G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
11/2006
11/08/2006	CN2836018Y Integrated circuit tester
11/08/2006	CN2836017Y Multifunctional multimeter pen
11/08/2006	CN2836016Y Mobile PCB fixing device
11/08/2006	CN1860377A Efficient switching architecture with reduced stub lengths
11/08/2006	CN1858597A Micro gap method and ESD protection device
11/08/2006	CN1858596A Chip general detector and its structure method
11/08/2006	CN1284283C Contactor
11/07/2006	US7132839 Ultra-short low-force vertical probe test head and method
11/07/2006	US7131851 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method
11/07/2006	US7131848 Helical microelectronic contact and method for fabricating same
11/07/2006	CA2289042C Method for determining sedimentary rock pore pressure caused by effective stress unloading
11/02/2006	WO2006116767A1 Apparatus for testing electronic devices
11/02/2006	WO2006114885A1 Electrically connecting device
11/02/2006	US20060246611 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment
11/02/2006	US20060244475 Compliant contact pin test assembly and methods thereof
11/02/2006	US20060244469 Segmented Contactor
11/02/2006	US20060244468 Micro-electromechanical probe circuit substrate
11/02/2006	US20060244438 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
11/02/2006	US20060244437 Device for measuring the intensity of a strong current passing through a wire
11/02/2006	US20060243483 Semiconductor device assemblies with compliant spring contact structures
11/02/2006	US20060242828 Fabrication of compliant spring contact structures and use thereof
11/02/2006	EP1717591A1 Needle-like member, conductive contact, and conductive contact unit
11/02/2006	EP1717590A1 Contact pin, probe card using same and electronic device testing apparatus
11/02/2006	EP1716422A1 Probing a device
11/02/2006	EP1540359B1 Method and test adapter for testing an appliance having a smart card reader
11/02/2006	EP1350118B1 Voltage detection stick
11/02/2006	DE60028282T2 Leistungshalbleitermodul The power semiconductor module
11/02/2006	DE20380304U1 Line connections formation method for test adapter for non-multiplexed and multiplexed test system for electronic board, involves pressing pins of needle carrier plate into direct route contact plate
11/01/2006	CN2833602Y Probe measuring card
11/01/2006	CN2833601Y Pneumatic elastic test interface
11/01/2006	CN2833600Y Probe structure improvement of testing jig
11/01/2006	CN1854741A Multi-band amplifier for test and measurement instruments
10/2006
10/31/2006	US7129729 Socket connection test modules and methods of using the same
10/31/2006	US7129728 LSI test socket for BGA
10/31/2006	US7129723 Test device for electrical testing of a unit under test
10/31/2006	US7129721 Method and apparatus for processing semiconductor devices in a singulated form
10/31/2006	US7129693 Modular voltage sensor
10/31/2006	US7129692 Current detection equipment and semiconductor device
10/31/2006	US7129156 Method for fabricating a silicon carbide interconnect for semiconductor components using heating
10/31/2006	US7128587 Probe card covering system and method
10/31/2006	US7127811 Methods of fabricating and using shaped springs
10/26/2006	WO2006112354A1 Probe and method for manufacturing same
10/26/2006	WO2005098460A3 Double side probing of semiconductor devices
10/26/2006	WO2005094482A3 Tray for storing and transporting semi-conductor and other microelectronic components
10/26/2006	US20060238213 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
10/26/2006	US20060238212 Integrated circuit temperature sensing device and method
10/26/2006	US20060238211 Method And System For Compensating Thermally Induced Motion Of Probe Cards
10/25/2006	EP1714161A1 Auxiliary element for fixing a current sensor to an electrical conductor
10/25/2006	CN2831156Y 4 end-on standard capacitor
10/25/2006	CN2831132Y Electronic error operation-proof device of digital AVO meter
10/25/2006	CN2831129Y Program controlled a.c/d.c simulated standard resistor
10/25/2006	CN2831128Y Clamp probe inhibition structure of PCB board testing machine
10/25/2006	CN2831127Y Converting board correcting aid of PCB board testing machine
10/25/2006	CN2831126Y Modular type needle bar of PCB board testing machine
10/25/2006	CN2831125Y Host panel testing machine
10/25/2006	CN2831124Y Testing tools
10/25/2006	CN2831123Y Soft panel testing gripper of PCB board general testing machine
10/25/2006	CN1851477A Measuring system and its data interface converting device
10/25/2006	CN1851476A Interface and semiconductor testing apparatus using same
10/25/2006	CN1851475A Magnet-shunt meter core support
10/25/2006	CN1281968C Electronic component characteristic measuring device
10/25/2006	CN1281966C Probe sheet, probe card, semiconductor detector device
10/25/2006	CN1281965C Socket and contact of semiconductor package
10/24/2006	US7126364 Interface comprising a thin PCB with protrusions for testing an integrated circuit
10/24/2006	US7126363 Die carrier
10/24/2006	US7126362 Inspection unit
10/24/2006	US7126358 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies
10/24/2006	US7126325 Digital multi-meter with operational error prevention technology using LED and microprocessor with input sockets
10/24/2006	US7126228 Apparatus for processing semiconductor devices in a singulated form
10/24/2006	US7126224 Semiconductor substrate-based interconnection assembly for semiconductor device bearing external connection elements
10/24/2006	US7126220 Miniaturized contact spring
10/24/2006	US7126145 Frame transfer prober
10/19/2006	WO2006109328A1 Contact probe for a testing head having vertical probes for semiconductor integreted electronic devices
10/18/2006	EP1711837A1 Quick attachment fixture and power card for diode-based light devices
10/18/2006	CN2828822Y Compressor electric machine testing fixture
10/18/2006	CN1848551A Producing technology of outlet board
10/18/2006	CN1847860A Differential termination and attenuator network for a measurement probe having an automated common mode termination voltage generator
10/18/2006	CN1847859A Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method
10/18/2006	CN1847858A Test adaptor card and test equipment
10/18/2006	CN1280635C Test head docking system and method
10/18/2006	CN1280634C Conductive contact unit
10/18/2006	CN1280633C Terminal block units
10/17/2006	US7123037 Integrated circuit temperature sensing device and method
10/17/2006	US7123036 Test method for electronic modules
10/17/2006	US7123034 Contactor assembly for common grid array devices
10/17/2006	US7122895 Stud-cone bump for probe tips used in known good die carriers
10/17/2006	US7122760 Using electric discharge machining to manufacture probes
10/17/2006	US7122389 Method for processing semiconductor devices in a singulated form
10/17/2006	US7121891 Interposer
10/17/2006	US7121842 Electrical connector
10/17/2006	US7121837 Connector
10/17/2006	US7120999 Methods of forming a contact array in situ on a substrate
10/12/2006	WO2006106876A1 Microstructure probe card, and microstructure inspecting device, method, and computer program
10/12/2006	WO2006106618A1 Contact probe
10/12/2006	US20060228926 Socket for semiconductor device
10/12/2006	US20060228916 Socket for semiconductor device
10/12/2006	US20060228915 Socket for semiconductor device
10/12/2006	US20060226712 Universal DC power
10/12/2006	DE202006009618U1 Probe for e.g. integrated circuit, has contact tips located within periphery of coaxial cable and shielded by ground conductor of coaxial cable, where coaxial cable terminates in oblique terminal section
10/11/2006	EP1710594A1 Method of measuring semiconductor wafers with an oxide enhanced probe

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