| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 05/03/2007 | WO2007050865A1 Method and apparatus for automatic test equipment |
| 05/03/2007 | US20070099446 Electrical connecting apparatus |
| 05/03/2007 | US20070096749 Electrical connecting apparatus and contact |
| 05/03/2007 | US20070096718 Voltage sensing device and associated method |
| 05/03/2007 | DE19800461B4 Untersuchungsspannvorrichtung Investigation jig |
| 05/02/2007 | EP1780551A1 Probe assembly with controlled impendance spring pin |
| 05/02/2007 | EP1780550A1 A probe for testing electrical properties of test samples |
| 05/02/2007 | EP1779471A2 Mechanically reconfigurable vertical tester interface for ic probing |
| 05/02/2007 | EP1559116A4 Probe station with low noise characteristics |
| 05/02/2007 | CN2896287Y Detection needle |
| 05/02/2007 | CN2896286Y Sheet-type resistance pressurizing test clamp |
| 05/02/2007 | CN2896285Y Sheet-type resistance network pressurizing, ageing sieving clamp |
| 05/02/2007 | CN1957454A Silicon wafer for probe bonding and probe bonding method using thereof |
| 05/02/2007 | CN1957260A Sheet probe, manufacturing method and application therefor |
| 05/02/2007 | CN1957259A Sheetlike probe, its manufacturing method and its application |
| 05/02/2007 | CN1955743A Probe device of probe card |
| 05/02/2007 | CN1955742A Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts |
| 05/02/2007 | CN1955741A Method and apparatus for a dut contactor |
| 05/01/2007 | US7212019 Probe needle for testing semiconductor chips and method for producing said probe needle |
| 05/01/2007 | US7212013 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 05/01/2007 | US7211997 Planarity diagnostic system, E.G., for microelectronic component test systems |
| 05/01/2007 | US7211155 Apparatuses and methods for cleaning test probes |
| 04/26/2007 | WO2007045004A1 Device for measuring the loss factor |
| 04/26/2007 | US20070093103 Variable latch |
| 04/26/2007 | US20070090855 Method and apparatus for testing bumped die |
| 04/26/2007 | DE10007434B4 Trägermodul für eine Mikro-BGA-Vorrichtung Support module for a micro-BGA device |
| 04/26/2007 | CA2626376A1 Device for measuring the loss factor |
| 04/25/2007 | EP1777529A2 Electric signal connecting device and probe assembly using the same |
| 04/25/2007 | EP1777194A2 Method for forming microelectronic spring structures on a substrate |
| 04/25/2007 | CN1954471A Earthing and overvoltage protection arrangement |
| 04/25/2007 | CN1954227A Contactless interfacing of test signals with a device under test |
| 04/25/2007 | CN1954225A Method for manufacturing semiconductor integrated circuit device |
| 04/25/2007 | CN1953276A Zero insertion force printed circuit assembly connector system and method |
| 04/25/2007 | CN1952667A Probe sheet adhesive holder, probe card, semiconductor inspection apparatus, and method for manufacturing semiconductor device |
| 04/25/2007 | CN1952666A Clamp for testing semiconductor photoelectronic device |
| 04/25/2007 | CN1952654A Gas detecting apparatus and method based on field ionization effect |
| 04/25/2007 | CN1312483C Loading location system |
| 04/24/2007 | US7208971 Manual probe carriage system and method of using the same |
| 04/24/2007 | US7208967 Socket connection test modules and methods of using the same |
| 04/24/2007 | US7208966 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
| 04/24/2007 | US7208964 Probe card |
| 04/24/2007 | US7208959 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 04/24/2007 | US7208936 Socket lid and test device |
| 04/24/2007 | US7208935 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 04/19/2007 | WO2007043350A1 Anisotropic conductive connector and inspection equipment of circuit device |
| 04/19/2007 | DE102006026893A1 Sonde hoher Bandbreite Probe high bandwidth |
| 04/18/2007 | EP1774583A2 Method and apparatus for producing co-planar bonding pads on a substrate |
| 04/18/2007 | EP1774345A1 Probe tip plating |
| 04/18/2007 | EP1714161B1 Auxiliary element for fixing a current sensor to an electrical conductor |
| 04/18/2007 | CN2891350Y Automatic trolley-main body power engaging device |
| 04/18/2007 | CN2891239Y High-capacity standard capacitor |
| 04/18/2007 | CN2890926Y Direct plug-in type terminal quick wiring pin |
| 04/18/2007 | CN2890925Y 测试装置 Test device |
| 04/18/2007 | CN2890924Y Wire dedicated for electric energy metering device |
| 04/18/2007 | CN2890923Y Split type testing jig |
| 04/18/2007 | CN2890922Y Automobile speed regulating keyboard plate detector |
| 04/18/2007 | CN2890921Y Improved structure of IC detection seat |
| 04/18/2007 | CN2890920Y Test jip for display module of printed circuit board |
| 04/18/2007 | CN1949595A Copper/saturated copper sulphate gel reference electrode |
| 04/18/2007 | CN1948972A Positioning unit for probe device |
| 04/18/2007 | CN1948971A Probe calliper electrical contacting device |
| 04/18/2007 | CN1948970A High power digital varistor and testing method thereof |
| 04/18/2007 | CN1311593C Bead lattice array connector |
| 04/17/2007 | US7206711 System and method for automatically comparing test points of a PCB |
| 04/17/2007 | US7205784 Probe for combined signals |
| 04/17/2007 | US7204708 Socket for semiconductor device |
| 04/17/2007 | US7204008 Method of making an electronics module |
| 04/17/2007 | CA2445380C Support rack for vibratory testing of printed circuit boards |
| 04/12/2007 | WO2007041585A1 Cantilever probe structure for a probe card assembly |
| 04/12/2007 | WO2007041002A1 Voltage sensors and voltage sensing methods for gas insulated switchgear |
| 04/12/2007 | WO2007039204A1 Probe with a changing device |
| 04/12/2007 | WO2007038973A1 Method of manufacturing an electrical contact and electrical contact |
| 04/12/2007 | US20070080698 Contact System for Wafer Level Testing |
| 04/12/2007 | DE4122371C5 Mikroprozessorgesteuertes elektronisches Meßgerät Microprocessor-controlled electronic measuring instrument |
| 04/11/2007 | EP1296145B1 Conductive contact |
| 04/11/2007 | EP0925510B1 Integrated compliant probe for wafer level test and burn-in |
| 04/11/2007 | CN2888452Y Circuit board performance test assisting device |
| 04/11/2007 | CN2888451Y Probe head of micro-elastic contactor |
| 04/11/2007 | CN2888450Y Clamp |
| 04/11/2007 | CN1947022A Intelligent probe card architecture |
| 04/11/2007 | CN1947021A Wireless test cassette |
| 04/11/2007 | CN1945349A Flexible generating device for embedded AC motor complex fault |
| 04/11/2007 | CN1945348A Flexible generating device for AC motor complex fault |
| 04/11/2007 | CN1945340A Detecting apparatus for circuit board |
| 04/11/2007 | CN1945339A Carousel device, system and method for electronic circuit tester |
| 04/10/2007 | US7202687 Systems and methods for wireless semiconductor device testing |
| 04/10/2007 | US7202686 Socket and test apparatus |
| 04/10/2007 | US7202682 Composite motion probing |
| 04/10/2007 | US7202679 Contactor having conductive particles in a hole as a contact electrode |
| 04/10/2007 | US7202678 Resistive probe tips |
| 04/10/2007 | US7202677 Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component |
| 04/10/2007 | US7200930 Probe for semiconductor devices |
| 04/05/2007 | WO2007036601A1 Method, circuit board and test apparatus for testing solder joints |
| 04/05/2007 | WO2007008754A3 Integrated circuit test socket |
| 04/05/2007 | WO2007008754A2 Integrated circuit test socket |
| 04/05/2007 | US20070075724 Thermal optical chuck |
| 04/05/2007 | US20070075721 Burn-in testing apparatus and method |
| 04/05/2007 | US20070075716 Probe for testing a device under test |
| 04/05/2007 | US20070075715 Contact Carriers (Tiles) For Populating Larger Substrates With Spring Contacts |
| 04/05/2007 | US20070074392 Membrane probing system |