| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 07/05/2007 | US20070152686 Knee probe having increased scrub motion |
| 07/05/2007 | DE10320925B4 Verfahren zum Testen von unbestückten Leiterplatten A method for testing of bare printed circuit boards |
| 07/04/2007 | EP1802482A1 Intelligent security connection device |
| 07/04/2007 | EP1326079B1 Probe card |
| 07/04/2007 | CN1993621A Calibration standard |
| 07/04/2007 | CN1991398A Semiconductor testing device and semiconductor testing method |
| 07/04/2007 | CN1991372A Signal detecting apparatus |
| 07/04/2007 | CN1989871A Cleaning member and probe device |
| 07/03/2007 | US7239973 Method and test adapter for testing an appliance having a smart card reader |
| 07/03/2007 | US7239158 Holder for conductive contact |
| 07/03/2007 | US7239154 Soil penetrating electrode with conical taper |
| 07/03/2007 | US7239152 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 07/03/2007 | US7239127 Apparatus and method for inspecting electronic circuits |
| 07/03/2007 | US7239123 Multiplexed dual-purpose magnetoresistive sensor and method of measuring current and temperature |
| 07/03/2007 | CA2531374A1 Multi-probes as single rf tuning element for rf slide-screw tuners |
| 06/28/2007 | WO2007072852A1 Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus |
| 06/28/2007 | WO2007071807A1 Testing adapter |
| 06/28/2007 | WO2007071608A1 Device, probe, and method for the galvanically decoupled transmission of a measuring signal |
| 06/28/2007 | WO2005086722A3 Optical current sensor with flux concentrator and method of attachment for non-circular conductors |
| 06/28/2007 | US20070145994 Socket and test apparatus |
| 06/28/2007 | US20070145990 Inspection unit |
| 06/28/2007 | US20070145885 Organic el panel |
| 06/28/2007 | US20070144841 Miniaturized Contact Spring |
| 06/27/2007 | EP1801699A2 Accessory device voltage management system controlled by a host |
| 06/27/2007 | EP1801598A2 Multimeter |
| 06/27/2007 | EP1274991B1 Current measuring apparatus for battery |
| 06/27/2007 | CN2916640Y Resilient probe |
| 06/27/2007 | CN1989664A Anisotropic conductive connector and production method therefor, adaptor device and electric inspection device for circuit device |
| 06/27/2007 | CN1989657A Anisotropic conductive connector and inspection equipment for circuit device |
| 06/27/2007 | CN1989606A Anisotropic conductive connector for wafer inspection, production method and application therefor |
| 06/27/2007 | CN1987487A Accessory device voltage management system controlled by a host |
| 06/26/2007 | US7235993 High speed electromechanically driven test ahead |
| 06/26/2007 | US7235984 Probe device and probe method |
| 06/26/2007 | US7235413 Fabrication method of semiconductor integrated circuit device |
| 06/21/2007 | WO2007069818A1 Detachable integrated probe block |
| 06/21/2007 | US20070139062 Test probe for semiconductor package |
| 06/21/2007 | US20070139060 Method and system for compensating thermally induced motion of probe cards |
| 06/21/2007 | DE202006019953U1 Oszilloskoptastkopf mit faseroptischem Sensor zur potentialfreien Erfassung elektrischer Größen Oscilloscope probe with fiber optic sensor for detection of electric potential sizes |
| 06/20/2007 | EP1798561A1 Treating method for probes positioned on a test card |
| 06/20/2007 | EP1797437A1 Device for determining electric variables |
| 06/20/2007 | EP1624308B1 Probe for testing electric conduction |
| 06/20/2007 | CN2914098Y Probe equipment |
| 06/20/2007 | CN2914097Y Circuit board negative testing machine with structure of supporting glass sheet |
| 06/20/2007 | CN2914096Y Circuit board negative testing machine with pinch roller structure |
| 06/20/2007 | CN1985554A Ic插座 Ic Socket |
| 06/20/2007 | CN1985180A Device and method for inspection of circuit board |
| 06/20/2007 | CN1982896A Inspection fixture for printed wiring board |
| 06/20/2007 | CN1322568C Prober and probe testing method for temperature-controlling object to be tested |
| 06/20/2007 | CN1322567C Semiconductor device contactor |
| 06/19/2007 | US7233160 Wafer probe |
| 06/19/2007 | US7233158 Air socket for testing integrated circuits |
| 06/19/2007 | US7233157 Test board for high-frequency system level test |
| 06/19/2007 | US7233156 Capacity load type probe, and test jig using the same |
| 06/19/2007 | US7232328 Insert and electronic component handling apparatus provided with the same |
| 06/19/2007 | US7231704 Contact spring and socket combination for high bandwidth probe tips |
| 06/14/2007 | WO2007066643A1 Probe pin, probe card, and probe device |
| 06/14/2007 | WO2007066623A1 Probe card |
| 06/14/2007 | WO2007066622A1 Probe card |
| 06/14/2007 | WO2007066382A1 Double end displacement type contact probe |
| 06/14/2007 | US20070134824 Probe card and method for manufacturing probe card |
| 06/14/2007 | DE19957326B4 Verfahren zur Herstellung von Kontaktstrukturen A method for producing contact structures |
| 06/13/2007 | EP1796157A1 Semiconductor wafer evaluating method and semiconductor wafer evaluating apparatus |
| 06/13/2007 | EP1795906A1 Microcontactor probe and electric probe unit |
| 06/13/2007 | EP1795905A1 Microcontactor probe and electric probe unit |
| 06/13/2007 | EP1549961B1 Test head positioning apparatus |
| 06/13/2007 | CN1979194A Electrical test apparatus for testing an electrical test piece and corresponding method |
| 06/13/2007 | CN1979193A Ageing test apparatus and ageing test plate |
| 06/13/2007 | CN1979178A Vertrical probe clasp mfg. method |
| 06/13/2007 | CN1979177A Micro-hole guide with reinforcing structure |
| 06/13/2007 | CN1979176A Method for producing in batch vertical probe clasp micro-hole guide plate |
| 06/13/2007 | CN1321327C Transportation mechanism, mobile probe board transportation apparatus, using same, and detector thereof |
| 06/12/2007 | US7230830 Semiconductor device socket |
| 06/12/2007 | US7230439 Method for detecting and monitoring wafer probing process instability |
| 06/12/2007 | US7230438 Thin film probe card contact drive system |
| 06/12/2007 | US7230437 Mechanically reconfigurable vertical tester interface for IC probing |
| 06/07/2007 | WO2007063029A2 Nanoscale fault isolation and measurement system |
| 06/07/2007 | WO2007062943A1 Apparatus for detecting an electrical variable of a rechargeable battery and method for producing said apparatus |
| 06/07/2007 | WO2000048352A3 Device and method for remotely reading meters |
| 06/07/2007 | US20070128906 Needle-like member, conductive contact, and conductive contact unit |
| 06/07/2007 | US20070126446 Ground-signal-ground (gsg) test structure |
| 06/07/2007 | US20070126444 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 06/07/2007 | US20070126443 Method of Manufacturing A Probe Card |
| 06/07/2007 | US20070124932 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 06/06/2007 | EP1793232A2 Electrical Contacting Device and Test Apparatus for Testing an Electrical Test Piece |
| 06/06/2007 | EP1793231A2 Electrical Test Apparatus for Testing an Electrical Test Piece and Corresponding Method |
| 06/06/2007 | CN2909561Y Terminal plate |
| 06/06/2007 | CN2909559Y Auxiliary element for adhering component testing and lead |
| 06/06/2007 | CN2909265Y Electric automatic instrument |
| 06/06/2007 | CN2909264Y Simple changing mechanism of high sensitivity application investigating device |
| 06/06/2007 | CN1977344A Compliant electrical contact assembly |
| 06/06/2007 | CN1977172A Probe card |
| 06/06/2007 | CN1975440A Universal test interface between a device under test and a test head |
| 06/06/2007 | CN1975439A Probe card transfer assist apparatus and inspection equipment using same |
| 06/06/2007 | CN1320698C System for actuating electronic component contactor containing contact force controlling mechanism |
| 06/06/2007 | CN1320369C Production of testing clamping device with connection wires and clamping device |
| 06/05/2007 | US7227371 High performance probe system |
| 06/05/2007 | US7227369 Micro probe 2 |
| 06/05/2007 | US7227368 Testing head contact probe with an eccentric contact tip |
| 06/05/2007 | US7227352 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
| 06/05/2007 | US7227349 Method and apparatus for the digital and analog triggering of a signal analysis device |