| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/12/2006 | US7105366 Method for in-line testing of flip-chip semiconductor assemblies |
| 09/08/2006 | WO2006093704A1 Probe card with stacked substrate |
| 09/08/2006 | WO2006093185A1 Probe and probe card |
| 09/08/2006 | WO2006092055A1 Circuit calibration using voltage injection |
| 09/07/2006 | US20060199405 Anisotropic conductive connector and circuit-device electrical inspection device |
| 09/07/2006 | US20060197545 Test sockets, test systems, and methods for testing microfeature devices |
| 09/07/2006 | US20060197544 Test sockets, test systems, and methods for testing microfeature devices |
| 09/07/2006 | US20060197542 Material for probe pins |
| 09/07/2006 | US20060196047 Methods and apparatus for a flexible circuit interposer |
| 09/06/2006 | EP1698905A2 Nano-drive for high resolution positioning and for positioning of a multi-point probe |
| 09/06/2006 | EP1698904A1 Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 09/06/2006 | EP1698024A1 Small array contact with precision working range |
| 09/06/2006 | EP1697989A2 Connector for making electrical contact at semiconductor scales and method for forming same |
| 09/06/2006 | EP1322965B1 Manipulator for a test head with active compliance |
| 09/06/2006 | CN2814435Y Square battery detection clamp |
| 09/06/2006 | CN2814417Y Magnet control type instrument core support |
| 09/06/2006 | CN2814416Y Simple electric vehicle gauge board |
| 09/06/2006 | CN2814415Y Electric vehicle gauge panel |
| 09/06/2006 | CN2814414Y Testing electric clip |
| 09/06/2006 | CN1828326A Compound whole-working order testing device control and protection system, and failure protection scheme |
| 09/06/2006 | CN1828325A Test equipment for semiconductor |
| 09/06/2006 | CN1828311A Self-powered power bus sensor employing wireless communication |
| 09/06/2006 | CN1273837C Orbit detector |
| 09/05/2006 | US7102374 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
| 09/05/2006 | US7102370 Compliant micro-browser for a hand held probe |
| 09/05/2006 | US7102369 Contact pin, connection device and method of testing |
| 09/05/2006 | US7102368 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture |
| 08/31/2006 | WO2006091454A1 Probes for a wafer test apparatus |
| 08/31/2006 | WO2006091367A1 Apparatus for probing semiconductor devices |
| 08/31/2006 | WO2006091008A1 Probe guide assembly |
| 08/31/2006 | WO2006091007A1 Probe guide assembly |
| 08/31/2006 | WO2006091006A1 Probe guide assembly |
| 08/31/2006 | US20060192581 Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 08/31/2006 | US20060192578 Inspection method and inspection apparatus |
| 08/31/2006 | US20060192577 Anisotropically conductive sheet |
| 08/31/2006 | US20060192575 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/31/2006 | US20060191136 Method Of Making Microelectronic Spring Contact Array |
| 08/31/2006 | US20060191135 Methods for establishing electrical connections by drawing one or both of an element of an electrical connector and a contact toward the other |
| 08/30/2006 | EP1696479A1 Contactor for reliability evaluation tester |
| 08/30/2006 | EP1696241A1 Anisotropic conductive connector and circuit device inspection method |
| 08/30/2006 | EP1695100A2 Resistive probe tips |
| 08/30/2006 | EP1695099A2 Isolation buffers with controlled equal time delays |
| 08/30/2006 | EP1649296A4 Hand mounted testing meter |
| 08/30/2006 | EP1113275B1 Conductive contact |
| 08/30/2006 | EP1000363B1 Spreading resistance profiling system |
| 08/30/2006 | EP0979414B1 Multi-probe test head and test method |
| 08/30/2006 | CN2812293Y Memory module with its chips being connected by holddown piece and conducting terminals |
| 08/30/2006 | CN1826713A Socket and test apparatus |
| 08/30/2006 | CN1826711A Compression mount and zero insertion force socket for ic devices |
| 08/30/2006 | CN1825125A Testing module with mini-testing point suitable for various electrical characters |
| 08/30/2006 | CN1825124A Test tray for handler for testing semiconductor devices |
| 08/30/2006 | CN1272806C Nano thin film probe card and manufacturing method thereof |
| 08/30/2006 | CN1272632C Wafer-level burn-in and test |
| 08/30/2006 | CN1272234C Method for forming microelectronic spring structures on a substrate |
| 08/29/2006 | US7098682 Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element |
| 08/29/2006 | US7098648 Automatic range finder for electric current testing |
| 08/29/2006 | US7098647 Coaxial cable unit, test apparatus, and CPU system |
| 08/29/2006 | US7098475 Apparatuses configured to engage a conductive pad |
| 08/29/2006 | US7097488 Socket for electrical parts |
| 08/24/2006 | WO2006089040A2 Selectively conductive structure |
| 08/24/2006 | WO2006088847A1 Probe card assembly and method of attaching probes to the probe card assembly |
| 08/24/2006 | WO2006088131A1 Conductive terminal unit and conductive terminal |
| 08/24/2006 | WO2006087877A1 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device |
| 08/24/2006 | WO2006087342A1 Device for detecting electric currents |
| 08/24/2006 | US20060185164 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 08/24/2006 | DE202004021082U1 Probe for measuring electrical characteristics of integrated circuit, microelectronic device, has conductive via formed between front and back surfaces of dielectric substrate, in thickness direction |
| 08/23/2006 | EP1692529A2 Die design with integrated assembly aid |
| 08/23/2006 | EP1692526A1 Apparatus for testing a device with a high frequency signal |
| 08/23/2006 | EP1692525A1 A ground-signal-ground (gsg) test structure |
| 08/23/2006 | CN2809657Y Test assembly for electrical property test of electrical package |
| 08/23/2006 | CN2809652Y Special-purpose circuit breaker for prepaid kilowatt hour meter |
| 08/23/2006 | CN2809651Y Test probe for electronic object |
| 08/23/2006 | CN1822342A Detecting probe |
| 08/23/2006 | CN1822341A Suspension arm probe |
| 08/23/2006 | CN1822154A Probe head and method of fabricating the same |
| 08/23/2006 | CN1822075A Display circuit |
| 08/23/2006 | CN1821791A Probe board fixing machanism |
| 08/23/2006 | CN1821790A Universal probe device for electronic module detecting system |
| 08/23/2006 | CN1821789A Vertical probe carb |
| 08/23/2006 | CN1821788A Embedded type micro contact element and its producing method |
| 08/23/2006 | CN1271748C Self-aligning socket connector |
| 08/23/2006 | CN1271699C Probe card for testing wafer having plurality of semiconductor devices and its manufacturing method |
| 08/22/2006 | US7095241 Anisotropic conductive connector, probe member, wafer inspecting device, and wafer inspecting method |
| 08/22/2006 | US7094615 Method of controlling probe tip sanding in semiconductor device testing equipment |
| 08/22/2006 | US7094068 Load board |
| 08/22/2006 | US7094065 Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 08/22/2006 | US7093622 Apparatus for deforming resilient contact structures on semiconductor components |
| 08/22/2006 | US7093358 Method for fabricating an interposer |
| 08/17/2006 | WO2006085573A1 Interposer, probe card and method for manufacturing interposer |
| 08/17/2006 | WO2006085388A1 Electrical connection device |
| 08/17/2006 | WO2005098462A3 Probe card and method for constructing same |
| 08/17/2006 | US20060183356 Electrical connector |
| 08/17/2006 | US20060181295 Method for fabricating an interconnect for semiconductor components |
| 08/17/2006 | US20060181293 Low impedance test fixture for impedance measurements |
| 08/17/2006 | US20060181265 Electronic device test system |
| 08/17/2006 | US20060181264 Surface-mounted integrated current sensor |
| 08/17/2006 | US20060180881 Probe head and method of fabricating the same |
| 08/17/2006 | DE102004051489B4 Connection device for vehicle battery, has electrical switch temporarily contacting conductor such that current flow in conductor is switched on/off, where information from external unit, which is generated inside device, controls switch |
| 08/17/2006 | DE102004006298B4 Verbindungsanordnung für ein Messelement eines Batteriesensors Connection arrangement for a sensing element of a battery sensor |
| 08/16/2006 | EP1691349A2 Probe head and method of fabricating the same |