| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 10/11/2006 | EP1075655B1 Electronic battery tester |
| 10/11/2006 | CN2826440Y IC testing module |
| 10/11/2006 | CN2826439Y Connection device for connecting electroscope and insulating bar |
| 10/11/2006 | CN1846138A Contact pin, probe card using same and electronic part testing device |
| 10/11/2006 | CN1279366C Magnetic resonance apparatus with excitation antennae system |
| 10/10/2006 | US7119566 Test probe alignment apparatus |
| 10/10/2006 | US7119564 Method and system for compensating thermally induced motion of probe cards |
| 10/10/2006 | US7119561 Electrical connecting apparatus |
| 10/10/2006 | US7119560 Probe apparatus |
| 10/10/2006 | US7119559 Vacuum-actuated test fixture for testing printed circuit boards |
| 10/10/2006 | US7119558 Test probe for finger tester and corresponding finger tester |
| 10/10/2006 | US7119557 Hollow microprobe using a MEMS technique and a method of manufacturing the same |
| 10/10/2006 | US7119547 Testing apparatus |
| 10/10/2006 | US7119362 Method of manufacturing semiconductor apparatus |
| 10/10/2006 | US7118386 Socket for semiconductor device |
| 10/10/2006 | US7117592 Method of manufacturing a connector |
| 10/10/2006 | US7117589 Method of installing a plug and play device driver |
| 10/10/2006 | US7117585 Magnetic detection apparatus with resin infiltration prevention |
| 10/05/2006 | WO2006103073A1 Method and device for tempering a substrate |
| 10/05/2006 | US20060223345 Sockets for "springed" semiconductor devices |
| 10/05/2006 | US20060220666 Microcontactor probe assembly |
| 10/05/2006 | US20060220665 Alignment fences and devices and assemblies including the same |
| 10/05/2006 | US20060220229 Methods and apparatus for a flexible circuit interposer |
| 10/05/2006 | US20060220228 Methods and apparatus for a flexible circuit interposer |
| 10/04/2006 | EP1708517A1 Method for transmitting test data in an electronic device equipped with an electronic card reader, electronic device comprising an electronic card reader and an adapter for testing electronic devices equipped with an electronic card reader |
| 10/04/2006 | EP1707967A1 Electric connecting device and contactor |
| 10/04/2006 | EP1707532A2 Probing card and inspection apparatus for microstructure |
| 10/04/2006 | EP1156342B1 Air cooled power load test apparatus |
| 10/04/2006 | CN2824387Y Secondary loop voltage current combined connection box |
| 10/04/2006 | CN2824054Y Universal four line type switch measurer |
| 10/04/2006 | CN2824040Y Anti-rotating clamp test needle |
| 10/04/2006 | CN2824039Y Testing platform structure for display panel |
| 10/04/2006 | CN2824038Y Measuring clamp with positioning self-straightening structure |
| 10/04/2006 | CN1278451C Apparatus and methods to pre-stress anisotropic conductive elastomer meterials |
| 10/04/2006 | CN1278130C Pusher and electronic part-testing apparatus with the same |
| 10/04/2006 | CN1278126C Probe connecting structure for detecting tool of printed circuit board |
| 10/04/2006 | CN1278125C Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe |
| 10/03/2006 | US7116124 Apparatus to prevent damage to probe card |
| 10/03/2006 | US7116123 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured |
| 10/03/2006 | US7116122 Method for ball grid array chip packages having improved testing and stacking characteristics |
| 10/03/2006 | US7116119 Probe card with coplanar daughter card |
| 10/03/2006 | US7116118 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 10/03/2006 | US7116094 Apparatus and method for transmission and remote sensing of signals from integrated circuit devices |
| 10/03/2006 | US7114976 Test socket and test system for semiconductor components with easily removable nest |
| 09/28/2006 | WO2006101861A2 Microelectronic packages and methods therefor |
| 09/28/2006 | US20060216962 Small contactor pin |
| 09/28/2006 | US20060214677 Probe for combined signals |
| 09/28/2006 | US20060214676 Membrane probing system with local contact scrub |
| 09/28/2006 | US20060214654 [conducting structure of a meter] |
| 09/28/2006 | DE202004021093U1 Differential probe for e.g. integrated circuit, has elongate probing units interconnected to respective active circuits that are interconnected to substrate by respective pair of flexible interconnects |
| 09/28/2006 | DE19722872B4 Schaltung zur Messung des Elektrodenstroms eines keramischen Gassensors Circuit for measuring the current electrodes of a ceramic gas sensor |
| 09/27/2006 | CN2821578Y Probe sheet |
| 09/27/2006 | CN2821577Y Combined magnetic steel magnet regulator |
| 09/27/2006 | CN1839320A Device for measuring the intensity of a strong current passing through a wire |
| 09/27/2006 | CN1837838A Measuring method, inspection method, inspection device for semiconductor device |
| 09/27/2006 | CN1837830A Elastic micro-contact element and manufacturing method thereof |
| 09/26/2006 | US7113136 Integrated dual function circuitry and antenna system |
| 09/26/2006 | US7112986 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 09/26/2006 | US7112985 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 09/26/2006 | US7112976 Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested |
| 09/26/2006 | US7112970 Coaxial radio frequency adapter and method |
| 09/26/2006 | US7112791 Method of inspecting pattern and inspecting instrument |
| 09/21/2006 | WO2006097982A1 Method for manufacturing semiconductor integrated circuit device |
| 09/21/2006 | US20060211280 Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method |
| 09/21/2006 | US20060211234 Re-assembly process for mems structures |
| 09/21/2006 | US20060209519 Devices having compliant wafer-level input/output interconnections and packages using pillars and methods of fabrication thereof |
| 09/21/2006 | US20060208752 Inspection probe |
| 09/21/2006 | US20060208748 Probe holder for testing of a test device |
| 09/21/2006 | DE112004002022T5 Messsonden-Prüfstruktur Measuring probe test structure |
| 09/20/2006 | EP1702394A1 Method and arrangement for battery charging |
| 09/20/2006 | EP1702217A1 Measurement connector for test device |
| 09/20/2006 | CN1834676A Auxilary valve triggering and detecting code of all-duty testing device |
| 09/20/2006 | CN1834664A Test system and connection box therefor |
| 09/20/2006 | CN1834663A Printed circuit holding device |
| 09/20/2006 | CN1834662A Test jig for measuring To packed base high frequency of photoelectronic device |
| 09/20/2006 | CN1276260C Coaxial probe interface for automatic test equipment |
| 09/20/2006 | CN1276259C Photoetching contact elements |
| 09/19/2006 | US7109932 Antenna efficiency test device |
| 09/19/2006 | US7109931 Method and apparatus to control an antenna efficiency test device |
| 09/19/2006 | US7109732 Electronic component test apparatus |
| 09/19/2006 | US7109731 Membrane probing system with local contact scrub |
| 09/19/2006 | US7109728 Probe based information storage for probes used for opens detection in in-circuit testing |
| 09/19/2006 | US7109700 Multimeter having off-device display device and selection device |
| 09/19/2006 | US7109699 Long range alternating current phasing voltmeter |
| 09/19/2006 | US7108546 High density planar electrical interface |
| 09/14/2006 | WO2006095759A1 Method of forming connection pin, probe, connection pin, probe card, and method of producing probe card |
| 09/14/2006 | WO2006095441A1 Probe for energization test and electric connection device using the same |
| 09/14/2006 | US20060202708 Low-current probe card |
| 09/14/2006 | US20060202704 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses |
| 09/14/2006 | US20060200984 Air socket for testing integrated circuits |
| 09/13/2006 | CN2816818Y Automobile electric control unit LED displaying diagnosis instrument |
| 09/13/2006 | CN2816817Y Portable multiple measuring-input path isolation type detecting gauge |
| 09/13/2006 | CN2816816Y Measuring instrument and heat-insulation constant temperature duct |
| 09/13/2006 | CN1832122A Detection card interface panel |
| 09/13/2006 | CN1831541A Multichannel synchronous sinusoidal signal generator |
| 09/13/2006 | CN1275308C Semiconductor detector and detecting method thereof |
| 09/12/2006 | US7106086 Method of dynamically switching voltage screen test levels based on initial device parameter measurements |
| 09/12/2006 | US7106082 Stage driving apparatus and probe method |
| 09/12/2006 | US7106080 Probe card and contactor of the same |
| 09/12/2006 | US7105380 Method of temporarily securing a die to a burn-in carrier |