G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
12/2006
12/06/2006	CN1288449C Method and apparatus for retaining a spring probe
12/05/2006	USRE39418 Mounting apparatus for ball grid array device
12/05/2006	US7145355 Selectively configurable probe structures, e.g., for testing microelectronic components
12/05/2006	US7145353 Double side probing of semiconductor devices
12/05/2006	US7145351 Electrical inspection apparatus
12/05/2006	US7145323 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
12/05/2006	US7145171 Probe unit and its manufacturing method
12/05/2006	US7143500 Method to prevent damage to probe card
11/2006
11/30/2006	WO2006126279A1 Probe assembly, method of producing the probe assembly, and electrical connection device
11/30/2006	WO2006125841A1 Read system for a mechanical transducer element
11/30/2006	WO2006125376A1 A bracket for the core of a magnet-adjusted type meter
11/30/2006	WO2005098460B1 Double side probing of semiconductor devices
11/30/2006	US20060270265 Insert and electronic component handling apparatus provided with the same
11/30/2006	US20060267624 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
11/30/2006	US20060267620 Interconnecting apparatus and a contact element therefor
11/30/2006	US20060267610 Probe station having multiple enclosures
11/30/2006	US20060267575 Theft prevention device for automotive vehicle service centers
11/30/2006	US20060265869 Method of installing a plug and play device driver and software
11/30/2006	DE102005042060A1 Rückwirkungsfreie Auskopplung von CAN-Bus-Signalen Non-reactive extraction of CAN bus signals
11/29/2006	EP1726965A1 Differential measurement probe having a ground clip system for the probing tips
11/29/2006	CN2842429Y Direct-measuring type apparatus
11/29/2006	CN2842428Y Winding beard-needling detachable PCB tester converting board
11/29/2006	CN1871522A Method for forming photo-defined micro electrical contacts
11/29/2006	CN1871521A Isolation buffers with controlled equal time delays
11/29/2006	CN1869714A Probe structure of test card
11/29/2006	CN1869713A Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities
11/29/2006	CN1869712A Differential measurement probe having a ground clip system for the probing tips
11/29/2006	CN1869711A Probe assembly with multi-directional freedom of motion and mounting assembly therefor
11/29/2006	CN1287436C Test tray with carrier assembly for semiconductor device processing machine
11/28/2006	US7142000 Mounting spring elements on semiconductor devices, and wafer-level testing methodology
11/28/2006	US7141997 Method for testing using a universal wafer carrier for wafer level die burn-in
11/28/2006	US7141996 Flip chip test structure
11/28/2006	US7141994 Air socket for testing integrated circuits
11/28/2006	US7141993 Interface apparatus for integrated circuit testing
11/28/2006	US7140883 Contact carriers (tiles) for populating larger substrates with spring contacts
11/28/2006	US7140105 Method of fabricating a notched electrical test probe tip
11/23/2006	WO2006123998A1 A test socket
11/23/2006	WO2006123772A1 Wafer inspecting sheet-like probe and application thereof
11/23/2006	WO2006122600A1 Probe or measuring head with illumination of the contact region
11/23/2006	US20060261828 Resilient contact probe apparatus
11/23/2006	US20060261824 Semiconductor device test method and semiconductor device tester
11/23/2006	DE112004002554T5 Active wafer probe Active wafer probe
11/23/2006	DE102005023425A1 Tast- oder Meßkopf mit Beleuchtung des Kontaktbereichs Tactile or measuring head with illumination of the contact region
11/23/2006	CA2609016A1 Ruggedized apparatus for analysis of nucleic acid and proteins
11/22/2006	EP1724594A1 Probe and probe manufacturing method
11/22/2006	EP1723438A2 Burn-in testing apparatus and method
11/22/2006	EP1538452B1 Stage driving apparatus and probe method
11/22/2006	EP1432994B1 System and method for segmenting the left ventricle in a cardiac mr image
11/22/2006	EP1356307B1 Nickel alloy probe card frame laminate
11/22/2006	EP1303763B1 Spring probe assemblies
11/22/2006	CN2840056Y Universal meter alarming protector
11/22/2006	CN2840049Y 微弹性接触器结构 Micro resilient contact structure
11/22/2006	CN2840048Y Modular probe device and probe
11/22/2006	CN2840047Y Probe with structural improvement
11/22/2006	CN2840046Y Detecting probe for display panel
11/22/2006	CN2840045Y Special adapter for automatic testing equipment
11/22/2006	CN1866490A Test probe and manufacturing method for test probe
11/22/2006	CN1866032A Signal transmission method of integrated conductive probe and finished product thereof
11/22/2006	CN1866030A Microstructure probe card, and microstructure inspecting device
11/22/2006	CN1286003C Programmable delay indexed data path register file for array processing
11/22/2006	CN1285916C Electrical parameter inspection apparatus
11/22/2006	CN1285915C Conductive contact
11/22/2006	CN1285914C 导电性触头 Conductive contact
11/21/2006	US7138813 Probe station thermal chuck with shielding for capacitive current
11/21/2006	US7138810 Probe station with low noise characteristics
11/21/2006	US7137830 Miniaturized contact spring
11/16/2006	WO2006119953A1 Battery current sensor for a motor vehicle
11/16/2006	US20060258141 Ball Film For Integrated Circuit Fabrication and Testing
11/16/2006	US20060255822 Cooling fin connected to a cooling unit and a pusher of the testing apparatus
11/16/2006	US20060255815 Contact probe and method of manufacturing the same and test apparatus and test method
11/16/2006	DE19528972B4 Serielle digitale Signalquelle mit einem Kabeldämpfungssimulator Serial digital signal source with a cable loss simulator
11/15/2006	EP1722241A2 High bandwidth probe assembly
11/15/2006	EP1721365A1 Cable terminal with air-enhanced contact pins
11/15/2006	EP1721181A2 Test system and method for reduced index time
11/15/2006	EP1721177A2 Rf sensor clamp assembly
11/15/2006	EP1721175A1 Portable electric testing equipment
11/15/2006	EP1721174A2 Dual channel source measurement unit for semiconductor device testing
11/15/2006	EP1285281B1 Test probe and connector
11/15/2006	EP0826152B1 Method and apparatus for testing semiconductor dice
11/15/2006	CN1864070A Circuit board inspection device
11/15/2006	CN1864069A 测试头定位系统 Test head positioning system
11/15/2006	CN1862276A Impulse current generator
11/15/2006	CN1862268A Power frequency magnetic field generator
11/14/2006	US7136761 Digital flowmeter
11/14/2006	US7135891 Current sense shunt resistor circuit
11/14/2006	US7135883 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
11/14/2006	US7135876 Electrical feedback detection system for multi-point probes
11/14/2006	US7135777 Devices having compliant wafer-level input/output interconnections and packages using pillars and methods of fabrication thereof
11/14/2006	US7135703 Test tray with carrier modules for a semiconductor device handler
11/14/2006	US7135345 Methods for processing semiconductor devices in a singulated form
11/14/2006	US7134909 Connector circuit board
11/09/2006	WO2006118220A1 Conductive contact holder and conductive contact unit
11/09/2006	WO2005072438A3 Multi-signal single beam probe
11/09/2006	US20060251871 laminating a porous film made of polytetrafluoroethylene with elasticity suitable for elastic recovery and used as a base film, adhering conductive metal by electroless plating at plural positions of the base film; use in the burn-in test of semiconductor devices
11/09/2006	US20060250151 Methods of making a resilient contact apparatus and resilient contact probes
11/08/2006	EP1720381A1 Organic el panel
11/08/2006	EP1720020A2 Contact probe and test apparatus and test method
11/08/2006	EP1720019A1 Adapter for circuit board examination and device for circuit board examination
11/08/2006	EP1570279A4 Guarded tub enclosure
11/08/2006	CN2836019Y Circuit of electrical measuring instrument for power supply protection

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