| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/26/2006 | CN1808127A Combined probe for integrated circuit test |
| 07/26/2006 | CN1808126A Microwave ceramic element detection clamp and device, and detection method thereof |
| 07/26/2006 | CN1808125A Connector for testing a semiconductor package |
| 07/26/2006 | CN1808124A Kelvin contact module for a microcircuit test system |
| 07/26/2006 | CN1808123A Integrated test method for packaged electronic element |
| 07/25/2006 | US7081768 Device for testing printed circuit boards |
| 07/25/2006 | US7081767 Electroconductive contact unit |
| 07/25/2006 | US7081766 Probe card for examining semiconductor devices on semiconductor wafers |
| 07/25/2006 | US7081757 Re-locatable partial discharge transducer head |
| 07/25/2006 | US7081005 Electric-connection testing device |
| 07/25/2006 | US7080993 Spiral contactor, contact sheet having spiral contactor, and connecting device having contact sheet |
| 07/25/2006 | US7080988 Flexible contact-connection device |
| 07/20/2006 | WO2006076315A1 Heat sink pedestal with interface medium chamber |
| 07/20/2006 | WO2006075436A1 Contact structure for inspection, and probe card |
| 07/20/2006 | WO2006075408A1 Continuity testing probe |
| 07/20/2006 | WO2006075101A1 Measuring shunt |
| 07/20/2006 | WO2006060467A3 Probe card with segmented substrate |
| 07/20/2006 | US20060160383 Anisotropic conductive connector device and production method therefor and circuit device inspection device |
| 07/20/2006 | US20060158206 Probe card for high speed testing |
| 07/20/2006 | US20060157839 Re-assembly process for MEMS structures |
| 07/20/2006 | US20060157440 Semiconductor probe with resistive tip and method of fabricating the same |
| 07/20/2006 | US20060156850 Test head positioning apparatus |
| 07/20/2006 | US20060156569 System and method of planar positioning |
| 07/20/2006 | DE102006002552A1 Manuelles Sondenträgersystem und Verfahren zur Verwendung desselben Manual probe carrier system and method for use thereof |
| 07/19/2006 | EP1681548A1 Semiconductor probe with resistive tip and method of fabricating the same |
| 07/19/2006 | EP1680813A2 Probe testing structure |
| 07/19/2006 | EP1256006B1 Non-invasive electrical measurement of semiconductor wafers |
| 07/19/2006 | CN2798095Y Probe structure for testing tool |
| 07/19/2006 | CN1806368A Anisotropic conductive connector device and production method therefor and circuit device inspection device |
| 07/19/2006 | CN1806178A Anisotropic conductive connector and wafer inspection device |
| 07/19/2006 | CN1804639A Simple instrument panel of electric vehicle |
| 07/19/2006 | CN1804638A Instrument panel of electric vehicle |
| 07/19/2006 | CN1804637A Probing apparatus |
| 07/19/2006 | CN1265685C High-frequency circuit board with signal pickup pad and measuring tool thereof |
| 07/19/2006 | CN1265552C Circuit for leading-out trigger signal from AC line |
| 07/18/2006 | US7078922 Semiconductor interconnect having semiconductor spring contacts |
| 07/18/2006 | US7078921 Contact probe |
| 07/18/2006 | US7078896 Spatially resolved electromagnetic property measurement |
| 07/18/2006 | US7078821 Ball film for integrated circuit fabrication and testing |
| 07/18/2006 | CA2532899A1 Manual probe carriage system and method of using the same |
| 07/18/2006 | CA2324135C Apparatus for testing bare-chip lsi mounting board |
| 07/13/2006 | WO2006012531A3 Electrical meter with retractable leads |
| 07/13/2006 | US20060154500 Anisotropic conductive connector and wafer inspection device |
| 07/13/2006 | US20060151444 Method for producing a captive wired test fixture and fixture therefor |
| 07/13/2006 | DE102004062968A1 Wegmess-Vorrichtung Distance measuring device |
| 07/13/2006 | DE102004020187B4 Umverdrahtungssubstratstreifen mit mehreren Halbleiterbauteilpositionen Rewiring substrate having a plurality of semiconductor component positions |
| 07/12/2006 | EP1625406A4 Device probing using a matching device |
| 07/12/2006 | CN2795865Y Composite printed circuit board test device |
| 07/12/2006 | CN2795864Y Spring transfer element of printed circuit board detector |
| 07/12/2006 | CN1802775A Device probing using a matching device |
| 07/12/2006 | CN1264255C Contactor device |
| 07/12/2006 | CN1264021C Integrated circuit performance measurement and circuit experiment apparatus |
| 07/11/2006 | US7075320 Probe for combined signals |
| 07/11/2006 | US7075319 Probe card having a coil spring interposed between a support member and a contactor unit |
| 07/11/2006 | US7074648 Method for packaging flip-chip semiconductor assemblies |
| 07/11/2006 | US7074072 Method of making contact with circuit units to be tested in a tester and contact-making apparatus for implementing the method |
| 07/11/2006 | US7074049 Kelvin contact module for a microcircuit test system |
| 07/11/2006 | CA2224927C Ground fault circuit interrupter miswiring prevention device |
| 07/06/2006 | US20060149505 Method for detecting and monitoring wafer probing process instability |
| 07/06/2006 | US20060148298 IC socket |
| 07/06/2006 | US20060148285 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 07/06/2006 | US20060145718 Burn-in testing apparatus and method |
| 07/06/2006 | US20060145716 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 07/06/2006 | US20060145711 Probe device and probe method |
| 07/06/2006 | US20060145353 Semiconductor interconnect having dome shaped conductive spring contacts |
| 07/06/2006 | US20060144485 Metal structure and method for production thereof |
| 07/06/2006 | US20060143909 Method for producing a captive wired test fixture and fixture therefor |
| 07/06/2006 | DE19941110B4 Testsystem und Testverfahren Test System and method |
| 07/05/2006 | EP1677389A1 Power terminal and a unit comprising such power terminal |
| 07/05/2006 | EP1676139A1 Cable terminal with contact pins including electrical component |
| 07/05/2006 | EP1629288A4 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 07/05/2006 | CN2793917Y Probe structure of crystal circular probe card |
| 07/05/2006 | CN1798979A Insert for electronic component-handling device, tray, and electronic component handling device |
| 07/05/2006 | CN1798977A Planarizing and testing of bga packages |
| 07/05/2006 | CN1797732A Semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 07/05/2006 | CN1797007A Method for shielding clip style sensor |
| 07/05/2006 | CN1797006A Probe component of detecting device for plane display board detection |
| 07/05/2006 | CN1797005A Method for processing tungsten needle of probe card in use for testing crystal wafer |
| 07/05/2006 | CN1797004A Detecting device for panel display board detector |
| 07/05/2006 | CN1797003A Apparatus/testing processor for testing un-moulded IC devices using air flow system and the method of testing the same |
| 07/05/2006 | CN1797002A Device for debugging circuit board, and method for debugging circuit board |
| 07/05/2006 | CN1797001A Apparatus and method for generating a high-frequency signal |
| 07/05/2006 | CN1262842C Microcontactor probe and electric probe unit |
| 07/04/2006 | US7071722 Anisotropic, conductive sheet and impedance measuring probe |
| 07/04/2006 | US7071718 Low-current probe card |
| 07/04/2006 | US7071714 Method and system for compensating for thermally induced motion of probe cards |
| 07/04/2006 | US7071677 Accurate and efficient sensing method for bi-directional signals |
| 07/04/2006 | US7071420 Methods and apparatus for a flexible circuit interposer |
| 07/04/2006 | US7069638 Air socket for testing integrated circuits |
| 06/29/2006 | WO2006068156A1 Kelvin probe |
| 06/29/2006 | WO2006067300A1 Device for measuring a current flowing in a cable |
| 06/29/2006 | WO2006066676A1 Measuring tip for measuring high frequency |
| 06/29/2006 | WO2006044009A3 Interface apparatus for semiconductor device tester and test method therefor |
| 06/29/2006 | WO2005103740A3 Intelligent probe card architecture |
| 06/29/2006 | US20060139038 Hollow microprobe using a mems technique and a method of manufacturing the same |
| 06/29/2006 | US20060139024 Multimeter with filtered measurement mode |
| 06/29/2006 | US20060138676 Fine terminal, its manufacturing method, and contact sheet |
| 06/29/2006 | US20060138076 Method for making a planar suspended microstructure, using a sacrificial layer of polymer material and resulting component |
| 06/29/2006 | US20060137171 Method of testing using compliant contact structures, contactor cards and test system |
| 06/29/2006 | DE69635227T2 Kontakträger zum bestücken von substraten mit federkontakten Contact carrier of fitting substrates with spring contacts |