| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/13/2007 | US7189078 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 03/13/2007 | US7189077 Lithographic type microelectronic spring structures with improved contours |
| 03/08/2007 | WO2007027155A1 Invertible modular test device for testing integrated circuit devices |
| 03/08/2007 | WO2007026877A1 Circuit board inspecting apparatus and circuit board inspecting method |
| 03/08/2007 | WO2007026774A1 Probe card |
| 03/08/2007 | WO2007026663A1 Circuit board inspection instrument, circuit board inspection method, and anisotropic conductivity connector |
| 03/08/2007 | US20070054513 Methods of fabricating and using shaped springs |
| 03/08/2007 | US20070052432 Probe card |
| 03/08/2007 | US20070052410 MEMS based current sensor using magnetic-to-mechanical conversion and reference components |
| 03/08/2007 | US20070051984 Rewiring substrates strip with several semiconductor component positions |
| 03/08/2007 | US20070051169 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 03/08/2007 | DE102006028080A1 Klemmtesthalterung für eine Hochfrequenzminiatursonderanordnung Terminal test fixture for high frequency miniature special arrangement |
| 03/07/2007 | EP1759217A1 A hand-held probe |
| 03/07/2007 | CN1926676A Probe positioning and bonding device and probe bonding method |
| 03/07/2007 | CN1926438A See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 03/07/2007 | CN1926437A Circuit board inspecting device and circuit board inspection method |
| 03/07/2007 | CN1303679C Connector and method of manufacturing the same |
| 03/06/2007 | US7187189 Burn-in testing apparatus and method |
| 03/06/2007 | US7187062 Coupler detector |
| 03/01/2007 | WO2007023884A1 Guide plate for probe card and method of processing the same |
| 03/01/2007 | WO2007023851A1 Probe device and method of regulating contact pressure between object to be inspected and probe |
| 03/01/2007 | WO2007023596A1 Anisotropic conductive sheet, production method thereof, connection method and inspection method |
| 03/01/2007 | WO2007005667A3 Dual tapered spring probe |
| 03/01/2007 | WO2005115068A8 High density interconnect system having rapid fabrication cycle |
| 03/01/2007 | US20070050159 High-voltage power supply control system and wireless controller and method therefor |
| 03/01/2007 | US20070046313 Mounting Spring Elements on Semiconductor Devices, and Wafer-Level Testing Methodology |
| 03/01/2007 | US20070046280 Auxiliary element for fixing a current sensor to an electrical conductor |
| 03/01/2007 | US20070045874 Lithographic Type Microelectronic Spring Structures with Improved Contours |
| 03/01/2007 | DE19537358B4 IC-Träger IC carrier |
| 02/28/2007 | EP1290454B1 Microcontactor probe and electric probe unit |
| 02/28/2007 | CN2874524Y Thyrester tube core parameter detection mould |
| 02/28/2007 | CN2874503Y Chip detection circuit board |
| 02/28/2007 | CN2874502Y Adhesive sheet element detection clamp |
| 02/28/2007 | CN1922495A Electric connector |
| 02/28/2007 | CN1922494A Needle-like member, conductive contact, and conductive contact unit |
| 02/28/2007 | CN1922493A Adapter for circuit board examination and device for circuit board examination |
| 02/28/2007 | CN1921081A Test base board and its chassis |
| 02/28/2007 | CN1920578A Method of manufacturing a probe and a detection card |
| 02/28/2007 | CN1920577A Modular high frequency detection card |
| 02/28/2007 | CN1302315C Liquid crystal display assembly |
| 02/28/2007 | CN1302286C Probe contacting system having plane adjusting mechanism |
| 02/27/2007 | US7184904 System and method for providing universal additional functionality for power meters |
| 02/27/2007 | US7183785 Test system and method for reduced index time |
| 02/27/2007 | US7183775 Systems and methods for determining whether a heat sink is installed |
| 02/27/2007 | US7183194 Method of forming socket contacts |
| 02/22/2007 | WO2006007003B1 Antenna efficiency test device |
| 02/22/2007 | US20070040549 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 02/22/2007 | US20070040547 MEMS based current sensor using magnetic-to-mechanical conversion and reference components |
| 02/21/2007 | EP1754074A2 Contactless interfacing of test signals with a device under test |
| 02/21/2007 | EP1754072A2 Thermal optical chuck |
| 02/21/2007 | EP1754068A1 Improvements in or relating to probe cards |
| 02/21/2007 | EP1247063B1 Scanning force microscope probe cantilever with reflective structure |
| 02/21/2007 | CN2872367Y High pressure metering cabinet against charge evasion |
| 02/21/2007 | CN2872365Y External safeguard of multimeter |
| 02/21/2007 | CN2872364Y Large-power light emitting diodes measuring tool |
| 02/21/2007 | CN1917316A Overpressure resistant adapter for switchgear insulated by gases |
| 02/21/2007 | CN1916645A Banks of elastic probe, and fabricating method |
| 02/21/2007 | CN1916644A Cantalever type probe card in high frequency |
| 02/21/2007 | CN1916643A Device for testing integrated electric apparatus |
| 02/21/2007 | CN1916642A Module for correcting synchronization of sensitive rod, and method for correcting synchronization of sensitive rod |
| 02/21/2007 | CN1916641A Test system for electric components |
| 02/21/2007 | CN1301512C Shunt resistance and method of adjusting shunt resistance |
| 02/21/2007 | CN1301409C Method and system for compensating thermally induced motion of probe cards |
| 02/20/2007 | US7181132 Method and system for loading substrate supports into a substrate holder |
| 02/20/2007 | US7180317 High resolution analytical probe station |
| 02/20/2007 | US7180315 Substrate with patterned conductive layer |
| 02/20/2007 | US7180312 Probe card and method for manufacturing probe card |
| 02/20/2007 | US7178236 Method for constructing a membrane probe using a depression |
| 02/15/2007 | WO2007018186A1 Apparatus and method for inspecting fine structure and inspection program |
| 02/15/2007 | WO2007017956A1 Probe assembly |
| 02/15/2007 | WO2007017955A1 Probe for energization test |
| 02/15/2007 | US20070038394 System and method for reading power meters |
| 02/15/2007 | US20070037418 Process of forming socket contacts |
| 02/15/2007 | US20070035317 Multimeter having off-device display device and selection device |
| 02/14/2007 | EP1753100A1 Contactor and electrical connector |
| 02/14/2007 | EP1751558A1 Socket for connecting ball-grid-array integrated circuit device to test circuit |
| 02/14/2007 | EP1751557A2 Flexible microcircuit space transformer assembly |
| 02/14/2007 | CN2869870Y Electric-field probe for electromagnetic compatibility near-field detection |
| 02/14/2007 | CN1914504A Method and apparatus for preventing damage to electronics during tire inspection |
| 02/14/2007 | CN1912637A Donut-type parallel probe card and method of testing semiconductor wafer using same |
| 02/14/2007 | CN1912636A Probe structure of preventing noise interference for semiconductor test board |
| 02/14/2007 | CN1912635A Probe card for testing image sensing chip |
| 02/14/2007 | CN1912634A Vertical probe card |
| 02/14/2007 | CN1912633A Semiconductor test plate structure for preventing noise interference |
| 02/14/2007 | CN1912632A Circuit board testing device |
| 02/14/2007 | CN1912631A Applied module of test plate |
| 02/13/2007 | US7177142 Hybrid compression socket connector for integrated circuits |
| 02/13/2007 | US7176705 Thermal optical chuck |
| 02/13/2007 | US7176704 Inspecting apparatus for semiconductor device |
| 02/13/2007 | US7176702 Contact system for wafer level testing |
| 02/13/2007 | US7176698 Voltage sensing device and associated method |
| 02/13/2007 | US7174629 Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor |
| 02/08/2007 | WO2007016599A1 Method and apparatus for cleaning a probe card |
| 02/08/2007 | WO2007015713A1 Torsion spring probe contactor design |
| 02/08/2007 | WO2007015712A1 Post and tip design for a probe contact |
| 02/08/2007 | WO2007015600A1 Vertical probe and methods of fabricating and bonding the same |
| 02/08/2007 | WO2007015314A1 Electric connection device |
| 02/08/2007 | US20070030021 Probe station thermal chuck with shielding for capacitive current |
| 02/08/2007 | US20070029993 Automatic electric discharge tool |
| 02/08/2007 | US20070029988 Method and structure for variable pitch microwave probe assembly |