| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 08/16/2006 | EP1691206A2 Method and apparatus for testing semiconductor dice |
| 08/16/2006 | EP1690283A2 Methods for making vertical electrical feed through structures |
| 08/16/2006 | EP1330659B1 Method and device for dissolving hyperpolarised solid material for nmr analyses |
| 08/16/2006 | EP1301827B1 Photolithographically-patterned out-of-plane coil structures and method of making |
| 08/16/2006 | CN2807264Y Detecting device of brush-less motor controller |
| 08/16/2006 | CN2807263Y Improved structure of probe |
| 08/16/2006 | CN2807262Y Disposable plastic shell sealing lock |
| 08/16/2006 | CN2807261Y Power on/off device used for testing |
| 08/16/2006 | CN1820193A Scanning probe inspection apparatus |
| 08/16/2006 | CN1818669A Semiconductor device, device forming substrate and wiring connection testing method |
| 08/16/2006 | CN1818668A Method for electric feeding, discharging and super-current time delay protecting on high-frequency tuning device |
| 08/16/2006 | CN1818667A Manual probe carriage system and method of using the same |
| 08/16/2006 | CN1270187C Portable signal generating method and system based on USB mobile memory tech |
| 08/15/2006 | US7092902 Automated system for designing and testing a probe card |
| 08/15/2006 | US7092836 Method for locating wiring swap in a hi-fix structure of a simultaneous multi-electronic device test system |
| 08/15/2006 | US7091734 Electroconductive contact unit |
| 08/15/2006 | US7091733 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 08/15/2006 | US7091732 Systems and methods for probing processor signals |
| 08/15/2006 | CA2215227C Sensing apparatus for cable termination devices in power distribution systems |
| 08/10/2006 | US20060177298 Test head positioning system |
| 08/10/2006 | US20060176064 Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board |
| 08/10/2006 | DE10343256B4 Anordnung zur Herstellung einer elektrischen Verbindung zwischen einem BGA-Package und einer Signalquelle, sowie Verfahren zum Herstellen einer solchen Verbindung An arrangement for producing an electrical connection between a BGA package and a signal source, and to processes for producing such a compound |
| 08/10/2006 | DE10041879B4 Verfahren und Vorrichtung zur Strommessung Method and apparatus for current measurement |
| 08/09/2006 | EP1688750A1 Differential termination and attenuator network for a measurement probe having an automated common mode termination voltage generator |
| 08/09/2006 | EP1688749A1 Differential termination and attenuator network for a measurement probe |
| 08/09/2006 | EP1688748A1 Differential termination and attenuator network for a measurement probe having an internal termination voltage generator |
| 08/09/2006 | EP1688747A1 Probe assembly with multi-directional freedom of motion |
| 08/09/2006 | EP1687648A1 Synchronization of modules for analog and mixed signal testing |
| 08/09/2006 | EP1642145A4 Apparatus and method for electromechanical testing and validation of probe cards |
| 08/09/2006 | EP1617974A4 Combination hand tool and electrical testing device |
| 08/09/2006 | EP1518127B1 Test device for integrated circuit components |
| 08/09/2006 | CN2804878Y Novel nanometer measuring means |
| 08/09/2006 | CN2804877Y Improvements for measuring means for testing use |
| 08/09/2006 | CN2804876Y Micro-electromechanical prob circuit film |
| 08/09/2006 | CN2804875Y Novel measuring means |
| 08/09/2006 | CN2804874Y Conductive measuring means |
| 08/09/2006 | CN2804873Y Simple measuring means |
| 08/09/2006 | CN1816948A Prefabricated and attached interconnect structure |
| 08/09/2006 | CN1816895A Wafer inspection device |
| 08/09/2006 | CN1816751A Apparatus and method for electromechanical testing and validation of probe cards |
| 08/09/2006 | CN1816748A Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/09/2006 | CN1815825A Micro contact-element and making method |
| 08/09/2006 | CN1815305A Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel |
| 08/09/2006 | CN1815304A Inspection probe, inspection device for optical panel and inspection method for the optical panel |
| 08/09/2006 | CN1815244A Differential termination and attenuator network for a measurement probe |
| 08/09/2006 | CN1815243A Differential termination and attenuator network for a measurement probe having an internal termination voltage generator |
| 08/09/2006 | CN1815242A Electrical read head having high sensitivity and resolution power and method of operating the same |
| 08/09/2006 | CN1815241A Loaded board test method |
| 08/08/2006 | US7088217 Shunt resistance and method of adjusting the shunt resistance |
| 08/08/2006 | US7087984 Methods for protecting intermediate conductive elements of semiconductor device assemblies |
| 08/08/2006 | US7087501 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 08/08/2006 | US7086149 Method of making a contact structure with a distinctly formed tip structure |
| 08/03/2006 | WO2006081119A1 Connector system |
| 08/03/2006 | WO2006080146A1 Probe card and method for manufacturing same |
| 08/03/2006 | WO2005121825B1 Test arrangement including anisotropic conductive film for testing power module |
| 08/03/2006 | US20060171425 Probe and method of making same |
| 08/03/2006 | US20060170439 Probe for testing a device under test |
| 08/03/2006 | US20060169678 Probe positioning and bonding device and probe bonding method |
| 08/03/2006 | DE10128156B4 Adapter für Testautomaten Adapter for test machines |
| 08/03/2006 | DE10107041B4 Abstützvorrichtung für ein tragbares Gerät Support device for a portable device |
| 08/02/2006 | EP1686387A1 A method and an apparatus for testing electrical properties |
| 08/02/2006 | EP1686385A1 Conductive contact holder and conductive contact unit |
| 08/02/2006 | EP1686382A2 Finger switch |
| 08/02/2006 | EP1685415A2 Method for forming photo-defined micro electrical contacts |
| 08/02/2006 | CN2802510Y 探针装置 Probe device |
| 08/02/2006 | CN2802509Y Binding base with quickly connecting testing function and connecting device for electric equipment |
| 08/02/2006 | CN2802508Y Quick plug |
| 08/02/2006 | CN1813379A Spiral terminal and method of manufacturing the same |
| 08/02/2006 | CN1812070A Probe card, method of manufacturing the probe card and alignment method |
| 08/02/2006 | CN1812069A Socket assembly for testing semiconductor device |
| 08/02/2006 | CN1811944A Semiconductor probe with resistive tip and method of fabricating the same |
| 08/02/2006 | CN1811479A Device with board abnormality detecting circuit |
| 08/02/2006 | CN1811464A Detection installation of circuit board, storage medium, detection method of circuit board, manufacturing method of circuit board, and circuit board |
| 08/02/2006 | CN1811463A Diaphragm-holding device for test |
| 08/02/2006 | CN1811462A Electric circuit board tester |
| 08/02/2006 | CN1268041C Contact for spiral contactor and spiral contactor |
| 08/02/2006 | CN1267733C Conductive contactor and electric probe unit |
| 08/01/2006 | US7084716 Ultrafast sampler with coaxial transition |
| 08/01/2006 | US7084657 Bump and method of forming bump |
| 08/01/2006 | US7084656 Probe for semiconductor devices |
| 08/01/2006 | US7084655 Burn-in test apparatus for BGA packages using forced heat exhaust |
| 08/01/2006 | US7084652 Non-destructive contact test |
| 08/01/2006 | US7084012 Programmed material consolidation processes for protecting intermediate conductive structures |
| 08/01/2006 | US7083428 Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins |
| 08/01/2006 | US7082682 Contact structures and methods for making same |
| 08/01/2006 | US7082666 Method for testing print circuit boards |
| 07/27/2006 | WO2006078664A1 Connector system |
| 07/27/2006 | WO2006049871A8 Apparatus for non-contact testing of microcircuits |
| 07/27/2006 | WO2006047384A3 Power supply and communications controller |
| 07/27/2006 | US20060164112 Low-current pogo probe card |
| 07/27/2006 | US20060162955 Test card assembly |
| 07/27/2006 | DE102005002875A1 Measuring adapter for use in e.g. switch gear, has fuse holder for screw safety fuse, and inner part with central contact and bushing for test plug, where adapter is connected to measuring line which leads contact outward |
| 07/26/2006 | CN2800587Y Electric connector |
| 07/26/2006 | CN2800287Y 电连接器 The electrical connector |
| 07/26/2006 | CN1809757A Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 07/26/2006 | CN1809756A Probe |
| 07/26/2006 | CN1808131A Internal reference voltage generation for integrated circuit testing |
| 07/26/2006 | CN1808130A Probe board for semiconductor chip detecting and its producing method |
| 07/26/2006 | CN1808129A Integrated circuit detector and preparation method thereof |
| 07/26/2006 | CN1808128A 探针卡 Probe Card |