| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 04/05/2007 | DE19807913B4 Prüfsonde für ein Meßinstrument sowie ein die Prüfsonde enthaltendes Prüfgerät Probe for a measuring instrument and a probe containing the tester |
| 04/05/2007 | DE10220343B4 Vorrichtung und Verfahren zum Prüfen von Leiterplatten und Prüfsonde Apparatus and method for testing circuit boards and probe |
| 04/05/2007 | DE102006029277A1 Signalsonde und Sondenanordnung Signal probe and probe assembly |
| 04/05/2007 | DE102005047483A1 Probe e.g. passive wave guide probe, for e.g. oscilloscope, has two test prods that are provided on changing device, where changing device is connected to probe and is alternately connected to electric waveguide that runs inside probe |
| 04/04/2007 | EP1769660A1 Ic socket |
| 04/04/2007 | CN2886581Y Safe hypostasis detecting pen |
| 04/04/2007 | CN1942773A Inspection unit |
| 04/04/2007 | CN1942769A 探针 Probe |
| 04/04/2007 | CN1940575A Non-planar PC testing board |
| 04/04/2007 | CN1940574A Test socket |
| 04/04/2007 | CN1940573A 测试夹具 Test Fixture |
| 04/04/2007 | CN1940572A Integrated circuit testing card |
| 04/04/2007 | CN1308693C Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 04/03/2007 | US7200205 Interface device for testing a telecommunication circuit |
| 04/03/2007 | US7199598 Burn-in substrate for semiconductor devices |
| 04/03/2007 | US7199596 Manual testing instrument |
| 04/03/2007 | US7199593 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 04/03/2007 | US7199572 Method and system for improving the operational safety, reliability, and functionality of electrical power consumption monitoring devices |
| 04/03/2007 | US7198962 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 04/03/2007 | US7198505 Light socket 3 |
| 03/29/2007 | WO2007034921A1 Electrical contact and socket for electrical component |
| 03/29/2007 | WO2007034697A1 Probe card and method for manufacturing same |
| 03/29/2007 | WO2006044248A3 Electrical-energy meter adaptable for optical communication with various external devices |
| 03/29/2007 | US20070072449 Contact and electrical connecting apparatus |
| 03/29/2007 | US20070072313 Anisotropic conductive connector and circuit device inspection method |
| 03/29/2007 | US20070069747 Probe tile for probing semiconductor wafer |
| 03/29/2007 | US20070069746 Probing card and inspection apparatus for microstructure |
| 03/29/2007 | US20070069744 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 03/29/2007 | US20070069743 Sheet-like probe, process for producing the same and its application |
| 03/28/2007 | EP1768214A1 Anisotropic conductive connector and inspection equipment for circuit device |
| 03/28/2007 | EP1767953A1 Inspection equipment of circuit board and inspection method of circuit board |
| 03/28/2007 | EP1766748A1 Earthing and overvoltage protection arrangement |
| 03/28/2007 | EP1766427A1 Substrate with patterned conductive layer |
| 03/28/2007 | EP1766426A2 Probe head having a membrane suspended probe |
| 03/28/2007 | EP1368665B1 High bandwidth probe assembly |
| 03/28/2007 | CN2884206Y Probe for testing the picture elements of display panel |
| 03/28/2007 | CN2884205Y Disassembling-free type device for detecting that if BIOS be of available |
| 03/28/2007 | CN2884204Y Base for testing ball-grid array type integrated circuit |
| 03/28/2007 | CN1938842A Probe apparatus, wafer-inspecting apparatus provided with the probe apparatus, and the wafer-inspecting method |
| 03/28/2007 | CN1938594A Inspection block |
| 03/28/2007 | CN1937326A Connecting component |
| 03/28/2007 | CN1936598A Method and apparatus for discharging voltages from a circuit under test |
| 03/28/2007 | CN1936597A 高带宽探头 High bandwidth probes |
| 03/28/2007 | CN1936596A Connection point assembly and lsi chip detection device for the same |
| 03/28/2007 | CN1936595A Coaxial multi-detection-point detecting rod |
| 03/28/2007 | CN1936594A Probe card transfer assist apparatus, and inspection equipment and method using same |
| 03/28/2007 | CN1936593A Simple-beam type microelectronic mechanical system detection card and producing method thereof |
| 03/28/2007 | CN1936592A Testing electric clip |
| 03/28/2007 | CN1307748C Connecting unit and method for producing the same |
| 03/27/2007 | US7196533 Control system and method of semiconductor inspection system |
| 03/27/2007 | US7196532 Test probe for semiconductor package |
| 03/27/2007 | US7196531 Method of manufacturing a probe card |
| 03/27/2007 | US7196530 Device testing contactor, method of producing the same, and device testing carrier |
| 03/27/2007 | US7195503 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 03/22/2007 | WO2007033146A2 Lateral interposer contact design and probe card assembly |
| 03/22/2007 | WO2005043084A3 A tap- resistant system with an optical device |
| 03/22/2007 | US20070066042 Method of forming an electrical contact |
| 03/22/2007 | US20070065956 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
| 03/22/2007 | US20070063725 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 03/22/2007 | US20070063722 Method and apparatus for testing bumped die |
| 03/22/2007 | US20070062913 Probe Array and Method of Its Manufacture |
| 03/21/2007 | EP1365250B1 Method of manufacturing contact probe |
| 03/21/2007 | CN2881652Y Universal test interface equipment and its universal test system |
| 03/21/2007 | CN2881651Y Testing socket for electrical property of electric package |
| 03/21/2007 | CN2881650Y Testing apparatus |
| 03/21/2007 | CN1934453A Contact probe for a testing head |
| 03/21/2007 | CN1933119A Contactor having contact electrodes formed by laser processing |
| 03/21/2007 | CN1932529A Module detecting card |
| 03/21/2007 | CN1932528A Testing bar of tester and producing method thereof |
| 03/21/2007 | CN1932527A Probe card clamp mechanism and probe apparatus |
| 03/21/2007 | CN1932526A Signal probe and probe assembly |
| 03/21/2007 | CN1932525A Zero-setting device for electrical measuring instrument and method for raising air breakdown-resisting voltage value of electric measuring instrument |
| 03/21/2007 | CN1306662C 矩阵式连接器 Matrix Connector |
| 03/21/2007 | CN1306277C Manipulator for a test head with active compliance |
| 03/20/2007 | US7193428 Low threshold current switch |
| 03/20/2007 | US7192806 Method of establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| 03/15/2007 | WO2007030121A1 Method and system for monitoring power flow through an electric power transmission line |
| 03/15/2007 | WO2007029791A1 Conductive contact and method for manufacturing conductive contact |
| 03/15/2007 | WO2007029766A1 Probe card for wafer test, wafer-testing device, and wafer-testing method |
| 03/15/2007 | WO2007029422A1 Semiconductor device inspecting apparatus and power supply unit |
| 03/15/2007 | WO2005121824A3 Thermal optical chuck |
| 03/15/2007 | US20070059915 Method of forming an electrical contact |
| 03/15/2007 | DE102004040859B4 Elektrische Reihenklemme und Prüfstecker zur Verwendung bei einer elektrischen Klemme Electrical terminal and test for use in an electrical terminal |
| 03/14/2007 | EP1762001A1 Circuit arrangement and method for adjusting the power input of a load which can be operated on a direct current supply network |
| 03/14/2007 | EP1364221B1 Planarizing interposer |
| 03/14/2007 | CN2879197Y Wiring device for battery testing equipment |
| 03/14/2007 | CN2879196Y chip testing modular |
| 03/14/2007 | CN2879195Y 测试装置 Testing device |
| 03/14/2007 | CN2879194Y Test collecting components matched with portable testing meter |
| 03/14/2007 | CN1930737A Cable terminal with air-enhanced contact pins |
| 03/14/2007 | CN1930482A Probe and probe manufacturing method |
| 03/14/2007 | CN1930326A Electrical potential-assisted assembly of molecular devices |
| 03/14/2007 | CN1929106A Method for controlling parallelism between probe card and mounting table, inspection program, and inspection apparatus |
| 03/14/2007 | CN1928570A Clamping test fixture for a high frequency miniature probe assembly |
| 03/14/2007 | CN1305181C Connecting component |
| 03/13/2007 | US7190446 System for processing electronic devices |
| 03/13/2007 | US7190182 Test probe for finger tester and corresponding finger tester |
| 03/13/2007 | US7190181 Probe station having multiple enclosures |
| 03/13/2007 | US7190180 Anisotropic conductive connector and production method therefor and inspection unit for circuit device |
| 03/13/2007 | US7190179 Contact probe |