| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 01/09/2007 | US7160123 Plural layer anisotropic conductive connector and its production method |
| 01/09/2007 | US7160119 Controlled compliance fine pitch electrical interconnect |
| 01/09/2007 | US7159311 Method of making an interposer with contact structures |
| 01/09/2007 | CA2421641C Method of retrofitting a probe station |
| 01/04/2007 | WO2007000799A1 Contactor, contact structure with the contactor, probe card, testing device, contact structure producing method, and contact structure producing apparatus |
| 01/04/2007 | WO2006055307A3 Flip-top actuator |
| 01/04/2007 | US20070004245 Kelvin contact module for a microcircuit test system |
| 01/04/2007 | US20070001701 Circuit board inspection device |
| 01/04/2007 | US20070001693 Test probe for finger tester and corresponding finger tester |
| 01/04/2007 | US20070001690 Probe |
| 01/03/2007 | EP1739440A2 Electrical testmethod and -device and manufacturing method for a contacting device |
| 01/03/2007 | EP1738183A1 Rewiring substrate strip with several semiconductor component positions |
| 01/03/2007 | CN2854604Y Self-control electric-limited single-phase watt-hour meter |
| 01/03/2007 | CN2854588Y Miniature solution conduction tester |
| 01/03/2007 | CN1890845A Small array contact with precision working range |
| 01/03/2007 | CN1890806A Connector for making electrical contact at semiconductor scales and method for forming same |
| 01/03/2007 | CN1890571A Cable terminal with contact pins including electrical components |
| 01/03/2007 | CN1890570A Auxiliary element for fixing a current sensor to an electrical conductor |
| 01/03/2007 | CN1293387C Multiple virtual logic tester supported semiconductor test system |
| 01/02/2007 | US7157922 Planar electroconductive contact probe holder |
| 01/02/2007 | US7156680 Insert and electronic component handling apparatus provided with the same |
| 01/02/2007 | US7156669 Anisotropic conductive film |
| 01/02/2007 | US7155818 Method of fabricating a connector |
| 12/28/2006 | WO2006136139A1 Device for transmitting electrical signals between a tester and a test adapter |
| 12/28/2006 | WO2006136000A1 Radio frequency isolation container |
| 12/28/2006 | US20060294008 Method And System For Designing A Probe Card |
| 12/28/2006 | US20060290368 Circuit board test device comprising contact needles which are driven in diagonally protruding manner |
| 12/28/2006 | DE102006026229A1 Probe for e.g. integrated circuit, has contact tips located within periphery of coaxial cable and shielded by ground conductor of coaxial cable, where coaxial cable terminates in oblique terminal section |
| 12/28/2006 | CA2608858A1 Radio frequency isolation container |
| 12/27/2006 | EP1736788A2 Method and apparatus for searching electromagnetic disturbing source and non-contact voltage probe apparatus therefor |
| 12/27/2006 | EP1736787A1 Probe device capable of being used for plural kinds of testers |
| 12/27/2006 | EP1735628A2 Wireless test cassette |
| 12/27/2006 | EP1544625B1 Anisotropic, conductive sheet and impedance measuring probe |
| 12/27/2006 | EP1340092B1 Current sensor |
| 12/27/2006 | CN2852138Y Magnetic field probe for electromagnetism compatibility diagnosis testing |
| 12/27/2006 | CN2852137Y Carrier for testing |
| 12/27/2006 | CN2852092Y Electrized railway contact line space position parameter measuring device |
| 12/27/2006 | CN1886821A Methods for making vertical electrical feed through structures |
| 12/27/2006 | CN1886666A Portable electric testing equipment |
| 12/27/2006 | CN1886665A A ground-signal-ground (GSG) test structure |
| 12/27/2006 | CN1886664A Apparatus for testing a device with a high frequency signal |
| 12/27/2006 | CN1885518A Manufacturing method of semiconductor integrated circuit device |
| 12/27/2006 | CN1885043A Digital control circuit and method for small phase-lock amplifier |
| 12/27/2006 | CN1292258C Test probe for a finger tester and corresponding finger tester |
| 12/27/2006 | CN1292257C Automatic testing system for electronic plug-in unit of road maintenance machinery |
| 12/26/2006 | US7154261 Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device |
| 12/26/2006 | US7154259 Isolation buffers with controlled equal time delays |
| 12/21/2006 | WO2005076885A3 Contactless interfacing of test signals with a device under test |
| 12/21/2006 | US20060286828 Contact Structures Comprising A Core Structure And An Overcoat |
| 12/21/2006 | US20060284681 Wide bandwidth attenuator input circuit for a measurement probe |
| 12/21/2006 | US20060284630 Membrane probing system |
| 12/21/2006 | US20060284614 Method and apparatus of controlling for charging/discharging voltage of battery |
| 12/20/2006 | EP1733337A2 Radio frequency identification tag inlay sortation and assembly |
| 12/20/2006 | EP1362391B1 Terminal connector |
| 12/20/2006 | CN2849727Y Fixer for connector winding |
| 12/20/2006 | CN1291235C Socket for electronic component test and electronic component test apparatus using the socket |
| 12/20/2006 | CN1290628C Probe cleaning device |
| 12/19/2006 | US7151389 Dual channel source measurement unit for semiconductor device testing |
| 12/19/2006 | US7151385 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 12/19/2006 | US7151384 Probe device and display substrate testing apparatus using same |
| 12/14/2006 | WO2006132243A1 Inspection device |
| 12/14/2006 | WO2006101861A3 Microelectronic packages and methods therefor |
| 12/14/2006 | US20060279943 Interposers with alignment fences and semiconductor device assemblies including the interposers |
| 12/14/2006 | US20060279320 Non-Abrasive Electrical Test Contact |
| 12/14/2006 | US20060279300 Probe Card Assembly And Kit |
| 12/14/2006 | US20060279295 Probe based information storage for probes used for opens detection in in-circuit testing |
| 12/14/2006 | DE102006002472A1 Signalsonde und Sondenanordnung Signal probe and probe assembly |
| 12/13/2006 | EP1732120A1 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method |
| 12/13/2006 | EP1730814A2 Battery pack - cordless power device interface system |
| 12/13/2006 | EP1546739B1 Rf chip testing method and system |
| 12/13/2006 | CN2847303Y Structure for detecting electronic module clamp |
| 12/13/2006 | CN1877804A Manufacturing method of semiconductor integrated circuit device |
| 12/13/2006 | CN1877343A Voltage supply system for uninterrupted-power-supply detection of electronic product performance used in production line |
| 12/13/2006 | CN1877342A Test apparatus capable of accurately connecting a test object to a substrate |
| 12/13/2006 | CN1877341A Test equipment of semiconductor devices |
| 12/13/2006 | CN1290170C Method for testing probe board and semiconductor chip, capacitor and mfg. method thereof |
| 12/13/2006 | CN1290169C Contactor having contact electrode formed by laser |
| 12/12/2006 | US7148714 POGO probe card for low current measurements |
| 12/12/2006 | US7148711 Membrane probing system |
| 12/12/2006 | US7148710 Probe tile for probing semiconductor wafer |
| 12/12/2006 | US7148709 Freely deflecting knee probe with controlled scrub motion |
| 12/07/2006 | WO2006130570A1 Sensor module, system, and method for sensors in proximity to circuit breakers |
| 12/07/2006 | WO2006129848A1 Production method of glass penetrating wiring board, glass penetrating wiring board, and probe card and packaging element using glass penetrating wiring board |
| 12/07/2006 | US20060273812 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured |
| 12/07/2006 | US20060273809 Method of designing an application specific probe card test system |
| 12/07/2006 | DE19836557B4 Haltevorrichtung eines Handlers für IC-Module Holding device of a handler for IC modules |
| 12/06/2006 | EP1729174A1 Photolithographically-patterned out-of-plane coil structures and method of making |
| 12/06/2006 | EP1502123B1 Device and method for testing printed circuit boards, and testing probe for said device and method |
| 12/06/2006 | CN2844926Y Flexible PCB inspecting clamp |
| 12/06/2006 | CN1875281A Conductive contact holder and conductive contact unit |
| 12/06/2006 | CN1873426A Signal probe and probe assembly |
| 12/06/2006 | CN1873425A Semiconductor testing apparatus and interface board |
| 12/06/2006 | CN1873424A Electronic element automatic moving loader |
| 12/06/2006 | CN1873423A Electronic element automatic moving loader |
| 12/06/2006 | CN1873422A Method and equipment for active injecting pinhead of fly needle |
| 12/06/2006 | CN1288738C Apparatus for compensatnig deviation of test temperature is semiconductor device processing machine |
| 12/06/2006 | CN1288737C Detection device, testing device of semiconductor device and testing method |
| 12/06/2006 | CN1288735C Semiconductor device test system |
| 12/06/2006 | CN1288734C Measurement, check, manufacturing method and check device for semiconductor device |
| 12/06/2006 | CN1288450C Method of manufacturing a probe card |