Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/2007
09/18/2007US7271357 Interface test system
09/18/2007US7271016 Methods and apparatus for a flexible circuit interposer
09/18/2007US7271015 Manufacturing method of semiconductor integrated circuit device and probe card
09/18/2007US7271014 Fabrication method of semiconductor integrated circuit device including inspecting using probe card
09/13/2007WO2007102401A1 Conductive contact unit
09/12/2007EP1831703A1 Reinforced probes for testing semiconductor devices
09/12/2007CN200947107Y Wafer measuring card
09/12/2007CN200947106Y Deviation fine tuning device for PCB testing
09/11/2007US7268941 Module inspection fixture
09/11/2007US7268568 Probe card
09/11/2007US7268533 Optical testing device
09/11/2007US7267559 Anisotropic conductive sheet, production process, contact structure, electronic device and inspection apparatus for operation test
09/11/2007US7266879 Method for magnetically establishing an electrical connection with a contact of a semiconductor device component
09/07/2007WO2007100059A1 Conductive contact unit
09/06/2007US20070207559 Fabrication method of semiconductor integrated circuit device
09/06/2007US20070205783 Sheet-Like Probe, Method Of Producing The Probe, And Application Of The Probe
09/05/2007EP1828786A1 Device for measuring a current flowing in a cable
09/05/2007EP1828785A1 Measuring tip for measuring high frequency
09/05/2007EP1828762A1 Method and apparatus for preventing damage to electronics during tire inspection
09/05/2007CN200944120Y Coaxial multiple measuring points test rod
09/05/2007CN200944119Y Improved structure for electronic detecting module
09/05/2007CN101031804A Interconnect assembly for a probe card
09/05/2007CN101030548A Micro-mechanical wafer chip test detecting card and its production
09/05/2007CN101029903A Positioning template for testing color kinescope
09/04/2007USRE39803 Non vibrating capacitance probe for wear monitoring
09/04/2007US7265966 Modular housing for electrical instrument and mounting member therefor
09/04/2007US7265563 Test method for semiconductor components using anisotropic conductive polymer contact system
09/04/2007US7265562 Cantilever microprobes for contacting electronic components and methods for making such probes
09/04/2007US7265530 Adaptive slope compensation for switching regulators
08/2007
08/30/2007WO2007097356A1 Ultrafine coaxial line and ultrafine coaxial barrel and production method for them
08/30/2007WO2007097234A1 Method for fabricating connecting jig, and connecting jig
08/30/2007WO2007095879A1 Current-measuring device
08/30/2007US20070200580 Wafer probe
08/30/2007US20070200574 Sheet-like probe, method of producing the probe, and application of the probe
08/29/2007EP1826575A2 Electronic device test set and contact used therein
08/29/2007EP1825282A1 Signal module with reduced reflections
08/29/2007EP1825277A1 Voltage sensing tool
08/29/2007CN200941105Y Device for loading wafer module
08/29/2007CN101025432A System on a chip pipeline tester and method
08/29/2007CN101025426A 探针组合体 Probe assembly
08/29/2007CN101025425A Test fixture for clamping signal terminal and its assembling method
08/29/2007CN101024480A Method for forming microelectronic spring structures on a substrate
08/28/2007US7262619 Semiconductor device test system
08/28/2007US7262618 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
08/28/2007US7262613 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
08/28/2007US7262611 Apparatuses and methods for planarizing a semiconductor contactor
08/28/2007US7262590 Performance board and testing system
08/24/2007CA2579697A1 Electronic device test set and contact used therein
08/23/2007WO2007094237A1 Electrically conductive contact and electrically conductive contact unit
08/23/2007WO2007070004A3 Methods for making micro needles and applications thereof
08/23/2007US20070194803 Probe holder for testing of a test device
08/23/2007US20070194779 Method Of Assembling And Testing An Electronics Module
08/23/2007US20070194778 Guarded tub enclosure
08/23/2007US20070194777 Power monitoring system
08/22/2007EP1488245B1 Apparatus for interfacing electronic packages and test equipment
08/22/2007EP1459079B1 Probe card covering system and method
08/22/2007CN2938119Y Photoelectric coupling AC voltage separation measuring circuit
08/22/2007CN2938109Y Improved structure of integral formed conduction probe
08/22/2007CN2938108Y Measuring apparatus
08/22/2007CN2938107Y Probe platform device
08/22/2007CN2938106Y Double-pipe with spring for measuring fixture
08/22/2007CN1333452C A hollow microprobe using a mems technique and a method of manufacturing the same
08/22/2007CN1333259C Test desk for high frequency characteristics of semiconductor laser chip with noncoplanar electrode
08/22/2007CN101023363A Probe and method of manufacturing the same
08/22/2007CN101021627A Probe structure in TFT-LCD substrate detection equipment
08/22/2007CN101021559A Test-blind eliminating instrument and test system for eliminating cable fault test blind zone
08/22/2007CN101021550A Integrated circuit test card
08/22/2007CN101021549A Integrated circuit test card
08/22/2007CN101021548A Integrated circuit test card
08/22/2007CN101021547A Bare chip test and aging screening temporary packaging carrier
08/21/2007US7259577 Shielded probe apparatus for probing semiconductor wafer
08/16/2007WO2007092174A1 Probe head with machined mounting pads and method of forming same
08/16/2007WO2007091985A2 Current-measuring clamp on sensor in electromechanical relays
08/16/2007WO2007090490A1 Test system for a circuit carrier
08/16/2007WO2007090447A1 Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards using a finger tester
08/16/2007US20070190671 Manufacturing method of semiconductor integrated circuit device and probe card
08/15/2007EP1817598A2 Probe card with segmented substrate
08/15/2007EP1817597A2 Interface apparatus for semiconductor device tester and test method therefor
08/15/2007EP1817592A1 Method of shaping lithographically-produced probe elements
08/15/2007CN2935168Y L-type test darkroom
08/15/2007CN2935167Y Contacting probe
08/15/2007CN2935166Y Electric measuring instrument
08/15/2007CN2935165Y Measuring device for circuit board
08/15/2007CN2935164Y Clamp for testing contactor
08/15/2007CN2935163Y Novel test push-buckle device
08/15/2007CN101019473A High density interconnect system having rapid fabrication cycle
08/15/2007CN101017183A Electrical contact device and electrical contact method
08/15/2007CN101017182A Wafer-level burn-in and test
08/14/2007US7256879 Semiconductor array tester
08/14/2007US7256598 Non-abrasive electrical test contact
08/14/2007US7256595 Test sockets, test systems, and methods for testing microfeature devices
08/14/2007US7256594 Method and apparatus for testing semiconductor devices using the back side of a circuit board
08/14/2007US7256592 Probe with trapezoidal contractor and device based on application thereof, and method of producing them
08/14/2007US7256591 Probe card, having cantilever-type probe and method
08/14/2007US7256575 Wide bandwidth attenuator input circuit for a measurement probe
08/14/2007US7255579 Anisotropic conductive connector and circuit-device electrical-inspection device
08/14/2007US7255576 Kelvin contact module for a microcircuit test system
08/14/2007US7255575 Electrical connecting apparatus
08/14/2007US7254861 Device for cleaning tip and side surfaces of a probe
08/09/2007US20070182438 Wireless Test Cassette
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