| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 08/09/2007 | US20070182428 Electrical characteristics measurement method and electrical characteristics measurement device |
| 08/08/2007 | EP1816481A1 Electrical contact device and electrical contact method |
| 08/08/2007 | EP1816480A1 Oscilloscope with input frequency shift |
| 08/08/2007 | CN2932756Y 测试连接器 Test Connectors |
| 08/08/2007 | CN2932408Y Flip-plate fixing device of switch for detection of power switching |
| 08/08/2007 | CN2932392Y Automatic short-circuit current meter base |
| 08/08/2007 | CN2932391Y A test device of surface-mounted components |
| 08/08/2007 | CN101014865A A highly resilient cantilever spring probe for testing ics |
| 08/08/2007 | CN101014864A Probe attach tool |
| 08/07/2007 | US7253647 Probe for high electric current |
| 08/07/2007 | US7253645 Detection of defects in patterned substrates |
| 08/07/2007 | US7253608 Planarity diagnostic system, e.g., for microelectronic component test systems |
| 08/02/2007 | WO2007086147A1 Current testing probe, probe assembly and method for manufacturing such probe assembly |
| 08/02/2007 | WO2007086144A1 Probe card, probe card manufacturing method and probe card repairing method |
| 08/02/2007 | WO2007085711A2 Device for measuring dc current having large measurement swing, electronic trip comprising such a measurement device and cut-off device having such a trip |
| 08/02/2007 | US20070178814 Method of cleaning a probe |
| 08/02/2007 | US20070178727 Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method |
| 08/02/2007 | US20070176619 Probe For Semiconductor Devices |
| 08/02/2007 | DE10351227B4 Kontaktiereinrichtung für einen Elektrizitätszähler Contacting apparatus for a power meter |
| 08/02/2007 | DE10252106B4 Schnappverschließvorrichtung für einen KGD-Träger Schnappverschließvorrichtung for a KGD-carrier |
| 08/01/2007 | EP1485700B1 Battery monitoring method and apparatus |
| 08/01/2007 | CN2929733Y 测试板 Test Board |
| 08/01/2007 | CN101009268A Base board and its electric test method |
| 08/01/2007 | CN101009237A Insert with support for semiconductor package and assembly |
| 08/01/2007 | CN101008657A Regenerator probe |
| 07/31/2007 | US7251354 Electronic component inspection apparatus |
| 07/31/2007 | US7250782 Method for testing non-componented circuit boards |
| 07/31/2007 | US7250780 Probe card for semiconductor wafers having mounting plate and socket |
| 07/31/2007 | US7250752 Probe station having multiple enclosures |
| 07/31/2007 | US7250626 Probe testing structure |
| 07/26/2007 | US20070170951 Control system and method of semiconductor inspection system |
| 07/26/2007 | US20070170942 Methods for fabricating fences on interposer substrates |
| 07/26/2007 | US20070170941 Composite Motion Probing |
| 07/25/2007 | EP1811313A2 Electrical regenerator easurement probe |
| 07/25/2007 | EP1811311A1 Device for measuring current |
| 07/25/2007 | EP1811310A1 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection apparatus |
| 07/25/2007 | EP1810041A1 Battery sensor device |
| 07/25/2007 | EP1810040A2 Power supply and communications controller |
| 07/25/2007 | CN2927066Y Power-frequency magnetic-field generator |
| 07/25/2007 | CN2927058Y Four-wired clamp for inspecting battery |
| 07/25/2007 | CN1328779C Detecting clamp and its top cover |
| 07/25/2007 | CN101006352A Substrate with patterned conductive layer |
| 07/25/2007 | CN101006347A Stacked tip cantilever electrical connector |
| 07/25/2007 | CN101004428A Probe measurement device and system |
| 07/25/2007 | CN101004427A Electrical contacting device and test apparatus for testing an electrical test piece |
| 07/25/2007 | CN101004426A Radiated noise arrester of ground wire of bar for probing electric signals |
| 07/24/2007 | US7248058 Testing and calibration device with diagnostics |
| 07/19/2007 | WO2007081421A1 Automatic testing equipment instrument card and probe cabling system and apparatus |
| 07/19/2007 | WO2007080771A1 Contact probe |
| 07/19/2007 | WO2007080663A1 Coaxial connector, and coaxial probe for measurement |
| 07/19/2007 | WO2007080304A1 Battery circuit breaker comprising current-measuring means |
| 07/19/2007 | US20070167052 Ls4 bulb & socket system |
| 07/19/2007 | US20070165711 Electronic device including image forming apparatus |
| 07/19/2007 | US20070164731 Wide Bandwidth Attenuator Input Circuit for a Measurement Probe |
| 07/19/2007 | US20070164730 Wide Bandwidth Attenuator Input Circuit for a Measurement Probe |
| 07/19/2007 | US20070163104 Magnetic detection apparatus and method of manufacturing the same |
| 07/19/2007 | DE102005061683A1 Vorrichtung, Tastkopf und Verfahren zur galvanisch entkoppelten Übertragung eines Messsignals Device, probe and method for galvanically decoupled transmission of a measuring signal |
| 07/18/2007 | EP1808701A1 Test contact system |
| 07/18/2007 | EP1807710A1 Kelvin connector including temperature sensor |
| 07/18/2007 | EP1807708A1 Battery current sensor for a motor vehicle |
| 07/18/2007 | EP1553623B1 Anisotropic conductivity probe |
| 07/18/2007 | CN2924537Y Presstype probe |
| 07/18/2007 | CN1327575C Socket for inspection |
| 07/18/2007 | CN1327502C Inspection device and method for manufacturing the same |
| 07/18/2007 | CN1327231C Coaxial input adapter for giga hertz transverse electromagnetic wave cell |
| 07/18/2007 | CN101002363A Mechanically reconfigurable vertical tester interface for IC probing |
| 07/18/2007 | CN101002311A Method and apparatus for producing co-planar bonding pads on a substrate |
| 07/18/2007 | CN101002103A Probe tip plating |
| 07/18/2007 | CN101000362A Circuit board test platform |
| 07/17/2007 | US7245137 Test head assembly having paired contact structures |
| 07/17/2007 | US7244125 Connector for making electrical contact at semiconductor scales |
| 07/17/2007 | US7243410 Method for manufacturing a probe card |
| 07/12/2007 | WO2007078493A1 Probe card assembly |
| 07/12/2007 | WO2007077784A1 Contact probe |
| 07/12/2007 | WO2007077743A1 Probe card |
| 07/12/2007 | WO2007033146A3 Lateral interposer contact design and probe card assembly |
| 07/12/2007 | US20070161285 Electrically-conductive-contact holder, electrically-conductive-contact unit, and method for manufacturing electrically-conductive-contact holder |
| 07/12/2007 | US20070159200 Adapter for circuit board examination and device for circuit board examination |
| 07/12/2007 | US20070159196 Probe for combined signals |
| 07/12/2007 | US20070159188 Method for testing electronic modules using board with test contactors having beam contacts |
| 07/12/2007 | DE102004017191B4 Vorrichtung und Verfahren zur Ermittlung einer Richtung eines Objekts Apparatus and method for determining a direction of an object |
| 07/11/2007 | EP1806589A1 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment |
| 07/11/2007 | CN2921838Y Probe holder structure |
| 07/11/2007 | CN2921837Y Large current testing clamp head for air circuit breaker |
| 07/11/2007 | CN1996028A Substrate checking device and method |
| 07/11/2007 | CN1326324C Element structure utlizing photoshort circuit for generating sub-carrier lifetime guide electrical pulse |
| 07/11/2007 | CN1326291C Connecting device using spiral contact |
| 07/11/2007 | CN1326225C Micro-mechanical chip testing card and producing method thereof |
| 07/10/2007 | US7242206 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 07/10/2007 | US7242202 Signal probe and probe assembly |
| 07/10/2007 | US7242197 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses |
| 07/10/2007 | US7242177 Method and circuit arrangement for current measurement |
| 07/10/2007 | US7242173 Combined test instrument probe and voltage detector |
| 07/10/2007 | US7240432 Method of manufacturing a semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece |
| 07/10/2007 | US7240428 Method for making probes for atomic force microscopy |
| 07/05/2007 | WO2007074765A1 Probe card |
| 07/05/2007 | WO2007074764A1 Probe pin |
| 07/05/2007 | WO2007074700A1 Conductive contact holder and conductive contact unit |
| 07/05/2007 | WO2007074023A1 Protection unit for an ac/dc low-voltage power supply line |
| 07/05/2007 | US20070155029 Methods for processing semiconductor devices in a singulated form |