO2006060467A2 Probe card with segmented substrate |
| 06/08/2006 | WO2006060215A1 Method of shaping lithographically-produced probe elements |
| 06/08/2006 | WO2005091962A3 Dual channel source measurement unit for semiconductor device testing |
| 06/08/2006 | US20060121752 Socket and test apparatus |
| 06/08/2006 | US20060119523 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 06/08/2006 | US20060119522 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 06/08/2006 | US20060119374 Contactor having conductive particles in a hole as a contact electrode |
| 06/08/2006 | US20060119373 Scanning probe inspection apparatus |
| 06/08/2006 | US20060119344 Wireless system for one or more electrical switching apparatus |
| 06/08/2006 | DE10237283B4 Vorrichtung und Verfahren zum Reinigen von Sondennadeln einer Testsondenvorrichtung Apparatus and method for cleaning probe needles of a test probe device |
| 06/07/2006 | EP1483594A4 Contactor assembly for testing ceramic surface mount devices and other electronic components |
| 06/07/2006 | EP1432546A4 Optical testing device |
| 06/07/2006 | CN2786830Y 40 lines flat package combination IC aging examination socket |
| 06/07/2006 | CN1784606A Board for probe card,inspection apparatus,photo-fabrication apparatus and photo-fabrication method |
| 06/07/2006 | CN1783055A Automatic designing method for ICT test conversion PCB |
| 06/07/2006 | CN1782716A Probe card, testing method using it and semiconductor device tested by the same |
| 06/07/2006 | CN1782715A Detector capable of preventing overpressure |
| 06/07/2006 | CN1782660A Light source for plane display screen detector |
| 06/06/2006 | US7057473 Electromagnetic broadside energy probe with integral impedance matching |
| 06/06/2006 | US7057407 Probe holder for testing of a test device |
| 06/06/2006 | US7057404 Shielded probe for testing a device under test |
| 06/06/2006 | US7057403 Microcontactor probe having a contact needle |
| 06/06/2006 | US7056134 Attachable/detachable probing tip system for a measurement probing system |
| 06/01/2006 | WO2006007004A3 Method and apparatus to control an antenna efficiency test device |
| 06/01/2006 | US20060114011 Method to prevent damage to probe card |
| 06/01/2006 | US20060114010 Method to prevent damage to probe card |
| 06/01/2006 | US20060114009 Shielded probe apparatus for probing semiconductor wafer |
| 06/01/2006 | US20060113987 Apparatus for measuring an a.c. current in a cable |
| 06/01/2006 | DE19581562B4 Vierpolstandardwiderstand Vierpolstandardwiderstand |
| 05/31/2006 | EP1662263A1 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 05/31/2006 | EP1391265B1 Contactor cleaning sheet, and contactor cleaning method |
| 05/31/2006 | EP1043591B1 Power semiconductor module |
| 05/31/2006 | CN1781028A Examining instrument for liquid crystal panel |
| 05/31/2006 | CN1779469A Test pad, probe card and protection structure |
| 05/31/2006 | CN1779468A Wire-connected circular probe chunck basilar palte |
| 05/31/2006 | CN1779467A Wire-connected circular probe chunck basilar plate |
| 05/31/2006 | CN1779466A Testing electrode of single nanometer materials and production thereof |