| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/08/2007 | DE10314462B4 Anordnung zum Prüfen von elektrischen Leiterplatten Arrangement for testing electrical circuit boards |
| 02/08/2007 | DE102005036856A1 Tastkopf mit Drucksensor Probe with pressure sensor |
| 02/07/2007 | EP1750136A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 02/07/2007 | EP1750135A1 Test head with pressure sensor |
| 02/07/2007 | CN1910460A Probe guard |
| 02/07/2007 | CN1908678A Socket for inspection apparatus |
| 02/07/2007 | CN1908677A Systems, methods, and apparatuses for reporting transient conditions in an unattended meter |
| 02/07/2007 | CN1299344C Device for testing semiconductor device |
| 02/07/2007 | CN1299342C Test carrier plate |
| 02/07/2007 | CN1299120C Detector and detection head of multi-channel, low input capacitance signal |
| 02/06/2007 | US7174260 System and method for reading power meters |
| 02/06/2007 | US7173442 Integrated printed circuit board and test contactor for high speed semiconductor testing |
| 02/06/2007 | US7173441 Prefabricated and attached interconnect structure |
| 02/06/2007 | US7173440 Probing apparatus and test method including electrical shielding |
| 02/06/2007 | US7173429 Activity-based battery monitor with a universal current measuring apparatus |
| 02/06/2007 | US7172707 Sputtered spring films with low stress anisotropy |
| 02/01/2007 | US20070026710 Electrical connection component |
| 02/01/2007 | US20070025257 Efficient switching architecture with reduced stub lengths |
| 02/01/2007 | US20070024302 Low-current pogo probe card |
| 02/01/2007 | US20070024301 Electrical feedback detection system for multi-point probes |
| 02/01/2007 | US20070023658 Method of inspecting pattern and inspecting instrument |
| 02/01/2007 | DE19753366B4 Klemmenanschlussstück für den zugriffsgeschützten Anschluss eines in einem Gehäuse einer isoliergasgefüllten elektrischen Schaltanlage, insbesondere einer Mittelspannungsschaltanlage, angeordneten Wandlers Terminal connector for connecting an access-protected in a housing of an insulating gas electrical switchgear, in particular a medium-voltage switchgear, arranged converter |
| 02/01/2007 | DE19648475B4 Kontaktstruktur, Prüfkarten und Herstellungsverfahren Contact structure, test cards and manufacturing processes |
| 02/01/2007 | DE10007399B4 Kragenförmige Kontakthülsenkonfiguration für Federfühler Collar-shaped contact tube configuration for Spring Probe |
| 01/31/2007 | CN2864686Y Hand-held connecting device for detection |
| 01/31/2007 | CN2864685Y Microwave coplanar waveguide testing jig |
| 01/31/2007 | CN1906496A Probe device capable of being used for plural kinds of testers |
| 01/31/2007 | CN1906493A Electrically connecting apparatus and contactor |
| 01/30/2007 | US7170457 Mobile electromagnetic compatibility (EMC) test laboratory |
| 01/30/2007 | US7170365 Ultrafast sampler with non-parallel shockline |
| 01/30/2007 | US7170306 Connecting a probe card and an interposer using a compliant connector |
| 01/30/2007 | US7170304 Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components |
| 01/30/2007 | US7170295 Resistor arrangement, manufacturing method, and measurement circuit |
| 01/30/2007 | US7169646 Interconnect assemblies and methods |
| 01/30/2007 | US7168162 Method of manufacturing a probe card |
| 01/25/2007 | WO2005115068A3 High density interconnect system having rapid fabrication cycle |
| 01/25/2007 | US20070018667 LSI test socket for BGA |
| 01/25/2007 | US20070018665 Probe station with low noise characteristics |
| 01/25/2007 | US20070017093 Method of making an interposer with contact structures |
| 01/24/2007 | EP1745299A1 Probe attach tool |
| 01/24/2007 | CN2862045Y Integrated circuit parallel testing adapter |
| 01/24/2007 | CN2862044Y Feeling spindle removing device |
| 01/24/2007 | CN2862043Y Step brazing type spheroid grid array movable testing seat |
| 01/24/2007 | CN1902499A Electronic component/interface interposer |
| 01/24/2007 | CN1900725A Lithographic contact elements |
| 01/24/2007 | CN1296719C Probe based information storage for probes used for opens detection in in-circuit testing |
| 01/24/2007 | CN1296716C Probe device and its manufacturing method |
| 01/23/2007 | US7167014 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 01/23/2007 | US7167013 Suction cap for IC sockets and IC socket assembly using same |
| 01/23/2007 | US7167012 Universal wafer carrier for wafer level die burn-in |
| 01/23/2007 | US7165978 Socket for semiconductor device |
| 01/23/2007 | US7165322 Process of forming socket contacts |
| 01/18/2007 | WO2007007869A1 Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board |
| 01/18/2007 | WO2007007736A1 Probe card |
| 01/18/2007 | WO2007007544A1 Probe card |
| 01/18/2007 | WO2006093635A3 Method and circuit for the detection of solder-joint failures in a digital electronic package |
| 01/18/2007 | US20070014652 Electronic component inspection apparatus |
| 01/17/2007 | EP1744167A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 01/17/2007 | EP1744166A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 01/17/2007 | EP1743182A2 Intelligent probe card architecture |
| 01/17/2007 | CN2859845Y Safety stand for DIP programmable chip programme debugging |
| 01/17/2007 | CN2859544Y Electronic tester and electronic testing system |
| 01/17/2007 | CN1898572A Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 01/17/2007 | CN1896759A Method and apparatus for electrical testing of a unit under test, as well as a method for production of apparatus which is used for testing |
| 01/17/2007 | CN1896749A Inspection device for display panel and interface used therein |
| 01/17/2007 | CN1896748A Apparatus for hot-probing integrated semiconductor circuits on wafers |
| 01/16/2007 | US7164995 Differential termination and attenuator network for a measurement probe |
| 01/16/2007 | US7164994 Differential termination attenuator network for a measurement probe having an internal termination voltage generator |
| 01/16/2007 | US7164280 Electrical test device |
| 01/16/2007 | US7164279 System for evaluating probing networks |
| 01/16/2007 | US7164278 Device for releasable connecting an interface with a test equipment |
| 01/16/2007 | US7164262 In-head converter with display |
| 01/16/2007 | US7163424 Housing for a thin active probe |
| 01/16/2007 | US7163336 Instrument for non-contact infrared temperature measurement having current clamp meter functions |
| 01/16/2007 | US7162796 Method of making an interposer with contact structures |
| 01/11/2007 | WO2007005042A1 Esd component ground clip |
| 01/11/2007 | WO2006007003A3 Antenna efficiency test device |
| 01/11/2007 | US20070007980 High Density Planar Electrical Interface |
| 01/11/2007 | US20070007979 Probe device capable of being used for plural kinds of testers |
| 01/10/2007 | EP1742523A2 Memory module with chip fixture |
| 01/10/2007 | EP1742073A1 Electric connecting device |
| 01/10/2007 | EP1742072A2 IC test socket |
| 01/10/2007 | EP1741111A1 Compliant electrical contact assembly |
| 01/10/2007 | EP1740963A2 Double side probing of semiconductor devices |
| 01/10/2007 | EP1740959A1 System and method for reading power meters |
| 01/10/2007 | CN2857034Y Battery testing clamp |
| 01/10/2007 | CN2857025Y Gripping, sucking type electroprobe for AVO meter |
| 01/10/2007 | CN1894792A Helical microelectronic contact and method for fabricating same |
| 01/10/2007 | CN1894589A Anisotropic conductive connector, and inspection method for circuit device |
| 01/10/2007 | CN1894588A Systems and methods for connecting electrical components |
| 01/10/2007 | CN1294787C Method for mounting an electronic component |
| 01/10/2007 | CN1294422C Device for testing chip with the help of printed circuit board |
| 01/09/2007 | US7162375 Differential termination and attenuator network for a measurement probe having an automated common mode termination voltage generator |
| 01/09/2007 | US7161373 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 01/09/2007 | US7161369 Method and apparatus for a wobble fixture probe for probing test access point structures |
| 01/09/2007 | US7161365 Apparatus and method for making ground connection |
| 01/09/2007 | US7161363 Probe for testing a device under test |
| 01/09/2007 | US7161344 Method and structure for variable pitch microwave probe assembly |
| 01/09/2007 | US7160132 Battery pack—cordless power device interface system |
| 01/09/2007 | US7160127 Variable latch |