| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/05/2007 | US7227348 Apparatus for measuring an a.c. current in a cable |
| 06/05/2007 | US7225538 Resilient contact structures formed and then attached to a substrate |
| 06/05/2007 | US7225531 Index head in semicondcutor device test handler |
| 06/05/2007 | CA2357674C Coil ignition oscilloscope adapter |
| 05/31/2007 | WO2007060940A1 Probe holder and probe unit |
| 05/31/2007 | WO2007060939A1 Conductive contact unit, and conductive contact |
| 05/31/2007 | WO2007060935A1 Probe pin and method for manufacturing probe pin |
| 05/31/2007 | WO2007023422A3 Inspection method and inspection device for substrates |
| 05/31/2007 | WO2005070143A3 Radio frequency identification tag inlay sortation and assembly |
| 05/31/2007 | US20070123099 Connector, printed circuit board, connecting device connecting them, and method of testing electronic part, using them |
| 05/31/2007 | US20070123082 Interconnect Assemblies And Methods |
| 05/31/2007 | US20070122128 Method and system for loading substrate supports into a substrate holder |
| 05/31/2007 | US20070121269 Earthing and overvoltage protection arrangement |
| 05/31/2007 | US20070120553 Method and System for Calibrating A Micro-Electromechanical System (MEMS) Based Sensor Using Tunneling Current Sensing |
| 05/30/2007 | EP1789808A1 Waveguide samplers and frequency converters |
| 05/30/2007 | EP1553622B1 Anisotropic conductivity testconnector |
| 05/30/2007 | CN2906629Y Probe structure of test card |
| 05/30/2007 | CN1973210A Inspection device for circuit board and inspection method for circuit board |
| 05/30/2007 | CN1973208A A method for providing alignment of a probe |
| 05/30/2007 | CN1973207A Sheetlike probe, its manufacturing method and its application |
| 05/30/2007 | CN1973206A Dual channel source measurement unit for semiconductor device testing |
| 05/30/2007 | CN1971296A Universal testing interface device and its universal testing system |
| 05/30/2007 | CN1971288A Thin-film probe card |
| 05/30/2007 | CN1971287A Probe of probe card and its manufacturing method |
| 05/30/2007 | CN1971286A Connection accessory for micro-probing |
| 05/30/2007 | CN1971285A Probe card capable of transmitting differential signal pairs |
| 05/29/2007 | US7224159 Foldable multimeter |
| 05/24/2007 | WO2007058037A1 Jig for inspecting substrate, and inspection probe |
| 05/24/2007 | WO2007057990A1 Electronic component test equipment and method for loading performance board on the electronic component test equipment |
| 05/24/2007 | US20070117234 Sputtered Spring Films With Low Stress Anisotropy |
| 05/24/2007 | US20070113394 Air socket for testing integrated circuits |
| 05/24/2007 | DE10393364B4 Lochmikrosonde unter Nutzung einer MEMS-Technik und ein Verfahren zur Herstellung derselben Hollow microprobe using an MEMS technique and a method of manufacturing the same |
| 05/23/2007 | EP1788401A1 Method and apparatus for testing electrical characteristics of object under test |
| 05/23/2007 | EP1787130A1 Interconnect assembly for a probe card |
| 05/23/2007 | CN2903992Y Waveform generator circuit for sleeve tester |
| 05/23/2007 | CN2903991Y Tester for detecting image sensing element |
| 05/23/2007 | CN1969192A Socket cover and test interface |
| 05/23/2007 | CN1967317A Inspection method and apparatus of flat display pane |
| 05/23/2007 | CN1967262A Bracket and its production method |
| 05/23/2007 | CN1967261A Inspection device and inspection method |
| 05/22/2007 | US7221177 Probe apparatus with optical length-measuring unit and probe testing method |
| 05/22/2007 | US7221176 Vacuum prober and vacuum probe method |
| 05/22/2007 | US7221174 Probe holder for testing of a test device |
| 05/22/2007 | US7221146 Guarded tub enclosure |
| 05/22/2007 | US7221145 Simplified power monitoring system for electrical panels |
| 05/22/2007 | US7220989 Test apparatus for a semiconductor package |
| 05/22/2007 | US7219426 Method of manufacturing protruding-volute contact |
| 05/22/2007 | US7219422 Fabrication method of semiconductor integrated circuit device |
| 05/22/2007 | US7219418 Method to prevent damage to probe card |
| 05/18/2007 | WO2007055713A2 Pin electronics implemented system and method for reduced index time |
| 05/18/2007 | WO2007055012A1 Contact unit and testing system |
| 05/17/2007 | US20070111560 Conductive-contact holder and conductive-contact unit |
| 05/17/2007 | US20070109001 System for evaluating probing networks |
| 05/17/2007 | US20070108987 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses |
| 05/17/2007 | US20070108965 Planarity diagnostic system, e.g., for microelectronic component test systems |
| 05/17/2007 | US20070108961 Method and apparatus for tiling memories in integrated circuit layout |
| 05/16/2007 | EP1785733A1 Probing apparatus and method for adjusting probing apparatus |
| 05/16/2007 | EP1493209B1 Shielded cable terminal with contact pins mounted to printed circuit board |
| 05/16/2007 | CN2901342Y Central high density resistance rate instrument coverage cable |
| 05/16/2007 | CN2901321Y Switch connector for multimeter pen |
| 05/16/2007 | CN2901320Y Safety switching connector with fuse |
| 05/16/2007 | CN2901319Y Thin film capacitor test clamp |
| 05/16/2007 | CN2901318Y Pressure frame moving mechanism for test instrument |
| 05/16/2007 | CN1964020A Fabrication method of semiconductor integrated circuit device and probe card |
| 05/16/2007 | CN1963535A Automatic compensation of gain versus temperature |
| 05/16/2007 | CN1963531A Probe card capable of replacing electron accessory rapidly |
| 05/16/2007 | CN1316253C Inverse needle regulating harness for liftable probe card and needle regulating method |
| 05/15/2007 | US7218201 High pressure resistance body element |
| 05/15/2007 | US7218131 Inspection probe, method for preparing the same, and method for inspecting elements |
| 05/15/2007 | US7218130 Bottom side stiffener probe card |
| 05/15/2007 | US7218096 Adjusting device for chip adapter testing pin |
| 05/15/2007 | US7218095 Method and apparatus for electromagnetic interference shielding in an automated test system |
| 05/15/2007 | US7217990 Tape package having test pad on reverse surface and method for testing the same |
| 05/15/2007 | US7217580 Method for processing an integrated circuit |
| 05/10/2007 | WO2007052622A1 Method of manufacturing probe card |
| 05/10/2007 | WO2007052558A1 Method for manufacturing conductive contact holder |
| 05/10/2007 | WO2007052557A1 Method for manufacturing conductive contact holder, and conductive contact holder |
| 05/10/2007 | WO2007052508A1 Probe needle for probe card |
| 05/10/2007 | WO2007051471A1 A probe for testing electrical properties of a test sample |
| 05/10/2007 | US20070103183 Isolation Buffers With Controlled Equal Time Delays |
| 05/10/2007 | US20070103180 Universal wafer carrier for wafer level die burn-in |
| 05/10/2007 | DE102006032268A1 Probe e.g. high bandwidth differential probe, for device under test, has differential probe head with replaceable probe tips connected to pair of signal ground elements for representing probed signal |
| 05/10/2007 | DE102005053146A1 Messspitze zur Hochfrequenzmessung Probe for high frequency measurement |
| 05/10/2007 | DE10003282B4 Kontaktstruktur Contact structure |
| 05/09/2007 | EP1782079A1 Calibration standard |
| 05/09/2007 | EP1782077A1 Stacked tip cantilever electrical connector |
| 05/09/2007 | EP1362005B1 Method for forming electrically conductive contact structures |
| 05/09/2007 | CN2898837Y Interface device of testing clamp |
| 05/09/2007 | CN2898836Y Mainboard rack device |
| 05/09/2007 | CN1961218A Double side probing of semiconductor devices |
| 05/09/2007 | CN1961217A System and method for reading power meters |
| 05/09/2007 | CN1961216A Socket for connecting ball-grid-array integrated circuit device to test circuit |
| 05/09/2007 | CN1959987A Improved calibration method for measuring gate resistance of power MOS gate device at wafer level |
| 05/09/2007 | CN1959582A Accurate pure AC voltage/current convertor with low noise |
| 05/09/2007 | CN1959418A 高带宽探头 High bandwidth probes |
| 05/09/2007 | CN1315135C Compliant electrical contact |
| 05/09/2007 | CN1314976C Universal test interface between device under test and test head |
| 05/09/2007 | CN1314970C Probe unit and its manufacturing method |
| 05/08/2007 | US7215131 Segmented contactor |
| 05/08/2007 | US7214962 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |